AAAAAA
Results: 26-50/1243
Authors:
Swyt, DA
Citation: Da. Swyt, Length and dimensional measurements at NIST, J RES NAT I, 106(1), 2001, pp. 1-23
Authors:
Jabbour, ZJ
Yaniv, SL
Citation: Zj. Jabbour et Sl. Yaniv, The kilogram and measurements of mass and force, J RES NAT I, 106(1), 2001, pp. 25-46
Authors:
Sullivan, DB
Bergquist, JC
Bollinger, JJ
Drullinger, RE
Itano, WM
Jefferts, SR
Lee, WD
Meekhof, D
Parker, TE
Walls, FL
Wineland, DJ
Citation: Db. Sullivan et al., Primary atomic frequency standards at NIST, J RES NAT I, 106(1), 2001, pp. 47-63
Authors:
Elmquist, RE
Cage, ME
Tang, YH
Jeffery, AM
Kinard, JR
Dziuba, RF
Oldham, NM
Williams, ER
Citation: Re. Elmquist et al., The ampere and electrical standards, J RES NAT I, 106(1), 2001, pp. 65-103
Authors:
Mangum, BW
Furukawa, GT
Kreider, KG
Meyer, CW
Ripple, DC
Strouse, GF
Tew, WL
Moldover, MR
Johnson, BC
Yoon, HW
Gibson, CE
Saunders, RD
Citation: Bw. Mangum et al., The Kelvin and temperature measurements, J RES NAT I, 106(1), 2001, pp. 105-149
Authors:
Parr, AC
Citation: Ac. Parr, The candela and photometric and radiometric measurements, J RES NAT I, 106(1), 2001, pp. 151-186
Authors:
Cappelletti, RL
Glinka, CJ
Krueger, S
Lindstrom, RA
Lynn, JW
Prask, HJ
Prince, E
Rush, JJ
Rowe, JM
Satija, SK
Toby, BH
Tsai, A
Udovic, TJ
Citation: Rl. Cappelletti et al., Materials research with neutrons at NIST, J RES NAT I, 106(1), 2001, pp. 187-230
Authors:
Evans, DD
Mulholland, GW
Baum, HR
Walton, WD
McGrattan, KB
Citation: Dd. Evans et al., In situ burning of oil spills, J RES NAT I, 106(1), 2001, pp. 231-278
Authors:
Croarkin, MC
Citation: Mc. Croarkin, Statistics and measurements, J RES NAT I, 106(1), 2001, pp. 279-292
Authors:
Boisvert, RF
Donahue, MJ
Lozier, DW
McMichael, R
Rust, BW
Citation: Rf. Boisvert et al., Mathematics and measurement, J RES NAT I, 106(1), 2001, pp. 293-313
Authors:
Gills, TE
Dittman, S
Rumble, JR
Brickenkamp, CS
Harris, GL
Trahey, NM
Citation: Te. Gills et al., NIST mechanisms for disseminating measurements, J RES NAT I, 106(1), 2001, pp. 315-340
Authors:
Hogan, MD
Carnahan, LJ
Carpenter, RJ
Flater, DW
Fowler, JE
Frechette, SP
Gray, MM
Johnson, LA
McCabe, RM
Montgomery, D
Radack, SM
Rosenthal, R
Shakarji, CM
Citation: Md. Hogan et al., Information technology measurement and testing activities at NIST, J RES NAT I, 106(1), 2001, pp. 341-370
Authors:
Taylor, BN
Citation: Bn. Taylor, Untitled, J RES NAT I, 106(1), 2001, pp. V-VI
Authors:
Eppeldauer, GP
Lynch, DC
Citation: Gp. Eppeldauer et Dc. Lynch, Opto-mechanical and electronic design of a tunnel-trap Si radiometer, J RES NAT I, 105(6), 2000, pp. 813-828
Authors:
Itano, WM
Citation: Wm. Itano, External-field shifts of the Hg-199(+) optical frequency standard, J RES NAT I, 105(6), 2000, pp. 829-837
Authors:
Rose, AH
Wang, CM
Dyer, SD
Citation: Ah. Rose et al., Round robin for optical fiber Bragg grating metrology, J RES NAT I, 105(6), 2000, pp. 839-866
Authors:
Kalukin, AR
Winn, B
Wang, YX
Jacobsen, C
Levine, ZH
Fu, J
Citation: Ar. Kalukin et al., Calibration of high-resolution X-ray tomography with atomic force microscopy, J RES NAT I, 105(6), 2000, pp. 867-874
Authors:
Sims, JS
Hagedorn, JG
Ketcham, PM
Satterfield, SG
Griffin, TJ
George, WL
Fowler, HA
am Ende, BA
Hung, HK
Bohn, RB
Koontz, JE
Martys, NS
Bouldin, CE
Warren, JA
Feder, DL
Clark, CW
Filla, BJ
Devaney, JE
Citation: Js. Sims et al., Accelerating scientific discovery through computation and visualization, J RES NAT I, 105(6), 2000, pp. 875-894
Authors:
Weber, CG
Shaw, MB
Citation: Cg. Weber et Mb. Shaw, Experimental manufacture of paper for war maps, J RES NAT I, 105(6), 2000, pp. 895-900
Authors:
O'Brien, M
Lamperti, P
Williams, T
Sander, T
Citation: M. O'Brien et al., Comparison of the NIST and NPL air Kerma standards used for X-ray measurements between 10 kV and 80 kV (vol 105, pg 701, 2000), J RES NAT I, 105(6), 2000, pp. 901-902
Authors:
Hurly, JJ
Moldover, MR
Citation: Jj. Hurly et Mr. Moldover, Ab initio values of the thermophysical properties of helium as standards, J RES NAT I, 105(5), 2000, pp. 667-688
Authors:
Shaw, PS
Larason, TC
Gupta, R
Brown, SW
Lykke, KR
Citation: Ps. Shaw et al., Improved near-infrared spectral responsivity scale, J RES NAT I, 105(5), 2000, pp. 689-700
Authors:
O'Brien, M
Lamperti, P
Citation: M. O'Brien et P. Lamperti, Comparison of the NIST and NPL air kerma standards used for X-ray measurements between 10 kV and 80 kV, J RES NAT I, 105(5), 2000, pp. 701-707
Authors:
Munro, RG
Citation: Rg. Munro, Material properties of titanium diboride, J RES NAT I, 105(5), 2000, pp. 709-720
Authors:
Hakegard, JE
Citation: Je. Hakegard, Coding and modulation for LMDS and analysis of the LMDS channel, J RES NAT I, 105(5), 2000, pp. 721-754