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Results: 1-9 |
Results: 9
STM induced luminescence in carbon nanotubes
Authors: Coratger, R Salvetat, JP Carladous, A Ajustron, F Beauvillain, J Bonard, JM Forro, L
Citation: R. Coratger et al., STM induced luminescence in carbon nanotubes, EPJ-APPL PH, 15(3), 2001, pp. 177-180
Practice-based buprenorphine maintenance treatment (BMT): how do French healthcare providers manage the opiate-addicted patients?
Authors: Vignau, J Duhamel, A Catteau, J Legal, G Pho, AH Grailles, I Beauvillain, J Petit, P Beauvillain, P Parquet, PJ
Citation: J. Vignau et al., Practice-based buprenorphine maintenance treatment (BMT): how do French healthcare providers manage the opiate-addicted patients?, J SUBST ABU, 21(3), 2001, pp. 135-144
Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy
Authors: Chahboun, A Coratger, R Pascale, A Baules, P Ajustron, F Zorkani, I Beauvillain, J
Citation: A. Chahboun et al., Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy, J APPL PHYS, 89(11), 2001, pp. 6302-6307
Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopy
Authors: Seine, G Coratger, R Carladous, A Ajustron, F Pechou, R Beauvillain, J
Citation: G. Seine et al., Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopy, SURF SCI, 465(3), 2000, pp. 219-226
Hot hole transport through Au/n-Si(100) studied by reverse ballistic electron emission microscopy and spectroscopy
Authors: Chahboun, A Coratger, R Pechou, R Ajustron, F Beauvillain, J
Citation: A. Chahboun et al., Hot hole transport through Au/n-Si(100) studied by reverse ballistic electron emission microscopy and spectroscopy, SURF SCI, 462(1-3), 2000, pp. 61-67
Ballistic electron emission microscopy of Au/n-ZnSe contacts and local density of states spectroscopy
Authors: Chahboun, A Coratger, R Ajustron, F Beauvillain, J Dharmadasa, IM Samantilleke, AP
Citation: A. Chahboun et al., Ballistic electron emission microscopy of Au/n-ZnSe contacts and local density of states spectroscopy, J APPL PHYS, 87(5), 2000, pp. 2422-2426
Determination of the electron mean free path in the 1-1.8 eV energy range in thin gold layers using ballistic electron emission microscopy
Authors: Coratger, R Girardin, C Pechou, R Ajustron, F Beauvillain, J
Citation: R. Coratger et al., Determination of the electron mean free path in the 1-1.8 eV energy range in thin gold layers using ballistic electron emission microscopy, EPJ-APPL PH, 5(3), 1999, pp. 237-242
Tip-to-surface distance variations vs voltage in scanning tunneling microscopy
Authors: Seine, G Coratger, R Carladous, A Ajustron, F Pechou, R Beauvillain, J
Citation: G. Seine et al., Tip-to-surface distance variations vs voltage in scanning tunneling microscopy, PHYS REV B, 60(15), 1999, pp. 11045-11050
Control of light emission from an STM and surface modifications
Authors: Pechou, R Coratger, R Ajustron, F Beauvillain, J
Citation: R. Pechou et al., Control of light emission from an STM and surface modifications, SURF SCI, 418(1), 1998, pp. 1-7
Risultati: 1-9 |