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Results: 1-17 |
Results: 17
3D CHARACTERIZATION OF A W TIN/TI/SI CONTACT STRUCTURE USING MULSAM/
Authors: ROBERTS RH PRUTTON M WILKINSON DK BARKSHIRE IR HILL CJ PEARSON PJ AUGUSTUS PD SKINNER DK STRIBLEY K
Citation: Rh. Roberts et al., 3D CHARACTERIZATION OF A W TIN/TI/SI CONTACT STRUCTURE USING MULSAM/, Surface and interface analysis, 26(6), 1998, pp. 461-470
A MINIATURE, ALL-ELECTROSTATIC, FIELD-EMISSION ELECTRON COLUMN FOR SURFACE ANALYTICAL MICROSCOPY
Authors: ROBERTS RH ELGOMATI MM KUDJOE J BARKSHIRE IR BEAN SJ PRUTTON M
Citation: Rh. Roberts et al., A MINIATURE, ALL-ELECTROSTATIC, FIELD-EMISSION ELECTRON COLUMN FOR SURFACE ANALYTICAL MICROSCOPY, Measurement science & technology, 8(5), 1997, pp. 536-545
THE APPLICATION OF A LOW-ENERGY LOSS ELECTRON DETECTOR IN CONJUNCTIONWITH SCANNING AUGER MICROSCOPY - AN AID QUANTITATIVE SURFACE MICROSCOPY
Authors: BARKSHIRE IR ROBERTS RH PRUTTON M
Citation: Ir. Barkshire et al., THE APPLICATION OF A LOW-ENERGY LOSS ELECTRON DETECTOR IN CONJUNCTIONWITH SCANNING AUGER MICROSCOPY - AN AID QUANTITATIVE SURFACE MICROSCOPY, Applied surface science, 120(1-2), 1997, pp. 129-138
AUTOMATIC AND INTERACTIVE CORRELATION PARTITIONING COMPARED - APPLICATION TO TIN TI/SIO2/
Authors: HAIGH S KENNY PG ROBERTS RH BARKSHIRE IR PRUTTON M SKINNER DK PEARSON P STRIBLEY K
Citation: S. Haigh et al., AUTOMATIC AND INTERACTIVE CORRELATION PARTITIONING COMPARED - APPLICATION TO TIN TI/SIO2/, Surface and interface analysis, 25(5), 1997, pp. 335-340
MULTI-IMAGING AND MULTIVARIATE-STATISTICS USED FOR 3D CHARACTERIZATION AT SURFACES
Authors: PRUTTON M BARKSHIRE IR KENNY PG ROBERTS RH WENHAM M
Citation: M. Prutton et al., MULTI-IMAGING AND MULTIVARIATE-STATISTICS USED FOR 3D CHARACTERIZATION AT SURFACES, Philosophical transactions-Royal Society of London. Physical sciences and engineering, 354(1719), 1996, pp. 2683-2695
QUANTITATIVE SURFACE MICROANALYSIS OF SAMPLES WITH EXTREME TOPOGRAPHYUTILIZING IMAGE INTERPRETATION BY SCATTER DIAGRAMS AND PRINCIPAL COMPONENT ANALYSIS
Authors: BARKSHIRE IR KENNY PG FLETCHER IW PRUTTON M
Citation: Ir. Barkshire et al., QUANTITATIVE SURFACE MICROANALYSIS OF SAMPLES WITH EXTREME TOPOGRAPHYUTILIZING IMAGE INTERPRETATION BY SCATTER DIAGRAMS AND PRINCIPAL COMPONENT ANALYSIS, Ultramicroscopy, 63(3-4), 1996, pp. 193-203
QUANTITATIVE SURFACE CHEMICAL MAPPING WITH AUGER AND BACKSCATTERED ELECTRON SIGNALS
Authors: PRUTTON M BARKSHIRE IR CRONE M
Citation: M. Prutton et al., QUANTITATIVE SURFACE CHEMICAL MAPPING WITH AUGER AND BACKSCATTERED ELECTRON SIGNALS, Ultramicroscopy, 59(1-4), 1995, pp. 47-62
MULTISPECTRAL SCANNING AUGER MICROSCOPY OF TRIBOLOGICAL SURFACES
Authors: BARKSHIRE IR PRUTTON M SMITH GC
Citation: Ir. Barkshire et al., MULTISPECTRAL SCANNING AUGER MICROSCOPY OF TRIBOLOGICAL SURFACES, Applied surface science, 84(4), 1995, pp. 331-338
MAGNETIC PROFILES OF COMPOSITIONALLY TAILORED PERMALLOY-COPPER FILMS - A THEORETICAL AND EXPERIMENTAL COMPARISON .1. GROWTH AND STOICHIOMETRIC CHARACTERIZATION USING SCANNING AUGER MICROSCOPY
Authors: WATTS R WILKINSON DK BARKSHIRE IR PRUTTON M CHAMBERS A
Citation: R. Watts et al., MAGNETIC PROFILES OF COMPOSITIONALLY TAILORED PERMALLOY-COPPER FILMS - A THEORETICAL AND EXPERIMENTAL COMPARISON .1. GROWTH AND STOICHIOMETRIC CHARACTERIZATION USING SCANNING AUGER MICROSCOPY, Physical review. B, Condensed matter, 52(1), 1995, pp. 451-456
EXAMINATION OF THE USE OF PRINCIPAL COMPONENT ANALYSIS AND TARGET FACTOR-ANALYSIS FOR THE DETERMINATION OF AUGER DEPTH PROFILES IN 2 MAGNETIC MULTILAYER METAL SYSTEMS - CU CO AND CO/PT/
Authors: WENHAM MJG BARKSHIRE IR PRUTTON M ROBERTS RH WILKINSON DK
Citation: Mjg. Wenham et al., EXAMINATION OF THE USE OF PRINCIPAL COMPONENT ANALYSIS AND TARGET FACTOR-ANALYSIS FOR THE DETERMINATION OF AUGER DEPTH PROFILES IN 2 MAGNETIC MULTILAYER METAL SYSTEMS - CU CO AND CO/PT/, Surface and interface analysis, 23(13), 1995, pp. 858-872
AL2CU PRECIPITATE DISTRIBUTION IN ALCU INTERCONNECTS AFTER ELECTROMIGRATION STRESSING - A STUDY BY AUGER MICROSCOPY AND ION-BEAM BEVELLING
Authors: BARKSHIRE IR PRUTTON M
Citation: Ir. Barkshire et M. Prutton, AL2CU PRECIPITATE DISTRIBUTION IN ALCU INTERCONNECTS AFTER ELECTROMIGRATION STRESSING - A STUDY BY AUGER MICROSCOPY AND ION-BEAM BEVELLING, Journal of applied physics, 77(3), 1995, pp. 1082-1085
3-DIMENSIONAL SCATTER DIAGRAMS - APPLICATION TO SURFACE ANALYTICAL MICROSCOPY
Authors: KENNY PG BARKSHIRE IR PRUTTON M
Citation: Pg. Kenny et al., 3-DIMENSIONAL SCATTER DIAGRAMS - APPLICATION TO SURFACE ANALYTICAL MICROSCOPY, Ultramicroscopy, 56(4), 1994, pp. 289-301
AUGER IMAGING FROM ROUGH, CHEMICALLY INHOMOGENEOUS, MATERIALS
Authors: CRONE M BARKSHIRE IR PRUTTON M KENNY PG
Citation: M. Crone et al., AUGER IMAGING FROM ROUGH, CHEMICALLY INHOMOGENEOUS, MATERIALS, Surface and interface analysis, 22(1-12), 1994, pp. 581-584
NEW TECHNIQUE FOR THE SIMULTANEOUS CORRECTION OF TOPOGRAPHICAL AND BACKSCATTERING ARTIFACTS IN ELECTRON-EXCITED AUGER-SPECTROSCOPY AND MICROSCOPY
Authors: CRONE M BARKSHIRE IR PRUTTON M
Citation: M. Crone et al., NEW TECHNIQUE FOR THE SIMULTANEOUS CORRECTION OF TOPOGRAPHICAL AND BACKSCATTERING ARTIFACTS IN ELECTRON-EXCITED AUGER-SPECTROSCOPY AND MICROSCOPY, Surface and interface analysis, 21(12), 1994, pp. 857-863
SEPARATION OF SAMPLE GEOMETRY AND MATERIAL EFFECTS WITHIN THE SECONDARY-ELECTRON CASCADE - PRELIMINARY-RESULTS FOR GOLD
Authors: CRONE M BARKSHIRE IR PRUTTON M
Citation: M. Crone et al., SEPARATION OF SAMPLE GEOMETRY AND MATERIAL EFFECTS WITHIN THE SECONDARY-ELECTRON CASCADE - PRELIMINARY-RESULTS FOR GOLD, Surface and interface analysis, 21(11), 1994, pp. 805-808
TESTING THE SUCCESS OF ANALYTICAL IMAGE CORRECTION ROUTINES - SURFACEIMAGES
Authors: BARKSHIRE IR WALTON JM PRUTTON M
Citation: Ir. Barkshire et al., TESTING THE SUCCESS OF ANALYTICAL IMAGE CORRECTION ROUTINES - SURFACEIMAGES, Surface and interface analysis, 20(7), 1993, pp. 583-588
AUTOMATIC REMOVAL OF SUBSTRATE BACKSCATTERING EFFECTS IN AUGER IMAGING AND SPECTROSCOPY
Authors: BARKSHIRE IR PRUTTON M GREENWOOD JC ELGOMATI MM
Citation: Ir. Barkshire et al., AUTOMATIC REMOVAL OF SUBSTRATE BACKSCATTERING EFFECTS IN AUGER IMAGING AND SPECTROSCOPY, Surface and interface analysis, 20(12), 1993, pp. 984-990
Risultati: 1-17 |