Authors:
NEUFELD E
STICHT A
BRUNNER K
RIEDL H
ABSTREITER G
HOLZBRECHER H
BAY H
Citation: E. Neufeld et al., PHOTOLUMINESCENCE AND ELECTROLUMINESCENCE CHARACTERIZATION OF ERBIUM-DOPED SIGE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(5), 1998, pp. 2615-2618
Authors:
SCHITTENHELM P
ENGEL C
FINDEIS F
ABSTREITER G
DARHUBER AA
BAUER G
KOSOGOV AO
WERNER P
Citation: P. Schittenhelm et al., SELF-ASSEMBLED GE DOTS - GROWTH, CHARACTERIZATION, ORDERING, AND APPLICATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1575-1581
Authors:
KRUCK P
WEICHSELBAUM A
HELM M
FROMHERZ T
BAUER G
NUTZEL JF
ABSTREITER G
Citation: P. Kruck et al., POLARIZATION-DEPENDENT INTERSUBBAND ABSORPTION AND NORMAL-INCIDENCE INFRARED DETECTION IN P-TYPE SI SIGE QUANTUM-WELLS/, Superlattices and microstructures, 23(1), 1998, pp. 61-66
Authors:
HOLY V
DARHUBER AA
STANGL J
BAUER G
NUTZEL J
ABSTREITER G
Citation: V. Holy et al., X-RAY REFLECTIVITY INVESTIGATIONS OF THE INTERFACE MORPHOLOGY IN STRAINED SIGE SI MULTILAYERS/, Semiconductor science and technology, 13(6), 1998, pp. 590-598
Citation: J. Olajos et al., THE ORIGIN TO VARIOUS PL-BANDS IN SI GE STRAIN-SYMMETRIZED SUPERLATTICES/, Microelectronic engineering, 43-4, 1998, pp. 165-170
Authors:
HOLY V
DARHUBER AA
STANGL J
BAUER G
NUTZEL J
ABSTREITER G
Citation: V. Holy et al., OBLIQUE ROUGHNESS REPLICATION IN STRAINED SIGE SI MULTILAYERS/, Physical review. B, Condensed matter, 57(19), 1998, pp. 12435-12442
Authors:
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STICHT A
BRUNNER K
ABSTREITER G
BAY H
BUCHAL C
HOLZBRECHER H
Citation: E. Neufeld et al., LUMINESCENCE FROM ERBIUM-DOPED AND OXYGEN-DOPED SIGE GROWN BY MOLECULAR-BEAM EPITAXY, Thin solid films, 321, 1998, pp. 219-222
Authors:
BRUNNER K
DOBLER H
ABSTREITER G
SCHAFER H
LUSTIG B
Citation: K. Brunner et al., MOLECULAR-BEAM EPITAXY GROWTH AND THERMAL-STABILITY OF SI1-XGEX LAYERS ON EXTREMELY THIN SILICON-ON-INSULATOR SUBSTRATES, Thin solid films, 321, 1998, pp. 245-250
Authors:
NUTSCH A
DAHLHEIMER B
DOHR N
KRATZER H
LUKAS R
TORABI B
TRANKLE G
ABSTREITER G
WEIMANN G
Citation: A. Nutsch et al., CHEMICAL BEAM EPITAXY OF INTEGRATED 1.55 MU-M LASERS ON EXACT AND MISORIENTED (100)-INP SUBSTRATES, Journal of crystal growth, 188(1-4), 1998, pp. 275-280
Authors:
XU D
HEISS HG
KRAUS SA
SEXL M
BOHM G
TRANKLE G
WEIMANN G
ABSTREITER G
Citation: D. Xu et al., DESIGN AND FABRICATION OF DOUBLE-MODULATION DOPED INALAS INGAAS/INAS HETEROJUNCTION FETS FOR HIGH-SPEED AND MILLIMETER-WAVE APPLICATIONS/, I.E.E.E. transactions on electron devices, 45(1), 1998, pp. 21-30
Citation: Jh. Zhu et al., 2-DIMENSIONAL ORDERING OF SELF-ASSEMBLED GE ISLANDS ON VICINAL SI(001) SURFACES WITH REGULAR RIPPLES, Applied physics letters, 73(5), 1998, pp. 620-622
Authors:
NEUFELD E
STICHT A
LUIGART A
BRUNNER K
ABSTREITER G
Citation: E. Neufeld et al., ROOM-TEMPERATURE 1.54 MU-M ELECTROLUMINESCENCE FROM ERBIUM-DOPED SI SIGE WAVE-GUIDES/, Applied physics letters, 73(21), 1998, pp. 3061-3063
Authors:
ZIMMERMANN S
SCHEDELBECK G
GOVOROV AO
WIXFORTH A
KOTTHAUS JP
BICHLER M
WEGSCHEIDER W
ABSTREITER G
Citation: S. Zimmermann et al., SPATIALLY-RESOLVED EXCITON TRAPPING IN A VOLTAGE-CONTROLLED LATERAL SUPERLATTICE, Applied physics letters, 73(2), 1998, pp. 154-156
Citation: Jh. Zhu et al., OBSERVATION OF STEP BUNCHES IN UNITS OF 4 ML ON VICINAL SI(113) SURFACES, Applied physics letters, 73(17), 1998, pp. 2438-2440
Authors:
DARHUBER AA
ZHU J
HOLY V
STANGL J
MIKULIK P
BRUNNER K
ABSTREITER G
BAUER G
Citation: Aa. Darhuber et al., HIGHLY REGULAR SELF-ORGANIZATION OF STEP BUNCHES DURING GROWTH OF SIGE ON SI(113), Applied physics letters, 73(11), 1998, pp. 1535-1537
Citation: Jh. Zhu et al., OBSERVATION OF (105) FACETED GE PYRAMIDS INCLINED TOWARDS VICINAL SI(001) SURFACES, Applied physics letters, 72(4), 1998, pp. 424-426
Authors:
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HEISS H
SEXL M
KRAUS S
BOHM G
TRANKLE G
WEIMANN G
ABSTREITER G
Citation: D. Xu et al., 2S MM TRANSCONDUCTANCE INAS-INSERTED-CHANNEL MODULATION-DOPED FIELD-EFFECT TRANSISTORS WITH A VERY CLOSE GATE-TO-CHANNEL SEPARATION OF 14.5NM/, JPN J A P 2, 36(4B), 1997, pp. 470-472
Authors:
HOLY V
DARHUBER AA
STANGL J
BAUER G
NUTZEL JF
ABSTREITER G
Citation: V. Holy et al., X-RAY REFLECTIVITY RECIPROCAL SPACE MAPPING OF STRAINED SIGE SI SUPERLATTICES/, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 419-428