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Results: 1-10 |
Results: 10
Characterization of channel hot electron injection by the subthreshold slope of NROM (TM) device
Authors: Lusky, E Shacham-Diamand, Y Bloom, I Eitan, B
Citation: E. Lusky et al., Characterization of channel hot electron injection by the subthreshold slope of NROM (TM) device, IEEE ELEC D, 22(11), 2001, pp. 556-558
Factors responsible for impedance rise in high power lithium ion batteries
Authors: Amine, K Chen, CH Liu, J Hammond, M Jansen, A Dees, D Bloom, I Vissers, D Henriksen, G
Citation: K. Amine et al., Factors responsible for impedance rise in high power lithium ion batteries, J POWER SOU, 97-8, 2001, pp. 684-687
An accelerated calendar and cycle life study of Li-ion cells
Authors: Bloom, I Cole, BW Sohn, JJ Jones, SA Polzin, EG Battaglia, VS Henriksen, GL Motloch, C Richardson, R Unkelhaeuser, T Ingersoll, D Case, HL
Citation: I. Bloom et al., An accelerated calendar and cycle life study of Li-ion cells, J POWER SOU, 101(2), 2001, pp. 238-247
Detrended fluctuation analysis of the soft breakdown current
Authors: Bandiera, L Cester, A Paccagnella, A Ghidini, G Bloom, I
Citation: L. Bandiera et al., Detrended fluctuation analysis of the soft breakdown current, MICROEL ENG, 59(1-4), 2001, pp. 49-53
NROM (TM) - a new non-volatile memory technology: from device to products
Authors: Bloom, I Pavan, P Eitan, B
Citation: I. Bloom et al., NROM (TM) - a new non-volatile memory technology: from device to products, MICROEL ENG, 59(1-4), 2001, pp. 213-223
NROM: A novel localized trapping, 2-bit nonvolatile memory cell
Authors: Eitan, B Pavan, P Bloom, I Aloni, E Frommer, A Finzi, D
Citation: B. Eitan et al., NROM: A novel localized trapping, 2-bit nonvolatile memory cell, IEEE ELEC D, 21(11), 2000, pp. 543-545
Corrosion behavior and interfacial resistivity of bipolar plate materials under molten carbonate fuel cell cathode conditions
Authors: Schoeler, AC Kaun, TD Bloom, I Lanagan, M Krumpelt, M
Citation: Ac. Schoeler et al., Corrosion behavior and interfacial resistivity of bipolar plate materials under molten carbonate fuel cell cathode conditions, J ELCHEM SO, 147(3), 2000, pp. 916-921
Critical behavior of the electrical transport properties in a tunneling-percolation system
Authors: Rubin, Z Sunshine, SA Heaney, MB Bloom, I Balberg, I
Citation: Z. Rubin et al., Critical behavior of the electrical transport properties in a tunneling-percolation system, PHYS REV B, 59(19), 1999, pp. 12196-12199
The development of LiFeO2-LiCoO2-NiO cathodes for molten carbonate fuel cells
Authors: Bloom, I Lanagan, MT Krumpelt, M Smith, JL
Citation: I. Bloom et al., The development of LiFeO2-LiCoO2-NiO cathodes for molten carbonate fuel cells, J ELCHEM SO, 146(4), 1999, pp. 1336-1340
Nonlinear 1/f noise characteristics in luminescent porous silicon
Authors: Bloom, I Balberg, I
Citation: I. Bloom et I. Balberg, Nonlinear 1/f noise characteristics in luminescent porous silicon, APPL PHYS L, 74(10), 1999, pp. 1427-1429
Risultati: 1-10 |