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Results:
1-8
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Results: 8
Authors:
RENAULT PO
BADAWI KF
BIMBAULT L
GOUDEAU P
ELKAIM E
LAURIAT JP
Citation: Po. Renault et al., POISSONS RATIO MEASUREMENT IN TUNGSTEN THIN-FILMS COMBINING AN X-RAY DIFFRACTOMETER WITH IN-SITU TENSILE TESTER, Applied physics letters, 73(14), 1998, pp. 1952-1954
Authors:
AUZARY S
BADAWI KF
BIMBAULT L
RABIER J
GABORIAUD RJ
GOUDEAU P
Citation: S. Auzary et al., AN X-RAY-DIFFRACTION STUDY OF MICROSTRUCT URAL AND MECHANICAL STATE OF SUPERCONDUCTING YBCO THIN-FILM, Journal de physique. III, 7(1), 1997, pp. 35-46
Authors:
AUZARY S
BADAWI F
BIMBAULT L
RABIER J
GABORIAUD RJ
Citation: S. Auzary et al., STRESS AND MICROSTRUCTURE IN YBACUO THIN-FILMS ON MGO AND SITIO3 SUBSTRATES STUDIED BY X-RAY-DIFFRACTION AND BENDING TESTS, Journal of alloys and compounds, 251(1-2), 1997, pp. 37-40
Authors:
BIMBAULT L
BADAWI KF
GOUDEAU P
MIMAULT J
PROUX O
Citation: L. Bimbault et al., STRUCTURAL-ANALYSIS OF AU-PT MULTILAYERS USING COMPLEMENTARY X-RAY TECHNIQUES, Journal de physique. IV, 6(C7), 1996, pp. 43-51
Authors:
GOUDEAU P
BADAWI KF
NAUDON A
JAULIN M
DURAND N
BIMBAULT L
BRANGER V
Citation: P. Goudeau et al., NEW X-RAY-DIFFRACTION EQUIPMENT FOR ANALY SIS OF MECHANICAL STATES (STRESS AND MICRODEFORMATION) OF THIN NANOCRYSTALLINE FILMS, Journal de physique. IV, 6(C4), 1996, pp. 187-196
Authors:
BIMBAULT L
BADAWI KF
GOUDEAU P
BRANGER V
DURAND N
Citation: L. Bimbault et al., PROFILE ANALYSIS OF THIN-FILM X-RAY-DIFFRACTION PEAKS, Thin solid films, 275(1-2), 1996, pp. 40-43
Authors:
RATS D
BIMBAULT L
VANDENBULCKE L
HERBIN R
BADAWI KF
Citation: D. Rats et al., CRYSTALLINE QUALITY AND RESIDUAL-STRESSES IN DIAMOND LAYERS BY RAMAN AND X-RAY-DIFFRACTION ANALYSES, Journal of applied physics, 78(8), 1995, pp. 4994-5001
Authors:
DURAND N
BIMBAULT L
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., MICRODISTORTION MEASUREMENT IN AU TEXTURE D THIN-FILMS BY X-RAY-DIFFRACTION, Journal de physique. III, 4(6), 1994, pp. 1025-1032
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