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Results:
1-18
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Results: 18
Authors:
Meincken, M
Balk, LJ
Sanderson, RD
Citation: M. Meincken et al., Improved sensitivity in the thermal investigation of polymeric nanophases by measuring the resonance frequency shift using an atomic force microscope, MACRO MAT E, 286(7), 2001, pp. 412-420
Authors:
Heiderhoff, R
Cramer, RM
Sergeev, OV
Balk, LJ
Citation: R. Heiderhoff et al., Near-field cathodoluminescence of nanoscopic diamond properties, DIAM RELAT, 10(9-10), 2001, pp. 1647-1651
Authors:
Liu, XX
Heiderhoff, R
Abicht, HP
Balk, LJ
Citation: Xx. Liu et al., Characterization of ferroelectric domains by the use of scanning near-field acoustic microscopies, ANAL SCI, 17, 2001, pp. S57-S60
Authors:
Gaponenko, NV
Sergeev, OV
Stepanova, EA
Parkun, VM
Mudryi, AV
Gnaser, H
Misiewicz, J
Heiderhoff, R
Balk, LJ
Thompson, GE
Citation: Nv. Gaponenko et al., Optical and structural characterization of erbium-doped TiO2 xerogel filmsprocessed on porous anodic alumina, J ELCHEM SO, 148(2), 2001, pp. H13-H16
Authors:
Schulz, H
Korbes, AS
Scheer, HC
Balk, LJ
Citation: H. Schulz et al., Combination of Nanoimprint and Scanning Force Lithography for local tailoring of sidewalls of nanometer devices, MICROEL ENG, 53(1-4), 2000, pp. 221-224
Authors:
Heiderhoff, R
Palaniappan, M
Phang, JCH
Balk, LJ
Citation: R. Heiderhoff et al., Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device, MICROEL REL, 40(8-10), 2000, pp. 1383-1388
Authors:
Balk, LJ
Wolfgang, E
Gerling, WH
Citation: Lj. Balk et al., Special issue - 11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000), MICROEL REL, 40(8-10), 2000, pp. IX-IX
Authors:
Heiderhoff, R
Sergeev, OV
Liu, YY
Phang, JCH
Balk, LJ
Citation: R. Heiderhoff et al., Comparison between standard and near-field cathodoluminescence, J CRYST GR, 210(1-3), 2000, pp. 303-306
Authors:
Cramer, RM
Heiderhoff, R
Balk, LJ
Citation: Rm. Cramer et al., Nanoscopic investigations of diamond properties by scanning probe microscopy techniques, DIAM RELAT, 8(8-9), 1999, pp. 1581-1586
Authors:
Balk, LJ
Cramer, RM
Citation: Lj. Balk et Rm. Cramer, Nanoscale reliability assessment of electronic devices, MICROEL ENG, 49(1-2), 1999, pp. 191-202
Authors:
Lepidis, P
Joachimsthaler, I
Balk, LJ
Citation: P. Lepidis et al., A PC-based scan control unit for fast view scanning electron microscopic imaging, SCANNING, 21(2), 1999, pp. 84-85
Authors:
Fiege, GBM
Schade, W
Palaniappan, M
Ng, V
Phang, JCH
Balk, LJ
Citation: Gbm. Fiege et al., Front- and backside investigations of thermal and electronic properties ofsemiconducting devices, MICROEL REL, 39(6-7), 1999, pp. 937-940
Authors:
Cramer, RM
Biletzki, V
Lepidis, P
Balk, LJ
Citation: Rm. Cramer et al., Sub-surface analyses of defects in integrated devices by scanning probe acoustic microscopy, MICROEL REL, 39(6-7), 1999, pp. 947-950
Authors:
Fiege, GBM
Niedernostheide, FJ
Schulze, HJ
Barthelmess, R
Balk, LJ
Citation: Gbm. Fiege et al., Thermal characterization of power devices by scanning thermal microscopy techniques, MICROEL REL, 39(6-7), 1999, pp. 1149-1152
Authors:
Fiege, GBM
Altes, A
Heiderhoff, B
Balk, LJ
Citation: Gbm. Fiege et al., Quantitative thermal conductivity measurements with nanometre resolution, J PHYS D, 32(5), 1999, pp. L13-L17
Authors:
Cramer, RM
Sergeev, OV
Heiderhoff, R
Balk, LJ
Citation: Rm. Cramer et al., Spectrally resolved cathodoluminescence analyses in the optical near-field, J MICROSC O, 194, 1999, pp. 412-414
Authors:
Cramer, RM
Chin, R
Balk, LJ
Citation: Rm. Cramer et al., Reflection mode scanning near-field optical microscopy analyses of integrated devices, J MICROSC O, 194, 1999, pp. 542-544
Authors:
Liu, XX
Balk, LJ
Zhang, BY
Yin, QR
Citation: Xx. Liu et al., Scanning electron acoustic microscopy for the evaluation of domain structures in BaTiO3 single crystal and ceramics, J MATER SCI, 33(18), 1998, pp. 4543-4549
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