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Results: 1-21 |
Results: 21
NOVEL LIQUID SENSOR-BASED ON POROUS SILICON OPTICAL WAVE-GUIDES
Authors: ARRAND HF BENSON TM LONI A ARENSFISCHER R KRUGER M THONISSEN M LUTH H KERSHAW S
Citation: Hf. Arrand et al., NOVEL LIQUID SENSOR-BASED ON POROUS SILICON OPTICAL WAVE-GUIDES, IEEE photonics technology letters, 10(10), 1998, pp. 1467-1469
COLOR-SENSITIVE SI-PHOTODIODE USING POROUS SILICON INTERFERENCE FILTERS
Authors: KRUGER M BERGER MG MARSO M REETZ W EICKHOFF T LOO R VESCAN L THONISSEN M LUTH H ARENSFISCHER R HILBRICH S THEISS W
Citation: M. Kruger et al., COLOR-SENSITIVE SI-PHOTODIODE USING POROUS SILICON INTERFERENCE FILTERS, JPN J A P 2, 36(1AB), 1997, pp. 24-26
INFLUENCE OF ETCH STOPS ON THE MICROSTRUCTURE OF POROUS SILICON LAYERS
Authors: BILLAT S THONISSEN M ARENSFISCHER R BERGER MG KRUGER M LUTH H
Citation: S. Billat et al., INFLUENCE OF ETCH STOPS ON THE MICROSTRUCTURE OF POROUS SILICON LAYERS, Thin solid films, 297(1-2), 1997, pp. 22-25
CHEMICAL SURFACE MODIFICATION OF POROUS SILICON USING TETRAETHOXYSILANE
Authors: LINSMEIER J WUST K SCHENK H HILPERT U OSSAU W FRICKE J ARENSFISCHER R
Citation: J. Linsmeier et al., CHEMICAL SURFACE MODIFICATION OF POROUS SILICON USING TETRAETHOXYSILANE, Thin solid films, 297(1-2), 1997, pp. 26-30
ANALYSIS OF THE DEPTH HOMOGENEITY OF P-PS BY REFLECTANCE MEASUREMENTS
Authors: THONISSEN M BERGER MG BILLAT S ARENSFISCHER R KRUGER M LUTH H THEISS W HILLBRICH S GROSSE P LERONDEL G FROTSCHER U
Citation: M. Thonissen et al., ANALYSIS OF THE DEPTH HOMOGENEITY OF P-PS BY REFLECTANCE MEASUREMENTS, Thin solid films, 297(1-2), 1997, pp. 92-96
DIELECTRIC FILTERS MADE OF PS - ADVANCED PERFORMANCE BY OXIDATION ANDNEW LAYER STRUCTURES
Authors: BERGER MG ARENSFISCHER R THONISSEN M KRUGER M BILLAT S LUTH H HILBRICH S THEISS W GROSSE P
Citation: Mg. Berger et al., DIELECTRIC FILTERS MADE OF PS - ADVANCED PERFORMANCE BY OXIDATION ANDNEW LAYER STRUCTURES, Thin solid films, 297(1-2), 1997, pp. 237-240
COLOR-SENSITIVE PHOTODETECTOR BASED ON POROUS SILICON SUPERLATTICES
Authors: KRUGER M MARSO M BERGER MG THONISSEN M BILLAT S LOO R REETZ W LUTH H HILBRICH S ARENSFISCHER R GROSSE P
Citation: M. Kruger et al., COLOR-SENSITIVE PHOTODETECTOR BASED ON POROUS SILICON SUPERLATTICES, Thin solid films, 297(1-2), 1997, pp. 241-244
THE APPLICATION OF POROUS SILICON INTERFERENCE FILTERS IN OPTICAL SENSORS
Authors: HILBRICH S ARENSFISCHER R KUPPER L THEISS W BERGER MG KRUGER M THONISSEN M
Citation: S. Hilbrich et al., THE APPLICATION OF POROUS SILICON INTERFERENCE FILTERS IN OPTICAL SENSORS, Thin solid films, 297(1-2), 1997, pp. 250-253
TEMPERATURE-DEPENDENT THERMAL-CONDUCTIVITY OF POROUS SILICON
Authors: GESELE G LINSMEIER J DRACH V FRICKE J ARENSFISCHER R
Citation: G. Gesele et al., TEMPERATURE-DEPENDENT THERMAL-CONDUCTIVITY OF POROUS SILICON, Journal of physics. D, Applied physics, 30(21), 1997, pp. 2911-2916
POROUS SILICON AS A SUBSTRATE MATERIAL FOR POTENTIOMETRIC BIOSENSORS
Authors: THUST M SCHONING MJ FROHNHOFF S ARENSFISCHER R KORDOS P LUTH H
Citation: M. Thust et al., POROUS SILICON AS A SUBSTRATE MATERIAL FOR POTENTIOMETRIC BIOSENSORS, Measurement science & technology, 7(1), 1996, pp. 26-29
SOFT-X-RAY EMISSION OF POROUS SILICON NANOSTRUCTURES
Authors: EISEBITT S LUNING J RUBENSSON JE VANBUUREN T PATITSAS SN TIEDJE T BERGER M ARENSFISCHER R FROHNHOFF S EBERHARDT W
Citation: S. Eisebitt et al., SOFT-X-RAY EMISSION OF POROUS SILICON NANOSTRUCTURES, Journal of electron spectroscopy and related phenomena, 79, 1996, pp. 135-138
ILLUMINATION-ASSISTED FORMATION OF POROUS SILICON
Authors: THONISSEN M BERGER MG ARENSFISCHER R GLUCK O KRUGER M LUTH H
Citation: M. Thonissen et al., ILLUMINATION-ASSISTED FORMATION OF POROUS SILICON, Thin solid films, 276(1-2), 1996, pp. 21-24
INVESTIGATION OF DIFFERENT OXIDATION PROCESSES FOR POROUS SILICON STUDIED BY SPECTROSCOPIC ELLIPSOMETRY
Authors: FROTSCHER U ROSSOW U EBERT M PIETRYGA C RICHTER W BERGER MG ARENSFISCHER R MUNDER H
Citation: U. Frotscher et al., INVESTIGATION OF DIFFERENT OXIDATION PROCESSES FOR POROUS SILICON STUDIED BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 276(1-2), 1996, pp. 36-39
ELECTRICAL CONTACT TO POROUS SILICON BY ELECTRODEPOSITION OF IRON
Authors: RONKEL F SCHULTZE JW ARENSFISCHER R
Citation: F. Ronkel et al., ELECTRICAL CONTACT TO POROUS SILICON BY ELECTRODEPOSITION OF IRON, Thin solid films, 276(1-2), 1996, pp. 40-43
POROUS SILICON MULTILAYER OPTICAL WAVE-GUIDES
Authors: LONI A CANHAM LT BERGER MG ARENSFISCHER R MUNDER H LUTH H ARRAND HF BENSON TM
Citation: A. Loni et al., POROUS SILICON MULTILAYER OPTICAL WAVE-GUIDES, Thin solid films, 276(1-2), 1996, pp. 143-146
THE INFLUENCE OF THE DOPING LEVEL ON THE OPTICAL-PROPERTIES OF POROUSSILICON
Authors: HILBRICH S THEISS W ARENSFISCHER R GLUCK O BERGER MG
Citation: S. Hilbrich et al., THE INFLUENCE OF THE DOPING LEVEL ON THE OPTICAL-PROPERTIES OF POROUSSILICON, Thin solid films, 276(1-2), 1996, pp. 231-234
FORMATION OF POROUS SILICON ON PATTERNED SUBSTRATES
Authors: KRUGER M ARENSFISCHER R THONISSEN M MUNDER H BERGER MG LUTH H HILBRICH S THEISS W
Citation: M. Kruger et al., FORMATION OF POROUS SILICON ON PATTERNED SUBSTRATES, Thin solid films, 276(1-2), 1996, pp. 257-260
QUANTUM CONFINEMENT EFFECTS IN THE SOFT-X-RAY FLUORESCENCE-SPECTRA OFPOROUS SILICON NANOSTRUCTURES
Authors: EISEBITT S LUNING J RUBENSSON JE VANBUUREN T PATITSAS SN TIEDJE T BERGER M ARENSFISCHER R FROHNHOFF S EBERHARDT W
Citation: S. Eisebitt et al., QUANTUM CONFINEMENT EFFECTS IN THE SOFT-X-RAY FLUORESCENCE-SPECTRA OFPOROUS SILICON NANOSTRUCTURES, Solid state communications, 97(7), 1996, pp. 549-552
FROM MINUTES TO MONTHS - AGING OF POROUS SILICON SINGLE LAYERS AND SUPERLATTICES
Authors: THEISS W ARNTZEN M HILBRICH S WERNKE H ARENSFISCHER R BERGER MG
Citation: W. Theiss et al., FROM MINUTES TO MONTHS - AGING OF POROUS SILICON SINGLE LAYERS AND SUPERLATTICES, Physica status solidi. b, Basic research, 190(1), 1995, pp. 15-20
CHARACTERIZATION OF SUPERCRITICALLY DRIED POROUS SILICON
Authors: FROHNHOFF S ARENSFISCHER R HEINRICH T FRICKE J ARNTZEN M THEISS W
Citation: S. Frohnhoff et al., CHARACTERIZATION OF SUPERCRITICALLY DRIED POROUS SILICON, Thin solid films, 255(1-2), 1995, pp. 115-118
INVESTIGATION AND DESIGN OF OPTICAL-PROPERTIES OF POROSITY SUPERLATTICES
Authors: BERGER MG THONISSEN M ARENSFISCHER R MUNDER H LUTH H ARNTZEN M THEISS W
Citation: Mg. Berger et al., INVESTIGATION AND DESIGN OF OPTICAL-PROPERTIES OF POROSITY SUPERLATTICES, Thin solid films, 255(1-2), 1995, pp. 313-316
Risultati: 1-21 |