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Results: 1-22 |
Results: 22
NANOSIZED SUPERCONDUCTING CONSTRICTIONS
Authors: POZA M BASCONES E RODRIGO JG AGRAIT N VIEIRA S GUINEA F
Citation: M. Poza et al., NANOSIZED SUPERCONDUCTING CONSTRICTIONS, Physical review. B, Condensed matter, 58(17), 1998, pp. 11173-11176
EVOLUTION OF CONDUCTING CHANNELS IN METALLIC ATOMIC CONTACTS UNDER ELASTIC-DEFORMATION
Authors: CUEVAS JC YEYATI AL MARTINRODERO A BOLLINGER GR UNTIEDT C AGRAIT N
Citation: Jc. Cuevas et al., EVOLUTION OF CONDUCTING CHANNELS IN METALLIC ATOMIC CONTACTS UNDER ELASTIC-DEFORMATION, Physical review letters, 81(14), 1998, pp. 2990-2993
FORMATION AND MANIPULATION OF A METALLIC WIRE OF SINGLE GOLD ATOMS
Authors: YANSON AI BOLLINGER GR VANDENBROM HE AGRAIT N VANRUITENBEEK JM
Citation: Ai. Yanson et al., FORMATION AND MANIPULATION OF A METALLIC WIRE OF SINGLE GOLD ATOMS, Nature, 395(6704), 1998, pp. 783-785
THE SIGNATURE OF CHEMICAL VALENCE IN THE ELECTRICAL-CONDUCTION THROUGH A SINGLE-ATOM CONTACT
Authors: SCHEER E AGRAIT N CUEVAS JC YEYATI AL LUDOPH B MARTINRODERO A BOLLINGER GR VANRUITENBEEK JM URBINA C
Citation: E. Scheer et al., THE SIGNATURE OF CHEMICAL VALENCE IN THE ELECTRICAL-CONDUCTION THROUGH A SINGLE-ATOM CONTACT, Nature, 394(6689), 1998, pp. 154-157
EXPERIMENTAL-EVIDENCE OF NONACTIVATED CREEP IN PB(ZRXTI1-X)O-3 CERAMICS AT LOW-TEMPERATURES
Authors: PEREZENCISO E AGRAIT N VIEIRA S
Citation: E. Perezenciso et al., EXPERIMENTAL-EVIDENCE OF NONACTIVATED CREEP IN PB(ZRXTI1-X)O-3 CERAMICS AT LOW-TEMPERATURES, Physical review. B, Condensed matter, 56(6), 1997, pp. 2900-2903
FABRICATION AND CHARACTERIZATION OF METALLIC NANOWIRES
Authors: UNTIEDT C RUBIO G VIEIRA S AGRAIT N
Citation: C. Untiedt et al., FABRICATION AND CHARACTERIZATION OF METALLIC NANOWIRES, Physical review. B, Condensed matter, 56(4), 1997, pp. 2154-2160
NANOCONTACTS - PROBING ELECTRONIC-STRUCTURE UNDER EXTREME UNIAXIAL STRAINS
Authors: SANCHEZPORTAL D UNTIEDT C SOLER JM SAENZ JJ AGRAIT N
Citation: D. Sanchezportal et al., NANOCONTACTS - PROBING ELECTRONIC-STRUCTURE UNDER EXTREME UNIAXIAL STRAINS, Physical review letters, 79(21), 1997, pp. 4198-4201
MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (VOL 14, PG 1289, 1996)
Authors: CARPICK RW AGRAIT N OGLETREE DF SALMERON M
Citation: Rw. Carpick et al., MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (VOL 14, PG 1289, 1996), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2772-2772
MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE
Authors: CARPICK RW AGRAIT N OGLETREE DF SALMERON M
Citation: Rw. Carpick et al., MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1289-1295
STM STUDY OF THE ATOMIC CONTACT BETWEEN METALLIC ELECTRODES
Authors: SIRVENT C RODRIGO JG AGRAIT N VIEIRA S
Citation: C. Sirvent et al., STM STUDY OF THE ATOMIC CONTACT BETWEEN METALLIC ELECTRODES, Physica. B, Condensed matter, 218(1-4), 1996, pp. 238-241
PLASTIC-DEFORMATION IN NANOMETER-SCALE CONTACTS
Authors: AGRAIT N RUBIO G VIEIRA S
Citation: N. Agrait et al., PLASTIC-DEFORMATION IN NANOMETER-SCALE CONTACTS, Langmuir, 12(19), 1996, pp. 4505-4509
USE OF CAPACITANCE TO MEASURE SURFACE FORCES .1. MEASURING DISTANCE OF SEPARATION WITH ENHANCED SPATIAL AND TIME RESOLUTION
Authors: FRANTZ P AGRAIT N SALMERON M
Citation: P. Frantz et al., USE OF CAPACITANCE TO MEASURE SURFACE FORCES .1. MEASURING DISTANCE OF SEPARATION WITH ENHANCED SPATIAL AND TIME RESOLUTION, Langmuir, 12(13), 1996, pp. 3289-3294
VARIATION OF THE INTERFACIAL SHEAR-STRENGTH AND ADHESION OF A NANOMETER-SIZED CONTACT
Authors: CARPICK RW AGRAIT N OGLETREE DF SALMERON M
Citation: Rw. Carpick et al., VARIATION OF THE INTERFACIAL SHEAR-STRENGTH AND ADHESION OF A NANOMETER-SIZED CONTACT, Langmuir, 12(13), 1996, pp. 3334-3340
ATOMIC-SIZED METALLIC CONTACTS - MECHANICAL-PROPERTIES AND ELECTRONICTRANSPORT
Authors: RUBIO G AGRAIT N VIEIRA S
Citation: G. Rubio et al., ATOMIC-SIZED METALLIC CONTACTS - MECHANICAL-PROPERTIES AND ELECTRONICTRANSPORT, Physical review letters, 76(13), 1996, pp. 2302-2305
REVERSED METAL REPLICAS OF FREEZE-DRIED PROTEINS TO BE VISUALIZED WITH THE SCANNING TUNNELING MICROSCOPE
Authors: VELEZ M RUBIO G AGRAIT N CARRASCOSA JL
Citation: M. Velez et al., REVERSED METAL REPLICAS OF FREEZE-DRIED PROTEINS TO BE VISUALIZED WITH THE SCANNING TUNNELING MICROSCOPE, Ultramicroscopy, 60(1), 1995, pp. 41-48
PLASTIC-DEFORMATION OF NANOMETER-SCALE GOLD CONNECTIVE NECKS
Authors: AGRAIT N RUBIO G VIEIRA S
Citation: N. Agrait et al., PLASTIC-DEFORMATION OF NANOMETER-SCALE GOLD CONNECTIVE NECKS, Physical review letters, 74(20), 1995, pp. 3995-3998
JOSEPHSON EFFECT IN NANOSCOPIC STRUCTURES
Authors: RODRIGO JG AGRAIT N SIRVENT C VIEIRA S
Citation: Jg. Rodrigo et al., JOSEPHSON EFFECT IN NANOSCOPIC STRUCTURES, Physical review. B, Condensed matter, 50(17), 1994, pp. 12788-12792
SUPERCONDUCTING PHONON STRUCTURE IN THE TRANSITION FROM TUNNELING TO CONTACT REGIME
Authors: RODRIGO JG AGRAIT N SIRVENT C VIEIRA S
Citation: Jg. Rodrigo et al., SUPERCONDUCTING PHONON STRUCTURE IN THE TRANSITION FROM TUNNELING TO CONTACT REGIME, Physical review. B, Condensed matter, 50(10), 1994, pp. 7177-7179
CONDUCTANCE REGIMES IN SUPERCONDUCTING JUNCTIONS OF ATOMIC SIZE
Authors: RODRIGO JG AGRAIT N VIEIRA S
Citation: Jg. Rodrigo et al., CONDUCTANCE REGIMES IN SUPERCONDUCTING JUNCTIONS OF ATOMIC SIZE, Physical review. B, Condensed matter, 50(1), 1994, pp. 374-379
PLASTIC-DEFORMATION IN ATOMIC SIZE CONTACTS
Authors: AGRAIT N RODRIGO JG RUBIO G SIRVENT C VIEIRA S
Citation: N. Agrait et al., PLASTIC-DEFORMATION IN ATOMIC SIZE CONTACTS, Thin solid films, 253(1-2), 1994, pp. 199-203
ATOMIC-SCALE CONNECTIVE NECK FORMATION AND CHARACTERIZATION
Authors: AGRAIT N RODRIGO JG SIRVENT C VIEIRA S
Citation: N. Agrait et al., ATOMIC-SCALE CONNECTIVE NECK FORMATION AND CHARACTERIZATION, Physical review. B, Condensed matter, 48(11), 1993, pp. 8499-8501
CONDUCTANCE STEPS AND QUANTIZATION IN ATOMIC-SIZE CONTACTS
Authors: AGRAIT N RODRIGO JG VIEIRA S
Citation: N. Agrait et al., CONDUCTANCE STEPS AND QUANTIZATION IN ATOMIC-SIZE CONTACTS, Physical review. B, Condensed matter, 47(18), 1993, pp. 12345-12348
Risultati: 1-22 |