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Results:
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Results: 25
Authors:
BOHER P
STEHLE JL
LABDI S
HOUDY P
Citation: P. Boher et al., TI TIN MULTILAYERS FOR HARD COATINGS APPLICATIONS - IN-SITU CHARACTERIZATION BY REAL-TIME SPECTROSCOPIC ELLIPSOMETRY/, Surface & coatings technology, 101(1-3), 1998, pp. 491-495
Authors:
FOGARASSY E
GROB A
GROB JJ
MULLER D
PREVOT B
DEUNAMUNO S
BOHER P
STEHLE M
Citation: E. Fogarassy et al., GROWTH OF PSEUDOMORPHIC SI1-YCY AND SI1-X-YGEXCY ALLOY LAYERS ON [100]SI BY ION-IMPLANTATION AND PULSED EXCIMER-LASER INDUCED EPITAXY, Materials chemistry and physics, 54(1-3), 1998, pp. 153-159
Authors:
BOHER P
LUTTMANN M
STEHLE JL
HENNET L
Citation: P. Boher et al., COMBINED CHARACTERIZATION OF CONDUCTIVE MATERIALS BY INFRARED SPECTROSCOPIC ELLIPSOMETRY AND GRAZING X-RAY REFLECTANCE, Thin solid films, 319(1-2), 1998, pp. 67-72
Authors:
BOHER P
STEHLE JL
Citation: P. Boher et Jl. Stehle, ATOMIC-SCALE CHARACTERIZATION OF SEMICONDUCTORS BY IN-SITU REAL-TIME SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 318(1-2), 1998, pp. 120-123
Authors:
WEINBROUM AA
HOCHHAUSER E
RUDICK V
KLUGER Y
SORKINE P
KARCHEVSKY E
GRAF E
BOHER P
FLAISHON R
FJODOROV D
NIV D
VIDNE BA
Citation: Aa. Weinbroum et al., DIRECT INDUCTION OF ACUTE LUNG AND MYOCARDIAL DYSFUNCTION BY LIVER ISCHEMIA AND REPERFUSION, The journal of trauma, injury, infection, and critical care, 43(4), 1997, pp. 627-633
Authors:
KISSION K
MOHAMMEDBRAHIM T
BRIAND D
SARRET M
LEBIHAN F
FORTIN B
BONNAUD O
BOHER P
STEHLE M
STEHLE JL
Citation: K. Kission et al., SINGLE-SHOT EXCIMER-LASER CRYSTALLIZATION OF SILICON FILMS DEPOSITED BY LPCVD, Thin solid films, 296(1-2), 1997, pp. 53-56
Authors:
BOHER P
STEHLE JL
HENNET L
Citation: P. Boher et al., COMBINED CHARACTERIZATION OF GROUP-IV HETEROSTRUCTURES AND MATERIALS BY SPECTROSCOPIC ELLIPSOMETRY AND GRAZING X-RAY REFLECTANCE, Thin solid films, 294(1-2), 1997, pp. 37-42
Authors:
BOHER P
STEHLE JL
Citation: P. Boher et Jl. Stehle, IN-SITU SPECTROSCOPIC ELLIPSOMETRY - PRESENT STATUS AND FUTURE-NEEDS FOR THIN-FILM CHARACTERIZATION AND PROCESS-CONTROL, Materials science & engineering. B, Solid-state materials for advanced technology, 37(1-3), 1996, pp. 116-120
Authors:
NYVLT M
FERRE J
JAMET JP
HOUDY P
BOHER P
VISNOVSKY S
URBAN R
LOPUSNIK R
Citation: M. Nyvlt et al., MAGNETOOPTICAL EFFECTS IN A STACK OF MAGNETIC MULTILAYER-DIELECTRIC FILMS, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 175-176
Authors:
BOHER P
STEHLE JL
STEHLE M
GODARD B
Citation: P. Boher et al., SINGLE-SHOT EXCIMER-LASER ANNEALING OF AMORPHOUS-SILICON FOR AMLCD, Applied surface science, 96-8, 1996, pp. 376-383
Authors:
BOHER P
STEHLE JL
PIEL JP
FRIED M
LOHNER T
POLGAR O
KHANH NQ
BARSONY I
Citation: P. Boher et al., SPECTROSCOPIC ELLIPSOMETRY APPLIED TO THE DETERMINATION OF AN ION-IMPLANTATION DEPTH PROFILE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 160-168
Authors:
MEYER P
JAMET JP
GROLIER V
OTT F
HOUDY P
BOHER P
Citation: P. Meyer et al., DOMAIN-WALL STABILITY DURING THERMOMAGNETIC WRITING IN A [TB(8-ANGSTROM) FE(10-ANGSTROM)](7) MULTILAYERED THIN-FILM/, Journal of magnetism and magnetic materials, 148(1-2), 1995, pp. 361-362
Authors:
RICHOMME F
TEILLET J
AURIC P
VEILLET P
FNIDIKI A
HOUDY P
BOHER P
Citation: F. Richomme et al., COMPOSITION PROPERTIES OF TB FE MULTILAYERS, Journal of magnetism and magnetic materials, 144, 1995, pp. 627-628
Authors:
BOHER P
PIEL JP
STEHLE JL
Citation: P. Boher et al., SPECTROSCOPIC ELLIPSOMETRY FOR SI1-XGEX CHARACTERIZATION - COMPARISONWITH OTHER EXPERIMENTAL-TECHNIQUES, Journal of crystal growth, 157(1-4), 1995, pp. 73-79
Authors:
HOUDY P
BOHER P
Citation: P. Houdy et P. Boher, DESIGN AND MANUFACTURE OF SPUTTERED MULTILAYERS FOR APPLICATIONS TO SOFT-X-RAY OPTICS, Journal de physique. III, 4(9), 1994, pp. 1589-1598
Authors:
POMMIER J
JAMET JP
FERRE J
HOUDY P
BOHER P
PIERRE F
Citation: J. Pommier et al., MAGNETIC AND MAGNETOOPTICAL PROPERTIES OF TB FE MULTILAYERS/, Journal of magnetism and magnetic materials, 136(3), 1994, pp. 251-259
Authors:
RICHOMME F
FNIDIKI A
AURIC P
TEILLET J
BOHER P
HOUDY P
Citation: F. Richomme et al., STUDY OF TB FE MULTILAYERS BY TEMPERATURE-DEPENDENT CEMS/, Hyperfine interactions, 92(1-4), 1994, pp. 1243-1247
Authors:
PIZZINI S
FONTAINE A
DARTYGE E
GIORGETTI C
BAUDELET F
KAPPLER JP
BOHER P
GIRON F
Citation: S. Pizzini et al., MAGNETIC CIRCULAR X-RAY DICHROISM MEASUREMENTS OF FE-CO ALLOYS AND FECO MULTILAYERS/, Physical review. B, Condensed matter, 50(6), 1994, pp. 3779-3788
Authors:
TEILLET J
FNIDIKI A
RICHOMME F
BOHER P
HOUDY P
Citation: J. Teillet et al., STRUCTURAL AND MAGNETIC PHASE-DIAGRAM OF TB FE MULTILAYERS DETERMINEDBY CONVERSION ELECTRON MOSSBAUER SPECTROMETRY/, Journal of magnetism and magnetic materials, 123(3), 1993, pp. 359-363
Authors:
GIRON F
BOHER P
HOUDY P
BEAUVILLAIN P
LEDANG K
VEILLET P
Citation: F. Giron et al., GROWTH AND STRUCTURE OF FCC (100) CO CU AND FE/CU MULTILAYERS/, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 24-29
Authors:
GIRON F
BOHER P
HOUDY P
BEAUVILLAIN P
LEDANG K
VEILLET P
Citation: F. Giron et al., MAGNETORESISTANCE IN FCC (100) CO CU MULTILAYERS - MODELING WITH CU SPATIAL THICKNESS FLUCTUATIONS/, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 318-321
Authors:
FNIDIKI A
RICHOMME F
TEILLET J
PIERRE F
BOHER P
HOUDY P
Citation: A. Fnidiki et al., TB FE MULTILAYERS - A STUDY BY CONVERSION ELECTRON MOSSBAUER SPECTROMETRY AND POLAR KERR EFFECT/, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 520-523
Authors:
BAC S
TROUSSEL P
MALEK CK
BOHER P
GUERIN P
LADAN FR
HOUDY P
SCHIRMANN D
BARCHEWITZ R
Citation: S. Bac et al., FABRICATION AND TESTS OF MULTILAYER GRATINGS FOR THE SOFT-X-RAY REGION, Journal of optics, 24(2), 1993, pp. 88-96
Authors:
BOHER P
GIRON F
HOUDY P
BEAUVILLAIN P
CHAPPERT C
VEILLET P
Citation: P. Boher et al., MAGNETORESISTANT CO CU MULTILAYERS, Journal de physique. IV, 2(C3), 1992, pp. 169-175
Authors:
FNIDIKI A
TEILLET J
RICHOMME F
PIERRE F
BOHER P
HOUDY P
Citation: A. Fnidiki et al., TB FE MULTILAYERED FILMS STUDIED BY CONVERSION ELECTRON MOSSBAUER SPECTROMETRY AND KERR EFFECT/, Journal de physique. IV, 2(C3), 1992, pp. 251-255
Risultati:
1-25
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