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Results:
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Results: 25
Authors:
BRUECK SRJ
ZAIDI SH
CHEN X
ZHANG Z
Citation: Srj. Brueck et al., INTERFEROMETRIC LITHOGRAPHY - FROM PERIODIC ARRAYS TO ARBITRARY PATTERNS, Microelectronic engineering, 42, 1998, pp. 145-148
Authors:
ALLEY TG
BRUECK SRJ
Citation: Tg. Alley et Srj. Brueck, VISUALIZATION OF THE NONLINEAR-OPTICAL SPACE-CHARGE REGION OF BULK THERMALLY PALED FUSED-SILICA GLASS, Optics letters, 23(15), 1998, pp. 1170-1172
Authors:
LONG XC
BRUECK SRJ
Citation: Xc. Long et Srj. Brueck, LARGE-SIGNAL PHASE RETARDATION WITH A POLED ELECTROOPTIC FIBER, IEEE photonics technology letters, 9(6), 1997, pp. 767-769
Authors:
GINGRICH HS
CHUMNEY DR
SUN SZ
HERSEE SD
LESTER LF
BRUECK SRJ
Citation: Hs. Gingrich et al., BROADLY TUNABLE EXTERNAL-CAVITY LASER-DIODES WITH STAGGERED THICKNESSMULTIPLE-QUANTUM WELLS, IEEE photonics technology letters, 9(2), 1997, pp. 155-157
Authors:
ZAIDI SH
BRUECK SRJ
Citation: Sh. Zaidi et Srj. Brueck, PHOTOLUMINESCENCE OF MANUFACTURED 1-D CRYSTALLINE SI GRATINGS, Optics communications, 135(4-6), 1997, pp. 264-268
Authors:
SANDUSKY JV
BRUECK SRJ
Citation: Jv. Sandusky et Srj. Brueck, MICROCAVITY EFFECTS IN AN EXTERNAL-CAVITY SURFACE-EMITTING LASER, IEEE journal of quantum electronics, 33(9), 1997, pp. 1574-1581
Authors:
CHEN XL
ZAIDI SH
BRUECK SRJ
DEVINE DJ
Citation: Xl. Chen et al., INTERFEROMETRIC LITHOGRAPHY OF SUBMICROMETER SPARSE HOLE ARRAYS FOR FIELD-EMISSION DISPLAY APPLICATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(5), 1996, pp. 3339-3349
Authors:
BRUECK SRJ
SANDUSKY JV
Citation: Srj. Brueck et Jv. Sandusky, A CW EXTERNAL-CAVITY SURFACE-EMITTING LASER (VOL 8, PG 313, 1996), IEEE photonics technology letters, 8(9), 1996, pp. 1277-1277
Authors:
SANDUSKY JV
BRUECK SRJ
Citation: Jv. Sandusky et Srj. Brueck, A CW EXTERNAL-CAVITY SURFACE-EMITTING LASER, IEEE photonics technology letters, 8(3), 1996, pp. 313-315
Authors:
LONG XC
MYERS RA
BRUECK SRJ
Citation: Xc. Long et al., A POLED ELECTROOPTIC FIBER, IEEE photonics technology letters, 8(2), 1996, pp. 227-229
Authors:
HUANG C
LANG M
BRUECK SRJ
Citation: C. Huang et al., OPTICAL-TEMPERATURE MEASUREMENT BY GRATING EXPANSION FOR ROTATING SEMICONDUCTOR WAFERS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(2), 1996, pp. 271-277
Authors:
ZAIDI SH
CHU AS
BRUECK SRJ
Citation: Sh. Zaidi et al., OPTICAL-PROPERTIES OF NANOSCALE, ONE-DIMENSIONAL SILICON GRATING STRUCTURES, Journal of applied physics, 80(12), 1996, pp. 6997-7008
Authors:
SANDUSKY JV
BRUECK SRJ
Citation: Jv. Sandusky et Srj. Brueck, OBSERVATION OF SPONTANEOUS EMISSION MICROCAVITY EFFECTS IN AN EXTERNAL-CAVITY SURFACE-EMITTING LASER STRUCTURE, Applied physics letters, 69(26), 1996, pp. 3993-3995
Authors:
BURCKEL D
ZAIDI SH
FRAUENGLASS A
LANG M
BRUECK SRJ
Citation: D. Burckel et al., SUBFEATURE SPECKLE INTERFEROMETRY, Optics letters, 20(3), 1995, pp. 315-317
Authors:
MYERS RA
LONG XC
BRUECK SRJ
TUMMINELLI RP
Citation: Ra. Myers et al., EFFECT OF HYDROGEN LOADING ON TEMPERATURE ELECTRIC-FIELD POLING OF SIO2-BASED THIN-FILMS ON SI, Electronics Letters, 31(18), 1995, pp. 1604-1606
Authors:
LONG XC
MYERS RA
BRUECK SRJ
RAMER R
ZHENG K
HERSEE SD
Citation: Xc. Long et al., GAN LINEAR ELECTROOPTIC EFFECT, Applied physics letters, 67(10), 1995, pp. 1349-1351
Authors:
NAQVI SSH
ZAIDI SH
BRUECK SRJ
MCNEIL JR
Citation: Ssh. Naqvi et al., DIFFRACTIVE TECHNIQUES FOR LITHOGRAPHIC PROCESS MONITORING AND CONTROL, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3600-3606
Authors:
SHARMA AK
SCOTT KAM
BRUECK SRJ
ZOLPER JC
MYERS DR
Citation: Ak. Sharma et al., ION-IMPLANTATION ENHANCED METAL-SI-METAL PHOTODETECTORS, IEEE photonics technology letters, 6(5), 1994, pp. 635-638
Authors:
MUKHERJEE N
MYERS RA
BRUECK SRJ
Citation: N. Mukherjee et al., DYNAMICS OF 2ND-HARMONIC GENERATION IN FUSED-SILICA, Journal of the Optical Society of America. B, Optical physics, 11(4), 1994, pp. 665-669
Authors:
LONG XC
MYERS RA
BRUECK SRJ
Citation: Xc. Long et al., MEASUREMENT OF THE LINEAR ELECTROOPTIC COEFFICIENT IN POLED AMORPHOUSSILICA, Optics letters, 19(22), 1994, pp. 1819-1821
Authors:
LANG MK
DONOHOE GW
ZAIDI SH
BRUECK SRJ
Citation: Mk. Lang et al., REAL-TIME IMAGE-PROCESSING TECHNIQUES FOR NONCONTACT TEMPERATURE-MEASUREMENT, Optical engineering, 33(10), 1994, pp. 3465-3471
Authors:
FONG YC
ARMOUR EA
HERSEE SD
BRUECK SRJ
Citation: Yc. Fong et al., A CONFOCAL PHOTOLUMINESCENCE STUDY OF METALORGANIC CHEMICAL-VAPOR-DEPOSITION GROWTH ON PATTERNED GAAS SUBSTRATES, Journal of applied physics, 75(6), 1994, pp. 3049-3055
Authors:
LONG XC
MYERS RA
BRUECK SRJ
Citation: Xc. Long et al., MEASUREMENT OF LINEAR ELECTROOPTIC EFFECT IN TEMPERATURE ELECTRIC-FIELD POLED OPTICAL FIBERS, Electronics Letters, 30(25), 1994, pp. 2162-2163
Authors:
CHU AS
ZAIDI SH
BRUECK SRJ
Citation: As. Chu et al., FABRICATION AND RAMAN-SCATTERING STUDIES OF ONE-DIMENSIONAL NANOMETERSTRUCTURES IN (110) SILICON, Applied physics letters, 63(7), 1993, pp. 905-907
Authors:
SCOTT KAM
SHARMA AK
WILSON CM
MULLINS BW
SOARES SF
BRUECK SRJ
Citation: Kam. Scott et al., A HIGH-RESOLUTION SI POSITION SENSOR, Applied physics letters, 62(24), 1993, pp. 3141-3143
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