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Results: 1-25/84
Authors:
Hens, S
Van Landuyt, J
Bender, H
Boullart, W
Vanhaelemeersch, S
Citation: S. Hens et al., Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy, MAT SC S PR, 4(1-3), 2001, pp. 109-111
Authors:
Stuer, C
Van Landuyt, J
Bender, H
Rooyackers, R
Badenes, G
Citation: C. Stuer et al., The use of convergent beam electron diffraction for stress measurements inshallow trench isolation structures, MAT SC S PR, 4(1-3), 2001, pp. 117-119
Authors:
Simoen, E
Loo, R
Roussel, P
Caymax, M
Bender, H
Claeys, C
Herzog, HJ
Blondeel, A
Clauws, P
Citation: E. Simoen et al., Defect analysis of n-type silicon strained layers, MAT SC S PR, 4(1-3), 2001, pp. 225-227
Authors:
Campomizzi, EC
Bender, H
von Hellens, W
Citation: Ec. Campomizzi et al., Improving the heat resistance of hydrogenated nitrile rubber compounds - Part 2: Effects of a novel heat stabilizer additive on the heat resistance of HNBR, KAUT GUM KU, 54(3), 2001, pp. 114-121
Authors:
Bender, H
Campomizzi, E
Citation: H. Bender et E. Campomizzi, Improving the heat resistance of hydrogenated nitrile rubber compounds Part 1: Aging mechanisms for high saturation rubber compounds, KAUT GUM KU, 54(1-2), 2001, pp. 14
Authors:
Ghica, C
Nistor, L
Bender, H
Steegen, A
Lauwers, A
Maex, K
Van Landuyt, J
Citation: C. Ghica et al., In situ transmission electron microscopy study of the silicidation processin Co thin films on patterned (001) Si substrates, J MATER RES, 16(3), 2001, pp. 701-708
Authors:
Norga, GJ
Jin, S
Fe, L
Wouters, DJ
Bender, H
Maes, HE
Citation: Gj. Norga et al., Growth of (111)-oriented Pb(Zr,Ti)O-3 layers on nanocrystalline RuO2 electrodes using the sol-gel technique, J MATER RES, 16(3), 2001, pp. 828-833
Authors:
Houssa, M
Naili, M
Zhao, C
Bender, H
Heyns, MM
Stesmans, A
Citation: M. Houssa et al., Effect of O-2 post-deposition anneals on the properties of ultra-thin SiOx/ZrO2 gate dielectric stacks, SEMIC SCI T, 16(1), 2001, pp. 31-38
Authors:
Bender, H
Citation: H. Bender, The diaries, 2000/2001, SINN FORM, 53(5), 2001, pp. 648-663
Authors:
Zhao, C
Roebben, G
Bender, H
Young, E
Haukka, S
Houssa, M
Naili, M
De Gendt, S
Heyns, M
Van Der Biest, O
Citation: C. Zhao et al., In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction, MICROEL REL, 41(7), 2001, pp. 995-998
Authors:
Becker, M
Bender, H
Jansen, M
Kienle, L
Assenmacher, W
Citation: M. Becker et al., Efficient access to bamboo-like carbon micro and nanofibres by pyrolysis of zinc cyanamide, J PHYS CH S, 62(8), 2001, pp. 1431-1433
Authors:
Nemeth, S
Boeve, H
Liu, ZY
Attenborough, K
Bender, H
Nistor, L
Borghs, G
De Boeck, J
Citation: S. Nemeth et al., Tunneling spectroscopy in Fe-GaN-Fe trilayer structures grown by MBE usingECR microwave plasma nitrogen source, J CRYST GR, 227, 2001, pp. 888-892
Authors:
Loo, R
Meunier-Beillard, P
Vanhaeren, D
Bender, H
Caymax, M
Vandervorst, W
Dentel, D
Goryll, M
Vescan, L
Citation: R. Loo et al., Structural and optical properties of Ge islands grown in an industrial chemical vapor deposition reactor, J APPL PHYS, 90(5), 2001, pp. 2565-2574
In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines
Authors:
Teodorescu, V
Nistor, L
Bender, H
Steegen, A
Lauwers, A
Maex, K
Van Landuyt, J
Citation: V. Teodorescu et al., In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines, J APPL PHYS, 90(1), 2001, pp. 167-174
Authors:
Detavernier, C
Van Meirhaeghe, RL
Cardon, F
Maex, K
Bender, H
Brijs, B
Vandervorst, W
Citation: C. Detavernier et al., Formation of epitaxial CoSi2 by a Cr or Mo interlayer: Comparison with a Ti interlayer, J APPL PHYS, 89(4), 2001, pp. 2146-2150
Authors:
Sedky, S
Witvrouw, A
Bender, H
Baert, K
Citation: S. Sedky et al., Experimental determination of the maximum post-process annealing temperature for standard CMOS wafers, IEEE DEVICE, 48(2), 2001, pp. 377-385
Authors:
Claes, M
De Gendt, S
Kenens, C
Conard, T
Bender, H
Storm, W
Bauer, T
Mertens, P
Citation: M. Claes et al., Controlled deposition of organic contamination and removal with ozone-based cleanings, J ELCHEM SO, 148(3), 2001, pp. G118-G125
Authors:
Stuer, C
Van Landuyt, J
Bender, H
De Wolf, I
Rooyackers, R
Badenes, G
Citation: C. Stuer et al., Investigation by convergent beam electron diffraction of the stress aroundshallow trench isolation structures, J ELCHEM SO, 148(11), 2001, pp. G597-G601
Authors:
Stalmans, L
Poortmans, J
Bender, H
Jin, S
Conard, T
Nijs, J
Debarge, L
Slaoui, A
Citation: L. Stalmans et al., Effects of low-thermal-budget treatments on the porous Si material properties, J POROUS MA, 7(1-3), 2000, pp. 67-71
Authors:
Vantomme, A
Wu, MF
Hogg, S
Langouche, G
Jacobs, K
Moerman, I
White, ME
O'Donnell, KP
Nistor, L
Van Landuyt, J
Bender, H
Citation: A. Vantomme et al., Comparative study of structural properties and photoluminescence in InGaN layers with a high In content, MRS I J N S, 5, 2000, pp. NIL_604-NIL_609
Authors:
Risse, JH
Grunwald, E
Kersjes, W
Strunk, H
Caselmann, WH
Palmedo, H
Bender, H
Biersack, HJ
Citation: Jh. Risse et al., Intraarterial HCC therapy with I-131-Lipiodol, CANC BIO R, 15(1), 2000, pp. 65-70
Authors:
Baklanov, MR
Van Hove, M
Mannaert, G
Vanhaelemeersch, S
Bender, H
Conard, T
Maex, K
Citation: Mr. Baklanov et al., Low temperature oxidation and selective etching of chemical vapor deposition a-SiC : H films, J VAC SCI B, 18(3), 2000, pp. 1281-1287
Authors:
Li, H
Jin, S
Bender, H
Lanckmans, F
Heyvaert, I
Maex, K
Froyen, L
Citation: H. Li et al., Characterization of WF6/N-2/H-2 plasma enhanced chemical vapor deposited WxN films as barriers for Cu metallization, J VAC SCI B, 18(1), 2000, pp. 242-251
Authors:
Bender, H
Fischer, T
Kaenel, HMV
Mackensen, M
Nuber, HU
Citation: H. Bender et al., Archaeology of Roman provinces versus provincial archaeology of Rome at German universities, ARCHAOL NAC, 5(3), 2000, pp. 312-321
Authors:
Heil, J
Bohm, A
Groger, A
Primke, M
Wyder, P
Keppler, P
Major, J
Bender, H
Schonherr, E
Wendel, H
Wolf, B
Wurz, KU
Grill, W
Herrnberger, H
Knauth, S
Lenzner, J
Citation: J. Heil et al., Electron focusing in metals and semimetals, PHYS REPORT, 323(5), 2000, pp. 388-455