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Results: 1-11 |
Results: 11
Non-destructive tester for single event burnout of power diodes
Authors: Busatto, G Iannuzzo, F Velardi, F Wyss, J
Citation: G. Busatto et al., Non-destructive tester for single event burnout of power diodes, MICROEL REL, 41(9-10), 2001, pp. 1725-1729
The phenotype of gastric mucosa coexisting with Barrett's oesophagus
Authors: Rugge, M Russo, V Busatto, G Genta, RM Di Mario, F Farinati, F Graham, DY
Citation: M. Rugge et al., The phenotype of gastric mucosa coexisting with Barrett's oesophagus, J CLIN PATH, 54(6), 2001, pp. 456-460
Measurement of the BJT activation current during the reverse recovery of power MOSFET's drain-source diode
Authors: Iannuzzo, F Persiano, GV Busatto, G
Citation: F. Iannuzzo et al., Measurement of the BJT activation current during the reverse recovery of power MOSFET's drain-source diode, IEEE DEVICE, 48(2), 2001, pp. 391-393
Reverse bias instabilities in bipolar power transistors with cellular layout
Authors: Busatto, G Fratelli, L Vitale, G
Citation: G. Busatto et al., Reverse bias instabilities in bipolar power transistors with cellular layout, IEEE DEVICE, 48(11), 2001, pp. 2544-2550
The p53 gene in patients under the age of 40 with gastric cancer: mutationrates are low but are associated with a cardiac location
Authors: Rugge, M Shiao, YH Busatto, G Cassaro, M Strobbe, C Russo, VM Leo, G Parenti, AR Scapinello, A Arslan, P Egarter-Vigl, E
Citation: M. Rugge et al., The p53 gene in patients under the age of 40 with gastric cancer: mutationrates are low but are associated with a cardiac location, J CL PATH-M, 53(4), 2000, pp. 207-210
The hallucination: A disorder of brain and mind
Authors: David, AS Busatto, G
Citation: As. David et G. Busatto, The hallucination: A disorder of brain and mind, NERVENHEILK, 18(3), 1999, pp. 104-115
Long term Reliability Testing of HV-IGBT modules in worst case traction operation
Authors: Fratelli, L Cascone, B Giannini, G Busatto, G
Citation: L. Fratelli et al., Long term Reliability Testing of HV-IGBT modules in worst case traction operation, MICROEL REL, 39(6-7), 1999, pp. 1137-1142
A lumped-charge model for gate turn-off thyristors suitable for circuit simulation
Authors: Iannuzzo, F Busatto, G
Citation: F. Iannuzzo et G. Busatto, A lumped-charge model for gate turn-off thyristors suitable for circuit simulation, MICROELEC J, 30(6), 1999, pp. 543-550
Microsatellite instability and or loss of heterozygosity in young gastric cancer patients in Italy
Authors: Shiao, YH Bovo, D Guido, M Capella, C Cassaro, M Busatto, G Russo, V Sidoni, A Parenti, AR Rugge, M
Citation: Yh. Shiao et al., Microsatellite instability and or loss of heterozygosity in young gastric cancer patients in Italy, INT J CANC, 82(1), 1999, pp. 59-62
Experimental and numerical investigation on MOSFET's failure during reverse recovery of its internal diode
Authors: Busatto, G Persiano, GV Iannuzzo, F
Citation: G. Busatto et al., Experimental and numerical investigation on MOSFET's failure during reverse recovery of its internal diode, IEEE DEVICE, 46(6), 1999, pp. 1268-1273
Patients younger than 40 years with gastric carcinoma - Helicobacter pylori genotype and associated gastritis phenotype
Authors: Rugge, M Busatto, G Cassaro, M Shiao, YH Russo, V Leandro, G Avellini, C Fabiano, A Sidoni, A Covacci, A
Citation: M. Rugge et al., Patients younger than 40 years with gastric carcinoma - Helicobacter pylori genotype and associated gastritis phenotype, CANCER, 85(12), 1999, pp. 2506-2511
Risultati: 1-11 |