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Results:
1-12
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Results: 12
Authors:
DECOSTER W
BRIJS B
DELEU J
ALAY J
VANDERVORST W
Citation: W. Decoster et al., IN-SITU OBSERVATION BY RBS OF OXYGEN GETTERING DURING CS SPUTTERING OF SI-BASED MATERIALS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 82-87
Authors:
BRIJS B
DELEU J
STORM W
DECOSTER W
VANDERVORST W
Citation: B. Brijs et al., STOICHIOMETRIC CHANGES OF SI, COSI2 AND TISI2 DURING LOW-ENERGY OXYGEN BOMBARDMENT IN COMBINATION WITH OXYGEN BLEED-IN, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 541-546
Authors:
DELEU J
BRIJS B
STORM W
VANDERVORST W
DECOSTER W
Citation: J. Deleu et al., THE BEHAVIOR OF SI AND COSI2 DURING LOW-ENERGY NITROGEN BOMBARDMENT, WITH AND WITHOUT O-2-FLOODING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 534-538
Authors:
DONATON RA
KOLODINSKI S
CAYMAX M
ROUSSEL P
BENDER H
BRIJS B
MAEX K
Citation: Ra. Donaton et al., FORMATION OF COSI2 ON STRAINED SI0.8GE0.2 USING A SACRIFICIAL SI LAYER, Applied surface science, 91(1-4), 1995, pp. 77-81
Authors:
BRIJS B
DECOSTER W
BENDER H
STORM W
OSICEANU P
VANDERVORST W
Citation: B. Brijs et al., STOICHIOMETRY CHANGES DURING LOW-ENERGY OXYGEN BOMBARDMENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 614-618
Authors:
BRIJS B
DECOSTER W
BENDER H
ALAY J
OSICEANU P
VANDERVORST W
Citation: B. Brijs et al., SPUTTERING PHENOMENA OF COSI2 UNDER LOW-ENERGY OXYGEN BOMBARDMENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 306-310
Authors:
DECOSTER W
BRIJS B
OSICEANU P
ALAY J
CAYMAX M
VANDERVORST W
Citation: W. Decoster et al., ION-BEAM MIXING AND OXIDATION OF A SI GE-MULTILAYER UNDER OXYGEN BOMBARDMENT/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 911-915
Authors:
DECOSTER W
BRIJS B
BENDER H
ALAY J
VANDERVORST W
Citation: W. Decoster et al., RBS, AES AND XPS ANALYSIS OF ION-BEAM-INDUCED NITRIDATION OF SI AND SIGE ALLOYS, Vacuum, 45(4), 1994, pp. 389-395
Authors:
LAUWERS A
SCHREUTELKAMP RJ
BRIJS B
BENDER H
MAEX K
Citation: A. Lauwers et al., TECHNOLOGICAL ASPECTS OF EPITAXIAL COSI2, LAYERS FOR CMOS, Applied surface science, 73, 1993, pp. 19-24
Authors:
BRIJS B
BENDER H
DECOSTER W
MOONS R
VANDERVORST W
Citation: B. Brijs et al., IN-SITU RBS ANALYSIS OF ION-BEAM MIXING DURING LOW-ENERGY SPUTTERING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 446-449
Authors:
DECOSTER W
BRIJS B
MOONS R
VANDERVORST W
Citation: W. Decoster et al., METHODOLOGY FOR RESONANCE DEPTH PROFILING WITH TARGET TILTING APPLIEDTO THE 3.045 MEV O-16 (ALPHA, ALPHA)O-16 RESONANCE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 483-486
Authors:
DEWACHTER J
HENDRICKX P
PATTYN H
LANGOUCHE G
BRIJS B
VANDERVORST W
Citation: J. Dewachter et al., CHANNELING DETECTION USING POSITION-SENSITIVE DETECTORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 829-831
Risultati:
1-12
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