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Results:
1-14
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Results: 14
Authors:
Wohlfart, A
Devi, A
Hipler, F
Becker, HW
Fischer, RA
Citation: A. Wohlfart et al., Growth of porous columnar alpha-GaN layers on c-plane Al2O3 by MOCVD usingbisazido dimethylaminopropyl gallium as single source precursor, J PHYS IV, 11(PR3), 2001, pp. 683-687
Authors:
Livingston, RA
Schweitzer, JS
Rolfs, C
Becker, HW
Kubsky, S
Citation: Ra. Livingston et al., Characterization of the induction period in tricalcium silicate hydration by nuclear resonance reaction analysis, J MATER RES, 16(3), 2001, pp. 687-693
Authors:
Ruoss, M
Becker, HW
Citation: M. Ruoss et Hw. Becker, The Hindsight Bias contributes to the chronification of pain, Z PSYCHOLOG, 209(3), 2001, pp. 316-342
Authors:
Parala, H
Devi, A
Hipler, F
Maile, E
Birkner, A
Becker, HW
Fischer, RA
Citation: H. Parala et al., Investigations on InN whiskers grown by chemical vapour deposition, J CRYST GR, 231(1-2), 2001, pp. 68-74
Authors:
Harissopulos, S
Chronidou, C
Spyrou, K
Paradellis, T
Rolfs, C
Schulte, WH
Becker, HW
Citation: S. Harissopulos et al., The Al-27(p, gamma)Si-28 reaction: direct capture cross-section and resonance strengths at E-p=0.2-1.12 MeV, EUR PHY J A, 9(4), 2000, pp. 479-489
Authors:
Devi, A
Rogge, N
Wohlfart, A
Hipler, F
Becker, HW
Fischer, RA
Citation: A. Devi et al., A study of bisazido(dimethylaminopropyl)gallium as a precursor for the OMVPE of gallium nitride thin films in a cold-wall reactor system under reduced pressure, CHEM VAPOR, 6(5), 2000, pp. 245-252
Authors:
Soelkner, G
Voss, P
Kaindl, W
Wachutka, G
Maier, KH
Becker, HW
Citation: G. Soelkner et al., Charge carrier avalanche multiplication in high-voltage diodes triggered by ionizing radiation, IEEE NUCL S, 47(6), 2000, pp. 2365-2372
Authors:
Borucki, L
Becker, HW
Gorris, F
Kubsky, S
Schulte, WH
Rolfs, C
Citation: L. Borucki et al., Hydrogen Doppler spectroscopy using N-15 ions, EUR PHY J A, 5(3), 1999, pp. 327-336
Authors:
Devi, A
Rogge, W
Fischer, RA
Stowasser, F
Sussek, H
Becker, HW
Schafer, J
Wolfrum, J
Citation: A. Devi et al., OMVPE of GaN using (N-3)(2)Ga[(CH2)(3)N(CH3)(2)] (BAZIGA) in a cold wall reactor, J PHYS IV, 9(P8), 1999, pp. 589-595
Authors:
Piel, N
Becker, HW
Meijer, J
Schulte, WH
Rolfs, C
Citation: N. Piel et al., Production of short ion pulses for TOF-RBS, NUCL INST A, 437(2-3), 1999, pp. 521-530
Authors:
Kubsky, S
Borucki, L
Gorris, F
Becker, HW
Rolfs, C
Schulte, WH
Baumvol, IJR
Stedile, FC
Citation: S. Kubsky et al., Interconnected UHV facilities for materials preparation and analysis, NUCL INST A, 435(3), 1999, pp. 514-522
Authors:
Adamczewski, J
Stephan, A
Meijer, J
Becker, HW
Bukow, HH
Rolfs, C
Citation: J. Adamczewski et al., A liquid metal ion source in a high energy microprobe setup, NUCL INST B, 158(1-4), 1999, pp. 119-123
Authors:
Klockenkamper, R
von Bohlen, A
Becker, HW
Palmetshofer, L
Citation: R. Klockenkamper et al., Comparison of shallow depth profiles of cobalt-implanted Si wafers determined by total reflection x-ray fluorescence analysis after repeated stratified etching and by Rutherford backscattering spectrometry, SURF INT AN, 27(11), 1999, pp. 1003-1008
Authors:
Maier, KH
Denker, A
Voss, P
Becker, HW
Citation: Kh. Maier et al., Single event burnout of high-power diodes, NUCL INST B, 146(1-4), 1998, pp. 596-600
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