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Results:
1-20
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Results: 20
Authors:
CROKE ET
VAJO JJ
HUNTER AT
AHN CC
CHANDRASEKHAR D
LAURSEN T
SMITH DJ
MAYER JW
Citation: Et. Croke et al., STABILIZING THE SURFACE-MORPHOLOGY OF SI1-X-YGEXCY SI HETEROSTRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY THROUGH THE USE OF A SILICON-CARBIDESOURCE/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 1937-1942
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
MAYER JW
AHN CC
Citation: Bl. Stein et al., ELECTRONIC-PROPERTIES OF SI SI1-X-YGEXCY HETEROJUNCTIONS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1639-1643
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
MAYER JW
AHN CC
Citation: Bl. Stein et al., DEEP-LEVEL TRANSIENT SPECTROSCOPY OF SI SI1-X-YGEXCY HETEROSTRUCTURES/, Applied physics letters, 73(5), 1998, pp. 647-649
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
BAIR AE
MAYER JW
AHN CC
Citation: Bl. Stein et al., MEASUREMENT OF BAND OFFSETS IN SI SI1-XGEX AND SI/SI1-X-YGEXCY HETEROJUNCTIONS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1108-1111
Authors:
ATWATER HA
AHN CC
WONG SS
HE G
YOSHINO H
NIKZAD S
Citation: Ha. Atwater et al., ENERGY-FILTERED RHEED AND REELS FOR IN-SITU REAL-TIME ANALYSIS DURINGFILM GROWTH, Surface review and letters, 4(3), 1997, pp. 525-534
Authors:
CROKE ET
HUNTER AT
PETTERSSON PO
AHN CC
MCGILL TC
Citation: Et. Croke et al., IMPROVED GROWTH-MORPHOLOGY OF SI-GE-C HETEROSTRUCTURES THROUGH THE USE OF SB SURFACTANT-ASSISTED MOLECULAR-BEAM EPITAXY, Thin solid films, 294(1-2), 1997, pp. 105-111
Authors:
FULTZ B
AHN CC
ALP EE
STURHAHN W
TOELLNER TS
Citation: B. Fultz et al., PHONONS IN NANOCRYSTALLINE FE-57, Physical review letters, 79(5), 1997, pp. 937-940
Authors:
CROKE ET
HUNTER AT
AHN CC
LAURSEN T
CHANDRASEKHAR D
BAIR AE
SMITH DJ
MAYER JW
Citation: Et. Croke et al., CONTROL OF COMPOSITION AND CRYSTALLINITY IN THE MOLECULAR-BEAM EPITAXY OF STRAIN-COMPENSATED SI1-X-YGEXCY ALLOYS ON SI, Journal of crystal growth, 175, 1997, pp. 486-492
Authors:
AHN CC
YOSHINO H
TAMBO T
WONG SS
HE G
TAYLOR ME
ATWATER HA
Citation: Cc. Ahn et al., IN-SITU REAL-TIME ANALYSIS OF ALLOY FILM COMPOSITION AND SEGREGATION DYNAMICS WITH PARALLEL DETECTION REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Applied physics letters, 71(18), 1997, pp. 2653-2655
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
BAIR AE
MAYER JW
AHN CC
Citation: Bl. Stein et al., BAND OFFSETS IN SI SI1-X-YGEXCY HETEROJUNCTIONS MEASURED BY ADMITTANCE SPECTROSCOPY/, Applied physics letters, 70(25), 1997, pp. 3413-3415
Authors:
FULTZ B
AHN CC
SPOONER S
HONG LB
ECKERT J
JOHNSON WL
Citation: B. Fultz et al., INCIPIENT CHEMICAL INSTABILITIES OF NANOPHASE FE-CU ALLOYS PREPARED BY MECHANICAL ALLOYING, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 27(10), 1996, pp. 2934-2946
Authors:
PETTERSSON PO
AHN CC
MCGILL TC
CROKE ET
HUNTER AT
Citation: Po. Pettersson et al., CHARACTERIZATION OF SI SI1-YCY SUPERLATTICES GROWN BY SURFACTANT ASSISTED MOLECULAR-BEAM EPITAXY/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3030-3034
Authors:
BOWMAN RC
LUO CH
AHN CC
WITHAM CK
FULTZ B
Citation: Rc. Bowman et al., THE EFFECT OF TIN ON THE DEGRADATION OF LANI5-YSNY METAL-HYDRIDES DURING THERMAL CYCLING, Journal of alloys and compounds, 217(2), 1995, pp. 185-192
Authors:
HONG LB
AHN CC
FULTZ B
Citation: Lb. Hong et al., THE DEBYE TEMPERATURE OF NANOCRYSTALLINE BETA-SN MEASURED BY X-RAY-DIFFRACTION, Journal of materials research, 10(10), 1995, pp. 2408-2410
Authors:
WONG SS
HE G
NIKZAD S
AHN CC
ATWATER HA
Citation: Ss. Wong et al., LOCAL ORDER MEASUREMENT IN SNGE ALLOYS AND MONOLAYER SN FILMS ON SI WITH REFLECTION ELECTRON-ENERGY-LOSS SPECTROMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(2), 1995, pp. 216-220
Authors:
OKAMOTO JK
AHN CC
FULTZ B
Citation: Jk. Okamoto et al., SHORT-RANGE ORDERING IN FACE-CENTERED-CUBIC NI3AL, Journal of applied physics, 77(9), 1995, pp. 4380-4383
Authors:
PETTERSSON PO
AHN CC
MCGILL TC
CROKE ET
HUNTER AT
Citation: Po. Pettersson et al., SB-SURFACTANT-MEDIATED GROWTH OF SI SI1-YCY SUPERLATTICES BY MOLECULAR-BEAM EPITAXY/, Applied physics letters, 67(17), 1995, pp. 2530-2532
Authors:
PEARSON DH
AHN CC
FULTZ B
Citation: Dh. Pearson et al., MEASUREMENTS OF 3D OCCUPANCY FROM CU L(2,3) ELECTRON-ENERGY-LOSS SPECTRA OF RAPIDLY QUENCHED CUZR, CUTI, CUPD, CUPT, AND CUAU, Physical review. B, Condensed matter, 50(17), 1994, pp. 12969-12972
Authors:
ATWATER HA
WONG SS
AHN CC
NIKZAD S
FRASE HN
Citation: Ha. Atwater et al., ANALYSIS OF MONOLAYER FILMS DURING MOLECULAR-BEAM EPITAXY BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Surface science, 298(2-3), 1993, pp. 273-283
Authors:
NIKZAD S
WONG SS
AHN CC
SMITH AL
ATWATER HA
Citation: S. Nikzad et al., IN-SITU REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY MEASUREMENTS OF LOW-TEMPERATURE SURFACE CLEANING FOR SI MOLECULAR-BEAM EPITAXY, Applied physics letters, 63(10), 1993, pp. 1414-1416
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