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Results: 1-9 |
Results: 9
Early stages of the HFCVD process on multi-vicinal silicon surfaces studied by electron microscopy probes (SEM, TEM)
Authors: Arnault, JC Pecoraro, S Werckmann, J Le Normand, F Motta, N Polini, R
Citation: Jc. Arnault et al., Early stages of the HFCVD process on multi-vicinal silicon surfaces studied by electron microscopy probes (SEM, TEM), DIAM RELAT, 10(9-10), 2001, pp. 1612-1616
Formation of beta-SiC nanocrystals on Si(111) monocrystal during the HFCVDof diamond
Authors: Le Normand, F Arnault, JC Pecoraro, S Werckmann, J
Citation: F. Le Normand et al., Formation of beta-SiC nanocrystals on Si(111) monocrystal during the HFCVDof diamond, APPL SURF S, 177(4), 2001, pp. 298-302
Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements
Authors: Arnault, JC Knoll, A Smigiel, E Cornet, A
Citation: Jc. Arnault et al., Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements, APPL SURF S, 171(3-4), 2001, pp. 189-196
Comparison of surface fractal parameters by X-ray reflectometry and atomicforce microscopy
Authors: Knoll, A Arnault, JC Smigiel, E Broll, N Cornet, A
Citation: A. Knoll et al., Comparison of surface fractal parameters by X-ray reflectometry and atomicforce microscopy, J PHYS IV, 10(P10), 2000, pp. 229-235
Thermal stability of amorphous carbon films deposited by pulsed laser ablation
Authors: Rey, S Antoni, F Prevot, B Fogarassy, E Arnault, JC Hommet, J Le Normand, F Boher, P
Citation: S. Rey et al., Thermal stability of amorphous carbon films deposited by pulsed laser ablation, APPL PHYS A, 71(4), 2000, pp. 433-439
Amphiphilic phenylene-ethynylene oligomers in Langmuir-Blodgett films. Self-assembling multilayers for electroluminescent devices
Authors: Arias-Marin, E Arnault, JC Guillon, D Maillou, T Le Moigne, J Geffroy, B Nunzi, JM
Citation: E. Arias-marin et al., Amphiphilic phenylene-ethynylene oligomers in Langmuir-Blodgett films. Self-assembling multilayers for electroluminescent devices, LANGMUIR, 16(9), 2000, pp. 4309-4318
Behaviour of textured Ir layers exposed to the HFCVD environment of diamond
Authors: Pecoraro, S Le Normand, F Arnault, JC
Citation: S. Pecoraro et al., Behaviour of textured Ir layers exposed to the HFCVD environment of diamond, SURF SCI, 461(1-3), 2000, pp. 129-136
Mechanisms of CVD diamond nucleation and growth on mechanically scratched Si(100) surfaces
Authors: Arnault, JC Demuynck, L Speisser, C Le Normand, F
Citation: Jc. Arnault et al., Mechanisms of CVD diamond nucleation and growth on mechanically scratched Si(100) surfaces, EUR PHY J B, 11(2), 1999, pp. 327-343
Nitronyl nitroxide and imino nitroxide mono- and biradicals in Langmuir and Langmuir-Blodgett films
Authors: Le Moigne, J Gallani, JL Wautelet, P Moroni, M Oswald, L Cruz, C Galerne, Y Arnault, JC Duran, R Garrett, M
Citation: J. Le Moigne et al., Nitronyl nitroxide and imino nitroxide mono- and biradicals in Langmuir and Langmuir-Blodgett films, LANGMUIR, 14(26), 1998, pp. 7484-7492
Risultati: 1-9 |