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Results:
1-7
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Results: 7
Authors:
ALLONGUE P
DEVILLENEUVE CH
BERNARD MC
PEOU JE
BOUTRYFORVEILLE A
LEVYCLEMENT C
Citation: P. Allongue et al., RELATIONSHIP BETWEEN POROUS SILICON FORMATION AND HYDROGEN INCORPORATION, Thin solid films, 297(1-2), 1997, pp. 1-4
Authors:
BRASS AM
CHENE J
BOUTRYFORVEILLE A
Citation: Am. Brass et al., DEPTH PROFILING OF CATHODIC DEUTERIUM IN PURE IRON IMPLANTED WITH TITANIUM OR CARBON, Corrosion science, 39(8), 1997, pp. 1469-1480
Authors:
BRASS AM
CHENE J
BOUTRYFORVEILLE A
Citation: Am. Brass et al., MEASUREMENTS OF DEUTERIUM AND TRITIUM CONCENTRATION ENHANCEMENT AT THE CRACK-TIP OF HIGH-STRENGTH STEELS, Corrosion science, 38(4), 1996, pp. 569-585
Authors:
CORREIA A
BALLUTAUD D
BOUTRYFORVEILLE A
MAURICE JL
Citation: A. Correia et al., EFFECTS OF COPPER AND OXYGEN PRECIPITATION DURING THERMAL-OXIDATION OF SILICON - AN ELECTRON-BEAM-INDUCED CURRENT STUDY, Journal of applied physics, 78(11), 1995, pp. 6543-6553
Authors:
CORREIA A
BALLUTAUD D
BOUTRYFORVEILLE A
Citation: A. Correia et al., PASSIVATION OF OXIDATION-INDUCED DEFECTS IN SILICON, Applied physics letters, 66(18), 1995, pp. 2394-2396
Authors:
BRASS AM
CHENE J
BOUTRYFORVEILLE A
Citation: Am. Brass et al., SIMS ANALYSIS OF DEUTERIUM DISTRIBUTION IN PALLADIUM COATINGS ON PUREIRON, Corrosion science, 36(4), 1994, pp. 707-716
Authors:
DARQUECERETTI E
AUCOUTURIER M
BOUTRYFORVEILLE A
Citation: E. Darqueceretti et al., INVESTIGATION OF SPUTTER-INDUCED SURFACE-COMPOSITION MODIFICATION DURING IN-DEPTH PROFILING OF IMPLANTED MATERIALS BY SIMS, XPS AND AES, Surface and interface analysis, 18(3), 1992, pp. 229-239
Risultati:
1-7
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