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Results: 1-12 |
Results: 12
Fluorine determination in human and animal bones by particle-induced gamma-ray emission
Authors: Sastri, CS Iyengar, V Blondiaux, G Tessier, Y Petri, H Hoffmann, P Aras, NK Zaichick, V Ortner, HM
Citation: Cs. Sastri et al., Fluorine determination in human and animal bones by particle-induced gamma-ray emission, FRESEN J AN, 370(7), 2001, pp. 924-929
Be-7 recoil implantation for ultra-thin-layer-activation of medical grade polyethylene: Effect on wear resistance
Authors: Hoffmann, M Abbas, K Sauvage, T Blondiaux, G Vincent, L Stroosnijder, MF
Citation: M. Hoffmann et al., Be-7 recoil implantation for ultra-thin-layer-activation of medical grade polyethylene: Effect on wear resistance, NUCL INST B, 183(3-4), 2001, pp. 419-424
Oxygen determination in calcium fluoride by deuteron activation analysis
Authors: Sastri, CS Blondiaux, G Hoffmann, P Ortner, HM Petri, H
Citation: Cs. Sastri et al., Oxygen determination in calcium fluoride by deuteron activation analysis, FRESEN J AN, 366(3), 2000, pp. 218-220
Gold and platinum profiles in fast power devices
Authors: Bostrom, O Pichaud, B Regula, M Bajard, JC Blondiaux, G Soltanovich, OA Yakimov, EB Lhorte, A Quoirin, JB
Citation: O. Bostrom et al., Gold and platinum profiles in fast power devices, MAT SCI E B, 71, 2000, pp. 166-170
Stoichiometric determination of carbon in ceramic materials by low energy deuteron activation analysis
Authors: Sastri, CS Blondiaux, G Petri, H Michulitz, M
Citation: Cs. Sastri et al., Stoichiometric determination of carbon in ceramic materials by low energy deuteron activation analysis, J RAD NUCL, 244(2), 2000, pp. 457-462
Determination of the electronic energy loss of light ions in a silicon lattice by using the transmission ion channeling method
Authors: Erramli, H Misdaq, MA Blondiaux, G
Citation: H. Erramli et al., Determination of the electronic energy loss of light ions in a silicon lattice by using the transmission ion channeling method, NUCL INST B, 170(3-4), 2000, pp. 362-368
Damage morphology of Kr ion tracks in apatite: Dependence on thermal annealing
Authors: Villa, F Grivet, M Rebetez, M Dubois, C Chambaudet, A Chevarier, N Blondiaux, G Sauvage, T Toulemonde, M
Citation: F. Villa et al., Damage morphology of Kr ion tracks in apatite: Dependence on thermal annealing, NUCL INST B, 168(1), 2000, pp. 72-77
Positron annihilation at proton-induced defects in 6H-SiC/SiC and 6H-SiC/SiO2/Si structures
Authors: Barthe, MF Henry, L Corbel, C Blondiaux, G Saarinen, K Hautojarvi, P Hugonnard, E Di Cioccio, L Letertre, F Ghyselen, B
Citation: Mf. Barthe et al., Positron annihilation at proton-induced defects in 6H-SiC/SiC and 6H-SiC/SiO2/Si structures, PHYS REV B, 62(24), 2000, pp. 16638-16644
Damage morphology of Kr ion tracks in apatite: Dependence on dE/dx
Authors: Villa, F Grivet, M Rebetez, M Dubois, C Chambaudet, A Chevarier, A Martin, P Brossard, F Blondiaux, G Sauvage, T Toulemonde, M
Citation: F. Villa et al., Damage morphology of Kr ion tracks in apatite: Dependence on dE/dx, RADIAT MEAS, 31(1-6), 1999, pp. 65-70
Analysis of the oxygen impurity atoms beneath the surface of Cz-silicon byCPAA
Authors: Degas, F Erramli, H Blondiaux, G
Citation: F. Degas et al., Analysis of the oxygen impurity atoms beneath the surface of Cz-silicon byCPAA, APPL RAD IS, 51(5), 1999, pp. 533-542
Oxygen profiling in Czochralski-grown silicon substrates submitted to a rapid thermal annealing by using charged particles activation analysis
Authors: Erramli, H Misdaq, MA Blondiaux, G Maddalon-Vinante, C Barbier, D
Citation: H. Erramli et al., Oxygen profiling in Czochralski-grown silicon substrates submitted to a rapid thermal annealing by using charged particles activation analysis, NUCL INST B, 145(4), 1998, pp. 562-566
Amorphous lithium cobalt and nickel oxides thin films: preparation and characterization by RBS and PIGE
Authors: Benqlilou-Moudden, H Blondiaux, G Vinatier, P Levasseur, A
Citation: H. Benqlilou-moudden et al., Amorphous lithium cobalt and nickel oxides thin films: preparation and characterization by RBS and PIGE, THIN SOL FI, 333(1-2), 1998, pp. 16-19
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