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Citation: O. Ambacher et al., ABSORPTION OF INGAN SINGLE QUANTUM-WELLS DETERMINED BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY, JPN J A P 1, 37(3A), 1998, pp. 745-752
Authors:
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Citation: S. Kaiser et al., QUANTITATIVE TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATION OF THE RELAXATION BY MISFIT DISLOCATIONS CONFINED AT THE INTERFACE OF GAN AL2O3(0001)/, JPN J A P 1, 37(1), 1998, pp. 84-89
Authors:
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HOPLER R
BORN E
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Citation: T. Metzger et al., DEFECT STRUCTURE OF EPITAXIAL GAN FILMS DETERMINED BY TRANSMISSION ELECTRON-MICROSCOPY AND TRIPLE-AXIS X-RAY-DIFFRACTOMETRY, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(4), 1998, pp. 1013-1025
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Citation: M. Eyckeler et al., NEGATIVE ELECTRON-AFFINITY OF CESIATED P-GAN(0001) SURFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2224-2228
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Citation: I. Loa et al., COMPARATIVE DETERMINATION OF ABSOLUTE RAMAN-SCATTERING EFFICIENCIES AND APPLICATION TO GAN, Journal of Raman spectroscopy, 29(4), 1998, pp. 291-295
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Citation: S. Pau et al., TIME-RESOLVED PHOTOLUMINESCENCE STUDY OF EXCITONS IN HEXAGONAL GAN LAYERS GROWN ON SAPPHIRE, Physical review. B, Condensed matter, 57(12), 1998, pp. 7066-7070
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Citation: T. Wethkamp et al., SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS OF ALXGA1-XN IN THE ENERGY-RANGE 3-25EV, Thin solid films, 313, 1998, pp. 745-750
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Citation: R. Dimitrov et al., CARRIER CONFINEMENT IN ALGAN GAN HETEROSTRUCTURES GROWN BY PLASMA-INDUCED MOLECULAR-BEAM EPITAXY/, Physica status solidi. a, Applied research, 168(2), 1998, pp. 7-8
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Citation: Ac. Frank et al., NANOSCALE HEXAGONAL GALLIUM NITRIDE FROM SINGLE-MOLECULE PRECURSORS -MICROSTRUCTURE AND CRYSTALLITE SIZE-DEPENDENT PHOTOLUMINESCENCE, Physica status solidi. a, Applied research, 165(1), 1998, pp. 239-243
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Citation: J. Holst et al., THE INFLUENCE OF THE AL-CONTENT ON THE OPTICAL GAIN IN ALGAN HETEROSTRUCTURES, Journal of crystal growth, 190, 1998, pp. 692-695
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SCHERB G
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Citation: A. Kazimirov et al., POLARITY DETERMINATION OF A GAN THIN-FILM ON SAPPHIRE (0001) WITH X-RAY STANDING WAVES, Journal of applied physics, 84(3), 1998, pp. 1703-1705
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ROSENAUER A
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STUTZMANN M
Citation: B. Neubauer et al., ANALYSIS OF COMPOSITION FLUCTUATIONS ON AN ATOMIC-SCALE IN AL0.25GA0.75N BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Applied physics letters, 73(7), 1998, pp. 930-932
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MISKYS CR
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FISCHER RA
Citation: Ac. Frank et al., DETONATIONS OF GALLIUM AZIDES - A SIMPLE ROUTE TO HEXAGONAL GAN NANOCRYSTALS, Journal of the American Chemical Society, 120(14), 1998, pp. 3512-3513
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AMBACHER O
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BRANDT MS
ANGERER H
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METZGER T
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DEGER C
Citation: M. Stutzmann et al., PROPERTIES AND APPLICATIONS OF MBE GROWN ALGAN, Materials science & engineering. B, Solid-state materials for advanced technology, 50(1-3), 1997, pp. 212-218
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HOPLER R
BORN E
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Citation: T. Metzger et al., COHERENT X-RAY-SCATTERING PHENOMENON IN HIGHLY DISORDERED EPITAXIAL ALN FILMS, Physica status solidi. a, Applied research, 162(2), 1997, pp. 529-535