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Results: 1-11 |
Results: 11
Formation of metallic surface structures by ion etching using a S-layer template
Authors: Panhorst, M Bruckl, H Kiefer, B Reiss, G Santarius, U Guckenberger, R
Citation: M. Panhorst et al., Formation of metallic surface structures by ion etching using a S-layer template, J VAC SCI B, 19(3), 2001, pp. 722-724
Evolution of the dielectric breakdown in Co/Al2O3/Co junctions by annealing
Authors: Schmalhorst, J Bruckl, H Justus, M Thomas, A Reiss, G Vieth, M Gieres, G Wecker, J
Citation: J. Schmalhorst et al., Evolution of the dielectric breakdown in Co/Al2O3/Co junctions by annealing, J APPL PHYS, 89(1), 2001, pp. 586-589
Evolution of barrier asymmetry in magnetic tunnel junctions
Authors: Bruckl, H Schmalhorst, J Reiss, G Gieres, G Wecker, J
Citation: H. Bruckl et al., Evolution of barrier asymmetry in magnetic tunnel junctions, APPL PHYS L, 78(8), 2001, pp. 1113-1115
Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process
Authors: Lucinski, T Czerkas, S Bruckl, H Reiss, G
Citation: T. Lucinski et al., Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process, J MAGN MAGN, 222(3), 2000, pp. 327-336
Temperature stability of Co/Al2O3/Co junctions
Authors: Schmalhorst, J Bruckl, H Reiss, G Vieth, M Gieres, G Wecker, J
Citation: J. Schmalhorst et al., Temperature stability of Co/Al2O3/Co junctions, J APPL PHYS, 87(9), 2000, pp. 5191-5193
Switching stability of magnetic tunnel junctions with an artificial antiferromagnet
Authors: Schmalhorst, J Bruckl, H Reiss, G Kinder, R Gieres, G Wecker, J
Citation: J. Schmalhorst et al., Switching stability of magnetic tunnel junctions with an artificial antiferromagnet, APPL PHYS L, 77(21), 2000, pp. 3456-3458
Parallel nanolithography in carbon layers with conductive imprint stamps
Authors: Muhl, T Kretz, J Monch, I Schneider, CM Bruckl, H Reiss, G
Citation: T. Muhl et al., Parallel nanolithography in carbon layers with conductive imprint stamps, APPL PHYS L, 76(6), 2000, pp. 786-788
Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films
Authors: Hutten, A Mrozek, S Heitmann, S Hempel, T Bruckl, H Reiss, G
Citation: A. Hutten et al., Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films, ACT MATER, 47(15-16), 1999, pp. 4245-4252
Low energy electron beam decomposition of metalorganic precursors with a scanning tunneling microscope at ambient atmosphere
Authors: Bruckl, H Kretz, J Koops, HW Reiss, G
Citation: H. Bruckl et al., Low energy electron beam decomposition of metalorganic precursors with a scanning tunneling microscope at ambient atmosphere, J VAC SCI B, 17(4), 1999, pp. 1350-1353
In situ monitoring of GMR and M(H) evolution during Co/Cu multilayers growth
Authors: Lucinski, T Reiss, G Bruckl, H
Citation: T. Lucinski et al., In situ monitoring of GMR and M(H) evolution during Co/Cu multilayers growth, J MAGN MAGN, 193(1-3), 1999, pp. 484-487
Nanolithography of metal films using scanning force microscope patterned carbon masks
Authors: Muhl, T Bruckl, H Kraut, D Kretz, J Monch, I Reiss, G
Citation: T. Muhl et al., Nanolithography of metal films using scanning force microscope patterned carbon masks, J VAC SCI B, 16(6), 1998, pp. 3879-3882
Risultati: 1-11 |