Citation: A. Bukaluk, THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE AU-AG MULTILAYER FILMS, Surface review and letters, 2(2), 1995, pp. 191-196
Citation: A. Bukaluk et M. Rozwadowski, INTERDIFFUSION STUDIES IN SILVER PALLADIUM COUPLES BY MEANS OF AUGER DEPTH PROFILING, Vacuum, 46(5-6), 1995, pp. 579-582
Citation: A. Bukaluk, AUGER-ELECTRON SPECTROSCOPY STUDIES OF INTERDIFFUSION IN ELECTRODEPOSITED AMORPHOUS NI-P ALLOYS, Surface and interface analysis, 22(1-12), 1994, pp. 18-21
Citation: A. Bukaluk, DETERMINATION OF CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS IN AMORPHOUS NI-P FILMS STUDIED BY AUGER-ELECTRON DEPTH PROFILING, Czechoslovak journal of Physics, 43(9-10), 1993, pp. 887-891