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Results: 1-8 |
Results: 8
Molecular dynamics simulation of defect formation in an aluminum crystal under low-energy ion bombardment
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., Molecular dynamics simulation of defect formation in an aluminum crystal under low-energy ion bombardment, PHYS SOL ST, 43(1), 2001, pp. 29-34
Molecular dynamics simulation of mass transport processes in a Ni crystal with Al atoms as impurity under low energy ion bombardment
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., Molecular dynamics simulation of mass transport processes in a Ni crystal with Al atoms as impurity under low energy ion bombardment, NUCL INST B, 173(4), 2001, pp. 417-426
On mechanisms of defect formation in aluminum crystals bombarded by low-energy heavy ions
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., On mechanisms of defect formation in aluminum crystals bombarded by low-energy heavy ions, TECH PHYS L, 26(6), 2000, pp. 455-457
Atomic relocations in a two-layer Al/Ni system bombarded with ions having energies close to the sputtering threshold
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., Atomic relocations in a two-layer Al/Ni system bombarded with ions having energies close to the sputtering threshold, TECH PHYS L, 26(5), 2000, pp. 372-374
Defect formation in a two-layer Al/Ni crystal bombarded with ions having energies close to the sputtering threshold
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., Defect formation in a two-layer Al/Ni crystal bombarded with ions having energies close to the sputtering threshold, TECH PHYS L, 26(5), 2000, pp. 429-431
Two stage modeling of ion mixing for impurity profiles of low concentrations
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., Two stage modeling of ion mixing for impurity profiles of low concentrations, IAN FIZ, 64(4), 2000, pp. 709-715
MD simulation of atomic displacements in metals and metallic bilayers under low energy ion bombardment at 300 K
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., MD simulation of atomic displacements in metals and metallic bilayers under low energy ion bombardment at 300 K, NUCL INST B, 153(1-4), 1999, pp. 383-390
Simulation of mass transport processes in a high temperature Ni crystal under low energy ion bombardment
Authors: Kornich, GV Betz, G Bazhin, AI
Citation: Gv. Kornich et al., Simulation of mass transport processes in a high temperature Ni crystal under low energy ion bombardment, NUCL INST B, 152(4), 1999, pp. 437-448
Risultati: 1-8 |