Citation: O. Sahin et A. Atalar, Analysis of tip-sample interaction in tapping-mode atomic force microscopeusing an electrical circuit simulator, APPL PHYS L, 78(19), 2001, pp. 2973-2975
Authors:
Sulchek, T
Hsieh, R
Adams, JD
Yaralioglu, GG
Minne, SC
Quate, CF
Cleveland, JP
Atalar, A
Adderton, DM
Citation: T. Sulchek et al., High-speed tapping mode imaging with active Q control for atomic force microscopy, APPL PHYS L, 76(11), 2000, pp. 1473-1475
Authors:
Bozkurt, A
Ladabaum, I
Atalar, A
Khuri-Yakub, BT
Citation: A. Bozkurt et al., Theory and analysis of electrode size optimization for capacitive microfabricated ultrasonic transducers, IEEE ULTRAS, 46(6), 1999, pp. 1364-1374
Citation: K. Wilder et al., Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes, REV SCI INS, 70(6), 1999, pp. 2822-2827
Citation: Gg. Yaralioglu et A. Atalar, Noise analysis of geometrically complex mechanical structures using the analogy between electrical circuits and mechanical systems, REV SCI INS, 70(5), 1999, pp. 2379-2383
Citation: As. Ekinci et A. Atalar, An electrical circuit theoretical method for time- and frequency-domain solutions of the structural mechanics problems, INT J NUM M, 45(10), 1999, pp. 1485-1507