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Results: 151-175/1117
Authors:
Gueorguiev, VK
Ivanov, TE
Dimitriadis, CA
Andreev, SK
Popova, LI
Citation: Vk. Gueorguiev et al., Oxide field enhancement corrected time dependent dielectric breakdown of polyoxides, MICROELEC J, 31(8), 2000, pp. 663-666
Authors:
Yoon, SF
Kam, AHT
Zheng, HQ
Gay, BP
Citation: Sf. Yoon et al., A simulation study on the effect of channel thickness on the characteristics of Ga0.52In0.48P/In0.2Ga0.8As/Ga0.52In0.48P DH-pHEMT, MICROELEC J, 31(8), 2000, pp. 667-676
Authors:
Nicolau, DV
Bercu, C
Citation: Dv. Nicolau et C. Bercu, Monitoring photoresist glass transition temperature versus processing parameters via NMR broad band spectroscopy, MICROELEC J, 31(8), 2000, pp. 677-683
Authors:
Han, SY
Kim, HW
Chung, SK
Citation: Sy. Han et al., Surface field distribution and breakdown voltage of RESURF LDMOSFETs, MICROELEC J, 31(8), 2000, pp. 685-688
Authors:
Raczkowycz, J
Mather, P
Saine, S
Citation: J. Raczkowycz et al., Using a sigma-delta modulator as a test vehicle for embedded mixed-signal test, MICROELEC J, 31(8), 2000, pp. 689-699
Authors:
Caggiano, MF
Barkley, E
Sun, M
Kleban, JT
Citation: Mf. Caggiano et al., Electrical modeling of the chip scale ball grid array package at radio frequencies, MICROELEC J, 31(8), 2000, pp. 701-709
Authors:
Harrison, HB
Citation: Hb. Harrison, Introduction to the MICRO/MEMS 99 special issue, MICROELEC J, 31(7), 2000, pp. 491-491
Authors:
Qu, G
Parker, AE
Citation: G. Qu et Ae. Parker, Modeling HEMT intermodulation distortion characteristics, MICROELEC J, 31(7), 2000, pp. 493-496
Authors:
Xu, J
Abbott, D
Dai, Y
Citation: J. Xu et al., The study on a screening threshold for reliability estimation of optoelectronic coupled devices, MICROELEC J, 31(7), 2000, pp. 497-501
Authors:
Mickan, S
Abbott, D
Munch, J
Zhang, XC
van Doorn, T
Citation: S. Mickan et al., Analysis of system trade-offs for terahertz imaging, MICROELEC J, 31(7), 2000, pp. 503-514
Authors:
Allison, A
Abbott, D
Citation: A. Allison et D. Abbott, Some benefits of random variables in switched control systems, MICROELEC J, 31(7), 2000, pp. 515-522
Authors:
Winchester, K
Spaargaren, SMR
Dell, JM
Citation: K. Winchester et al., Transferable silicon nitride microcavities, MICROELEC J, 31(7), 2000, pp. 523-529
Authors:
Umana-Membreno, GA
Dell, JM
Faraone, L
Wu, YF
Parish, G
Mishra, UK
Citation: Ga. Umana-membreno et al., Anomalous drain current-voltage characteristics in AlGaN/GaN MODFETs at low temperatures, MICROELEC J, 31(7), 2000, pp. 531-536
Authors:
Musca, CA
Redfern, DA
Dell, JM
Faraone, L
Citation: Ca. Musca et al., Laser beam induced current as a tool for HgCdTe photodiode characterisation, MICROELEC J, 31(7), 2000, pp. 537-544
Authors:
Rais, MH
Musca, CA
Dell, JM
Antoszewski, J
Nener, BD
Faraone, L
Citation: Mh. Rais et al., HgCdTe photovoltaic detectors fabricated using a new junction formation technology, MICROELEC J, 31(7), 2000, pp. 545-551
Authors:
Harmer, GP
Abbott, D
Citation: Gp. Harmer et D. Abbott, Simulation of circuits demonstrating stochastic resonance, MICROELEC J, 31(7), 2000, pp. 553-559
Authors:
Qu, W
Wlodarski, W
Austin, M
Citation: W. Qu et al., Microfabrication and reliability study of sapphire based Ti/Pt-electrodes for thin-film gas sensor applications, MICROELEC J, 31(7), 2000, pp. 561-567
Authors:
Qu, W
Wenzel, C
Drescher, K
Citation: W. Qu et al., A vertically sensitive accelerometer and its realisation by depth UV lithography supported electroplating, MICROELEC J, 31(7), 2000, pp. 569-575
Authors:
Celinski, P
Abbott, D
Al-Sarawi, SF
Lopez, JF
Citation: P. Celinski et al., Novel extension of neu-MOS techniques to neu-GaAs, MICROELEC J, 31(7), 2000, pp. 577-582
Authors:
Hall, LT
Maple, JL
Agzarian, J
Abbott, D
Citation: Lt. Hall et al., Sensor system for heart sound biomonitor, MICROELEC J, 31(7), 2000, pp. 583-592
Authors:
Al-Sarawi, S
Burgess, N
Marwood, W
Atanackovic, P
Abbott, D
Citation: S. Al-sarawi et al., Very high speed differential optoelectronic algorithmic ADC using n-i(MQW)-n SEED technology, MICROELEC J, 31(7), 2000, pp. 593-604
Authors:
Perkins, ML
Hill, SJ
Mickan, SP
Abbott, D
Munch, J
van Doorn, T
Citation: Ml. Perkins et al., Review of tradeoffs for quenched avalanche photodiode sensors for imaging turbid media, MICROELEC J, 31(7), 2000, pp. 605-610
Authors:
Nicolau, DE
Phillimore, J
Cross, R
Nicolau, DV
Citation: De. Nicolau et al., Nanotechnology at the crossroads: the hard or the soft way?, MICROELEC J, 31(7), 2000, pp. 611-616
Authors:
Winnerl, S
Citation: S. Winnerl, GaAs/AlAs superlattices for detection of terahertz radiation, MICROELEC J, 31(6), 2000, pp. 389-396
Authors:
Ma, Y
Liu, L
Li, Z
Citation: Y. Ma et al., Surface layer effective density-of-states (SLEDOS) and its applications inMOS devices modeling, MICROELEC J, 31(6), 2000, pp. 397-403