Citation: Cy. Nakakura et Ei. Altman, VISUALIZATION OF ETCHING MECHANISMS OF A VICINAL CU SURFACE USING SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1566-1570
Citation: Ei. Altman et al., SPECIAL ISSUE - CREDIT RISK ASSESSMENT AND RELATIONSHIP LENDING - INTRODUCTION, Journal of banking & finance, 22(10-11), 1998, pp. 5-6
Citation: Cy. Nakakura et Ei. Altman, SCANNING-TUNNELING-MICROSCOPY STUDY OF THE REACTION OF BR-2 WITH CU(100) (VOL 398, PG 281, 1998), Surface science, 416(3), 1998, pp. 488-495
Citation: Cy. Nakakura et Ei. Altman, SCANNING-TUNNELING-MICROSCOPY STUDY OF THE REACTION OF BR-2 WITH CU(100), Surface science, 398(3), 1998, pp. 281-300
Authors:
NAKAKURA CY
PHANSE VM
ZHENG G
BANNON G
ALTMAN EI
LEE KP
Citation: Cy. Nakakura et al., A HIGH-SPEED VARIABLE-TEMPERATURE ULTRAHIGH-VACUUM SCANNING TUNNELINGMICROSCOPE, Review of scientific instruments, 69(9), 1998, pp. 3251-3258
Citation: Cy. Nakakura et Ei. Altman, COMPARISON OF BROMINE ETCHING OF POLYCRYSTALLINE AND SINGLE-CRYSTAL CU SURFACES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2359-2368
Citation: Ei. Altman et A. Saunders, CREDIT RISK MEASUREMENT - DEVELOPMENTS OVER THE LAST 20 YEARS, Journal of banking & finance, 21(11-12), 1997, pp. 1721-1742
Citation: Ei. Altman et Rj. Colton, INTERACTION OF C-60 WITH THE AU(111) 23X-ROOT-3 RECONSTRUCTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1906-1909
Citation: Ei. Altman et al., CORPORATE DISTRESS DIAGNOSIS - COMPARISONS USING LINEAR DISCRIMINANT-ANALYSIS AND NEURAL NETWORKS (THE ITALIAN EXPERIENCE), Journal of banking & finance, 18(3), 1994, pp. 505-529
Citation: Ei. Altman et Rj. Colton, GROWTH OF RH ON AU(111) - SURFACE INTERMIXING OF IMMISCIBLE METALS, Surface science, 304(1-2), 1994, pp. 120000400-120000406
Authors:
EDELSTEIN AS
EVERETT RK
RICHARDSON GY
QADRI SB
ALTMAN EI
FOLEY JC
PEREPEZKO JH
Citation: As. Edelstein et al., INTERMETALLIC PHASE-FORMATION DURING ANNEALING OF AL NI MULTILAYERS/, Journal of applied physics, 76(12), 1994, pp. 7850-7859
Citation: Ei. Altman et Rj. Colton, DETERMINATION OF THE ORIENTATION OF C-60 ADSORBED ON AU(111) AND AG(111), Physical review. B, Condensed matter, 48(24), 1993, pp. 18244-18249
Authors:
ALTMAN EI
DILELLA DP
IBE J
LEE K
COLTON RJ
Citation: Ei. Altman et al., DATA ACQUISITION AND CONTROL-SYSTEM FOR MOLECULE AND ATOM-RESOLVED TUNNELING SPECTROSCOPY, Review of scientific instruments, 64(5), 1993, pp. 1239-1243