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Results: 26-36/36
Authors:
DINGES HW
HILLMER H
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., STUDY OF IN0.53GA0.47AS IN0.52AL0.48AS QUANTUM-WELLS ON INP BY SPECTROSCOPIC ELLIPSOMETRY AND PHOTOLUMINESCENCE/, Surface science, 309, 1994, pp. 1057-1060
Authors:
HANSMANN S
WALTER H
HILLMER H
BURKHARD H
Citation: S. Hansmann et al., STATIC AND DYNAMIC PROPERTIES OF INGAASP-INP DISTRIBUTED-FEEDBACK LASERS - A DETAILED COMPARISON BETWEEN EXPERIMENT AND THEORY, IEEE journal of quantum electronics, 30(11), 1994, pp. 2477-2484
Authors:
HILLMER H
HANSMANN S
BURKHARD H
WALTER H
KROST A
BIMBERG D
Citation: H. Hillmer et al., STUDY OF WAVELENGTH SHIFT IN INGAAS INA1GAAS QW DFB LASERS BASED ON LASER PARAMETERS FROM A COMPARISON OF EXPERIMENT AND THEORY/, IEEE journal of quantum electronics, 30(10), 1994, pp. 2251-2261
Authors:
HILLMER H
GRABMAIER A
HANSMANN S
BURKHARD H
Citation: H. Hillmer et al., CONTINUOUSLY DISTRIBUTED PHASE-SHIFTS IN CHIRPED DFB LASERS USING BENT WAVE-GUIDES, Electronics Letters, 30(18), 1994, pp. 1483-1484
Authors:
HILLMER H
ZHU HL
GRABMAIER A
HANSMANN S
BURKHARD H
MAGARI K
Citation: H. Hillmer et al., NOVEL TUNABLE SEMICONDUCTOR-LASERS USING CONTINUOUSLY CHIRPED DISTRIBUTED-FEEDBACK GRATINGS WITH ULTRAHIGH SPATIAL PRECISION, Applied physics letters, 65(17), 1994, pp. 2130-2132
Authors:
HILLMER H
HANSMANN S
WALTER H
BURKHARD H
Citation: H. Hillmer et al., EXPERIMENTAL AND THEORETICAL-STUDY OF THE FACET PHASE INFLUENCE ON THE WAVELENGTH SHIFT IN INGAAS INALGAAS QUANTUM-WELL DISTRIBUTED-FEEDBACK LASERS/, Applied physics letters, 64(6), 1994, pp. 698-700
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., SPECTROSCOPIC ELLIPSOMETRY - A USEFUL TOOL TO DETERMINE THE REFRACTIVE-INDEXES AND INTERFACES OF IN0.52AL0.48AS AND IN0.53ALXGA0.47-XAS LAYERS ON INP IN THE WAVELENGTH RANGE 280-1900 NM, Materials science & engineering. B, Solid-state materials for advanced technology, 21(2-3), 1993, pp. 174-176
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., DETERMINATION OF REFRACTIVE-INDEXES OF IN0.52AL0.48AS ON INP IN THE WAVELENGTH RANGE FROM 250 TO 1900 NM BY SPECTROSCOPIC ELLIPSOMETRY, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 180-182
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., DETERMINATION OF THE REFRACTIVE-INDEX OF IN0.53AL0.11GA0.36 AS ON INPIN THE WAVELENGTH RANGE FROM 280 TO 1900 NM BY SPECTROSCOPIC ELLIPSOMETRY, Applied surface science, 69(1-4), 1993, pp. 355-358
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., SPECTROSCOPIC ELLIPSOMETRY - A USEFUL TOOL TO DETERMINE THE REFRACTIVE-INDEXES AND INTERFACES OF IN0.52AL0.48AS AND IN0.53ALXGA0.47-XAS ON INP IN THE WAVELENGTH RANGE FROM 280 TO 1900 NM, Thin solid films, 233(1-2), 1993, pp. 145-147
Authors:
HANSMANN S
HILLMER H
JANNING H
BURKHARD H
Citation: S. Hansmann et al., THEORETICAL AND EXPERIMENTAL-STUDY OF INHOMOGENEOUSLY PUMPED DISTRIBUTED-FEEDBACK LASERS, Journal of applied physics, 73(11), 1993, pp. 7138-7144