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Results: 1-5 |
Results: 5
THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE AU-AG MULTILAYER FILMS
Authors: BUKALUK A
Citation: A. Bukaluk, THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE AU-AG MULTILAYER FILMS, Surface review and letters, 2(2), 1995, pp. 191-196
IN-MEMORIAM - SKONIECZNY,JULIUSZ,KAROL
Authors: BUKALUK A
Citation: A. Bukaluk, IN-MEMORIAM - SKONIECZNY,JULIUSZ,KAROL, Progress in Surface Science, 48(1-4), 1995, pp. 13-14
INTERDIFFUSION STUDIES IN SILVER PALLADIUM COUPLES BY MEANS OF AUGER DEPTH PROFILING
Authors: BUKALUK A ROZWADOWSKI M
Citation: A. Bukaluk et M. Rozwadowski, INTERDIFFUSION STUDIES IN SILVER PALLADIUM COUPLES BY MEANS OF AUGER DEPTH PROFILING, Vacuum, 46(5-6), 1995, pp. 579-582
AUGER-ELECTRON SPECTROSCOPY STUDIES OF INTERDIFFUSION IN ELECTRODEPOSITED AMORPHOUS NI-P ALLOYS
Authors: BUKALUK A
Citation: A. Bukaluk, AUGER-ELECTRON SPECTROSCOPY STUDIES OF INTERDIFFUSION IN ELECTRODEPOSITED AMORPHOUS NI-P ALLOYS, Surface and interface analysis, 22(1-12), 1994, pp. 18-21
DETERMINATION OF CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS IN AMORPHOUS NI-P FILMS STUDIED BY AUGER-ELECTRON DEPTH PROFILING
Authors: BUKALUK A
Citation: A. Bukaluk, DETERMINATION OF CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS IN AMORPHOUS NI-P FILMS STUDIED BY AUGER-ELECTRON DEPTH PROFILING, Czechoslovak journal of Physics, 43(9-10), 1993, pp. 887-891
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