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Results: 1-10 |
Results: 10
Texture and grain structure in polycrystalline silver films deposited by partially ionised beam
Authors: Adamik, M Barna, PB Tomov, I
Citation: M. Adamik et al., Texture and grain structure in polycrystalline silver films deposited by partially ionised beam, VACUUM, 61(2-4), 2001, pp. 251-255
Preparation of double layered perpendicular recording media with extremelyhigh resolution
Authors: Ariake, J Kiya, T Honda, N Ouchi, K Adamik, M Czigany, Z Safran, G Radnoczi, G
Citation: J. Ariake et al., Preparation of double layered perpendicular recording media with extremelyhigh resolution, IEEE MAGNET, 37(4), 2001, pp. 1573-1576
Formation of polycrystalline and microcrystalline composite thin films by codeposition and surface chemical reaction
Authors: Barna, PB Adamik, M Labar, J Kover, L Toth, J Devenyi, A Manaila, R
Citation: Pb. Barna et al., Formation of polycrystalline and microcrystalline composite thin films by codeposition and surface chemical reaction, SURF COAT, 125(1-3), 2000, pp. 147-150
Growth structure of thin films for perpendicular magnetic recording media
Authors: Radnoczi, G Barna, PB Adamik, M Czigany, Z Ariake, J Honda, N Ouchi, K
Citation: G. Radnoczi et al., Growth structure of thin films for perpendicular magnetic recording media, CRYST RES T, 35(6-7), 2000, pp. 707-711
Texture, twinning and secondary extinction of vacuum deposited silver thinfilms
Authors: Tomov, I Adamik, M Barna, PB
Citation: I. Tomov et al., Texture, twinning and secondary extinction of vacuum deposited silver thinfilms, THIN SOL FI, 371(1-2), 2000, pp. 17-27
Correlation between texture and average grain size in polycrystalline Ag thin films
Authors: Adamik, M Barna, PB Tomov, I
Citation: M. Adamik et al., Correlation between texture and average grain size in polycrystalline Ag thin films, THIN SOL FI, 359(1), 2000, pp. 33-38
Analysis of the influence of the gas pressure during the deposition of electrochromic WO3 films by reactive r.f. sputtering of W and WO3 target
Authors: Masetti, E Grilli, ML Dautzenberg, G Macrelli, G Adamik, M
Citation: E. Masetti et al., Analysis of the influence of the gas pressure during the deposition of electrochromic WO3 films by reactive r.f. sputtering of W and WO3 target, SOL EN MAT, 56(3-4), 1999, pp. 259-269
Structure investigations of wear reducing non-metallic layers on TiN-coated HSS turning tools
Authors: Harju, E Korhonen, AS Adamik, M Barna, PB
Citation: E. Harju et al., Structure investigations of wear reducing non-metallic layers on TiN-coated HSS turning tools, SURF COAT, 119, 1999, pp. 498-504
Structure evolution of NdF3 optical thin films
Authors: Adamik, M Safran, G Barna, PB Tomov, I Kaiser, U Laux, S Jinschek, J Richter, W
Citation: M. Adamik et al., Structure evolution of NdF3 optical thin films, PHYS ST S-A, 175(2), 1999, pp. 637-649
A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy
Authors: Kaiser, U Newcomb, SB Stobbs, WM Adamik, M Fissel, A Richter, W
Citation: U. Kaiser et al., A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy, J MATER RES, 13(12), 1998, pp. 3571-3579
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