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Results:
1-24
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Results: 24
Authors:
CAZAUX J
Citation: J. Cazaux, DIELECTRIC IMAGE POTENTIAL OF CHARGES IN 2D QUANTUM STRUCTURES, Semiconductor science and technology, 13(7), 1998, pp. 827-832
Authors:
RONDOT S
AABOUBI O
CAZAUX J
OLIVIER A
Citation: S. Rondot et al., AN ELECTRODEPOSITION PROCESS FOLLOWED BY X-RAY MICROSCOPY, JOURNAL OF PHYSICAL CHEMISTRY B, 101(34), 1997, pp. 6695-6700
Authors:
ERRE D
BOURELLE E
CLAUDEMONTIGNY B
METROT A
CAZAUX J
Citation: D. Erre et al., FOLLOWING THE INTERCALATION PROCESS OF H2SO4 INTO PYROGRAPHITE BY X-RAY MICROSCOPY, Physical review. B, Condensed matter, 56(8), 1997, pp. 4944-4948
Authors:
JBARA O
PORTRON B
MOUZE D
CAZAUX J
Citation: O. Jbara et al., ELECTRON-PROBE MICROANALYSIS OF INSULATING OXIDES - MONTE-CARLO SIMULATIONS, X-ray spectrometry, 26(5), 1997, pp. 291-302
Authors:
RONDOT S
CAZAUX J
Citation: S. Rondot et J. Cazaux, QUANTITATIVE MAPPING OF SPECIES MOVING IN SOLUTION BY X-RAY PROJECTION MICROSCOPY, Review of scientific instruments, 68(4), 1997, pp. 1787-1791
Authors:
CAZAUX J
Citation: J. Cazaux, A PHYSICAL APPROACH TO THE RADIATION-DAMAGE MECHANISMS INDUCED BY X-RAYS IN X-RAY MICROSCOPY AND RELATED TECHNIQUES, Journal of Microscopy, 188, 1997, pp. 106-124
Authors:
CAZAUX J
Citation: J. Cazaux, SCANNING AUGER MICROSCOPY - PRINCIPLE AND ARTIFACTS, Le Vide, 52(279), 1996, pp. 65
Authors:
CAZAUX J
Citation: J. Cazaux, INSULATING MATERIALS XPS AND AES ANALYSIS, Le Vide, 52(279), 1996, pp. 73
Authors:
ERRE D
JIBAOUI H
CAZAUX J
Citation: D. Erre et al., X-RAY MICROSCOPY BY TOTAL REFLECTIVITY AN D GRAZING-INCIDENCE KOSSEL DIFFRACTION, Journal de physique. IV, 6(C4), 1996, pp. 393-398
Authors:
RONDOT S
CAZAUX J
Citation: S. Rondot et J. Cazaux, ANALYTICAL X-RAY MICROSCOPY AND ION DIFFU SION IN SOLUTION, Journal de physique. IV, 6(C4), 1996, pp. 733-738
Authors:
ELHILA H
ZOLFAGHARI A
CAZAUX J
AUDRAN JC
MOUZE D
Citation: H. Elhila et al., X-RAY MICROSCOPY AND MICROTOMOGRAPHY - AP PLICATION IN BIOLOGY, Journal de physique. IV, 6(C4), 1996, pp. 739-745
Authors:
CAZAUX J
Citation: J. Cazaux, THE ELECTRIC IMAGE EFFECTS AT DIELECTRIC SURFACES, IEEE transactions on dielectrics and electrical insulation, 3(1), 1996, pp. 75-79
Authors:
RONDOT S
CAZAUX J
Citation: S. Rondot et J. Cazaux, EXPERIMENTAL-VERIFICATION OF A NEW QUANTIFICATION PROCEDURE FOR ELEMENTAL MAPPING BY ANALYTICAL X-RAY MICROSCOPY, Ultramicroscopy, 65(3-4), 1996, pp. 159-177
Authors:
CAZAUX J
Citation: J. Cazaux, ELECTRON-PROBE MICROANALYSIS OF INSULATING MATERIALS - QUANTIFICATIONPROBLEMS AND SOME POSSIBLE SOLUTIONS, X-ray spectrometry, 25(6), 1996, pp. 265-280
Authors:
JBARA O
CAZAUX J
REMOND G
GILLES C
Citation: O. Jbara et al., HALOGEN ION ELECTRIC-FIELD ASSISTED DIFFUSION IN FLUORITE AND POLYVINYL-CHLORIDE DURING ELECTRON-IRRADIATION, Journal of applied physics, 79(5), 1996, pp. 2309-2313
Authors:
CAZAUX J
LANGERON JP
Citation: J. Cazaux et Jp. Langeron, PREFACE, Microscopy microanalysis microstructures, 6(3), 1995, pp. 1-1
Authors:
CAZAUX J
Citation: J. Cazaux, THE ROLE OF THE AUGER MECHANISM IN THE RADIATION-DAMAGE OF INSULATORS, Microscopy microanalysis microstructures, 6(3), 1995, pp. 345-362
Authors:
CAZAUX J
Citation: J. Cazaux, CORRELATIONS BETWEEN IONIZATION RADIATION-DAMAGE AND CHARGING EFFECTSIN TRANSMISSION ELECTRON-MICROSCOPY, Ultramicroscopy, 60(3), 1995, pp. 411-425
Authors:
BENHAYOUNE H
JBARA O
THOMAS X
CAZAUX J
Citation: H. Benhayoune et al., DETERMINATION OF THICKNESS MAPS OF THIN COATINGS BY EDS EPMA, X-ray spectrometry, 24(3), 1995, pp. 147-151
Authors:
JBARA O
CAZAUX J
TREBBIA P
Citation: O. Jbara et al., SODIUM DIFFUSION IN GLASSES DURING ELECTRON-IRRADIATION, Journal of applied physics, 78(2), 1995, pp. 868-875
Authors:
RONDOT S
CAZAUX J
AABOUBI O
CHOPART JP
OLIVIER A
Citation: S. Rondot et al., FOLLOWING ION DIFFUSION IN SOLUTION, Science, 263(5154), 1994, pp. 1739-1741
Authors:
CAZAUX J
ERRE D
MOUZE D
PATAT JM
RONDOT S
SASOV A
TREBBIA P
ZOLFAGHARI A
Citation: J. Cazaux et al., RECENT DEVELOPMENTS IN X-RAY PROJECTION MICROSCOPY AND X-RAY MICROTOMOGRAPHY APPLIED TO MATERIALS SCIENCE, Journal de physique. IV, 3(C7), 1993, pp. 2099-2104
Authors:
CAZAUX J
Citation: J. Cazaux, A NEW QUANTIFICATION PROCEDURE FOR ELEMENTAL MAPPING BY X-RAY (ABSORPTION) MICROSCOPY, Microscopy microanalysis microstructures, 4(6), 1993, pp. 513-537
Authors:
BENHAYOUNE H
JBARA O
THOMAS X
MOUZE D
CAZAUX J
Citation: H. Benhayoune et al., A NEW EXPERIMENTAL PROCEDURE FOR THE BACKSCATTERING CORRECTION IN AUGER ANALYSIS, Surface and interface analysis, 20(7), 1993, pp. 600-602
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