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Results: 1-12 |
Results: 12
THE CMS SILICON TRACKER AT LHC
Authors: BILEI GM ALBERGO S ANGARANO M AZZI P BACCHETTA N BAGLIESI G BARTALINI P BASTI A BIGGERI U BISELLO D BOEMI D CAZZOLA U BORRELLO L BOZZI C BREUKER H BRUZZI M CANDELORI A CANER A CASTALDI R CATACCHINI E CHECCUCCI B CIAMPOLINI P CIASNOHOVA A CIVININI C CONNOTTE J CREANZA D DALESSANDRO R DAROLD M DEPALMA M DELLORSO R DELLAMARINA R EKLUND C ELLIOTTPEISERT A FIORE L FOCARDI E FRENCH M GIASSI A GIRALDO A GLESSING B GU WH HALL G HAMMERSTROM R HRUBEC J HUHTINEN M KARIMAKI V KRAMMER M LARICCIA P LORETI M LUEBELSMEYER K LUSTERMANN W MAGGI G MANNELLI M MANTOVANI G MARCHIORO A MARTIGNON G MCEVOY B MESCHINI M MESSINEO A MY S PACCAGNELLA A PANDOULAS D PARRINI G PASSERI D PIERI M POTENZA R RAFFAELLI F RASO G RAYMOND M SANTOCCHIA A SCHMITT B SELVAGGI G SERVOLI L SIEDLING R SILVESTRIS L SKASSYRSKAIA A SKOG K STARODUMOV A STAVITSKY I STEFANINI G TEMPESTA P TONELLI G TRICOMI A TUUVA T VANNINI C VERDINI PG VIERTEL G XIE Z WATTS S WITTMER B
Citation: Gm. Bilei et al., THE CMS SILICON TRACKER AT LHC, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 409(1-3), 1998, pp. 105-111
HIGH-VOLTAGE OPERATION OF SILICON DEVICES FOR LHC EXPERIMENTS
Authors: BACCHETTA N BISELLO D CANDELORI A CAVONE M DALLABETTA GF DAROLD M DELISO G DELLORSO R FUOCHI PG MESSINEO A MIHUL A MILITARU O PACCAGNELLA A TONELLI G VERDINI PG VERZELLESI G WHEADON R
Citation: N. Bacchetta et al., HIGH-VOLTAGE OPERATION OF SILICON DEVICES FOR LHC EXPERIMENTS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 409(1-3), 1998, pp. 139-141
HSPICE SIMULATIONS OF SI MICROSTRIP DETECTORS
Authors: BACCHETTA N BISELLO D CANDELORI A DAROLD M NARDI F PACCAGNELLA A
Citation: N. Bacchetta et al., HSPICE SIMULATIONS OF SI MICROSTRIP DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 409(1-3), 1998, pp. 142-146
MOSFET PARAMETER DEGRADATION AFTER FOWLER-NORDHEIM INJECTION STRESS
Authors: CANDELORI A GOMIERO E GHIDINI G PACCAGNELLA A
Citation: A. Candelori et al., MOSFET PARAMETER DEGRADATION AFTER FOWLER-NORDHEIM INJECTION STRESS, Microelectronics and reliability, 38(2), 1998, pp. 189-193
MODIFICATIONS OF FOWLER-NORDHEIM INJECTION CHARACTERISTICS IN GAMMA-IRRADIATED MOS DEVICES
Authors: SCARPA A PACCAGNELLA A MONTERA F CANDELORI A GHIBAUDO G PANANAKAKIS G GHIDINI G FUOCHI PG
Citation: A. Scarpa et al., MODIFICATIONS OF FOWLER-NORDHEIM INJECTION CHARACTERISTICS IN GAMMA-IRRADIATED MOS DEVICES, IEEE transactions on nuclear science, 45(3), 1998, pp. 1390-1395
RADIATION-INDUCED BULK DAMAGE IN SILICON DIODES WITH PIONS AND PROTONS
Authors: BACCHETTA N BISELLO D CANDELORI A GIRALDO A LORETI M PANTANO D PELLIZZARI A
Citation: N. Bacchetta et al., RADIATION-INDUCED BULK DAMAGE IN SILICON DIODES WITH PIONS AND PROTONS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 388(3), 1997, pp. 318-322
RADIATION EFFECTS ON BREAKDOWN CHARACTERISTICS OF MULTIGUARDED DEVICES
Authors: DAROLD M PACCAGNELLA A DARE A VERZELLESI G BACCHETTA N WHEADON R DALLABETTA GF CANDELORI A SONCINI G BISELLO D
Citation: M. Darold et al., RADIATION EFFECTS ON BREAKDOWN CHARACTERISTICS OF MULTIGUARDED DEVICES, IEEE transactions on nuclear science, 44(3), 1997, pp. 721-727
A SPICE MODEL OF THE OHMIC SIDE OF DOUBLE-SIDED SI MICROSTRIP DETECTORS
Authors: CANDELORI A PACCAGNELLA A BONIN F BACCHETTA N DAROLD M BISELLO D
Citation: A. Candelori et al., A SPICE MODEL OF THE OHMIC SIDE OF DOUBLE-SIDED SI MICROSTRIP DETECTORS, IEEE transactions on nuclear science, 44(3), 1997, pp. 728-735
COMPARISON OF RADIATION-DAMAGE IN SILICON DETECTORS INDUCED BY PIONS,PROTONS AND NEUTRONS
Authors: BIGGERI U BORCHI E BRUZZI M CANDELORI A GIRALDO A
Citation: U. Biggeri et al., COMPARISON OF RADIATION-DAMAGE IN SILICON DETECTORS INDUCED BY PIONS,PROTONS AND NEUTRONS, Nuovo cimento della Società Italiana di Fisica. A. Nuclei, particles and fields, 109(9), 1996, pp. 1351-1358
BREAKDOWN PROPERTIES OF IRRADIATED MOS CAPACITORS
Authors: PACCAGNELLA A CANDELORI A MILANI A FORMIGONI E GHIDINI G DRERA D FUOCHI PG LAVALE M
Citation: A. Paccagnella et al., BREAKDOWN PROPERTIES OF IRRADIATED MOS CAPACITORS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2609-2616
A SPICE MODEL FOR SI MICROSTRIP DETECTORS AND READ-OUT ELECTRONICS
Authors: BACCHETTA N BISELLO D CALGAROTTO C CANDELORI A PACCAGNELLA A
Citation: N. Bacchetta et al., A SPICE MODEL FOR SI MICROSTRIP DETECTORS AND READ-OUT ELECTRONICS, IEEE transactions on nuclear science, 43(3), 1996, pp. 1213-1219
SPICE ANALYSIS OF SIGNAL PROPAGATION IN SI MICROSTRIP DETECTORS
Authors: BACCHETTA N BISELLO D CANDELORI A PACCAGNELLA A SPADA M VANZI M
Citation: N. Bacchetta et al., SPICE ANALYSIS OF SIGNAL PROPAGATION IN SI MICROSTRIP DETECTORS, IEEE transactions on nuclear science, 42(4), 1995, pp. 459-466
Risultati: 1-12 |