Authors:
Lucinski, T
Czerkas, S
Bruckl, H
Reiss, G
Citation: T. Lucinski et al., Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process, J MAGN MAGN, 222(3), 2000, pp. 327-336
Authors:
Schmalhorst, J
Bruckl, H
Reiss, G
Kinder, R
Gieres, G
Wecker, J
Citation: J. Schmalhorst et al., Switching stability of magnetic tunnel junctions with an artificial antiferromagnet, APPL PHYS L, 77(21), 2000, pp. 3456-3458
Authors:
Hutten, A
Mrozek, S
Heitmann, S
Hempel, T
Bruckl, H
Reiss, G
Citation: A. Hutten et al., Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films, ACT MATER, 47(15-16), 1999, pp. 4245-4252
Citation: H. Bruckl et al., Low energy electron beam decomposition of metalorganic precursors with a scanning tunneling microscope at ambient atmosphere, J VAC SCI B, 17(4), 1999, pp. 1350-1353
Authors:
Muhl, T
Bruckl, H
Kraut, D
Kretz, J
Monch, I
Reiss, G
Citation: T. Muhl et al., Nanolithography of metal films using scanning force microscope patterned carbon masks, J VAC SCI B, 16(6), 1998, pp. 3879-3882