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Results: 1-9 |
Results: 9
STRUCTURAL AND MAGNETIC ANALYSIS OF NI81FE19 AG MULTILAYERS WITH ULTRATHIN NI81FE19 SUBLAYERS/
Authors: CHLADEK M DORNER C MATNER M HOFFMANN H VALVODA V
Citation: M. Chladek et al., STRUCTURAL AND MAGNETIC ANALYSIS OF NI81FE19 AG MULTILAYERS WITH ULTRATHIN NI81FE19 SUBLAYERS/, Journal of physics. Condensed matter, 9(22), 1997, pp. 4557-4574
QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .1. INTERLAYER STRUCTURE
Authors: CHLADEK M VALVODA V DORNER C ERNST W
Citation: M. Chladek et al., QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .1. INTERLAYER STRUCTURE, Journal of magnetism and magnetic materials, 172(3), 1997, pp. 209-217
QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .2. INTRALAYER STRUCTURE
Authors: CHLADEK M VALVODA V DORNER C
Citation: M. Chladek et al., QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .2. INTRALAYER STRUCTURE, Journal of magnetism and magnetic materials, 172(3), 1997, pp. 218-224
MICROSTRUCTURE OF CO-NI AU MULTILAYERS STUDIED BY XRD/
Authors: RAFAJA D CHLADEK M VALVODA V SEDDAT M LASSRI H KRISHNAN R
Citation: D. Rafaja et al., MICROSTRUCTURE OF CO-NI AU MULTILAYERS STUDIED BY XRD/, Thin solid films, 292(1-2), 1997, pp. 61-68
QUANTITATIVE IN-SITU X-RAY-DIFFRACTION ANALYSIS OF MAGNETIC MULTILAYERS DURING ANNEALING
Authors: CHLADEK M DORNER C BUCHAL A VALVODA V HOFFMANN H
Citation: M. Chladek et al., QUANTITATIVE IN-SITU X-RAY-DIFFRACTION ANALYSIS OF MAGNETIC MULTILAYERS DURING ANNEALING, Journal of applied physics, 80(3), 1996, pp. 1437-1445
JOINT TEXTURE REFINEMENT
Authors: VALVODA V CHLADEK M CERNY R
Citation: V. Valvoda et al., JOINT TEXTURE REFINEMENT, Journal of applied crystallography, 29, 1996, pp. 48-52
QUANTITATIVE STUDY OF INTERFACE ROUGHNESS REPLICATION IN MULTILAYERS USING X-RAY REFLECTIVITY AND TRANSMISSION ELECTRON-MICROSCOPY
Authors: CHLADEK M VALVODA V DORNER C HOLY C GRIM J
Citation: M. Chladek et al., QUANTITATIVE STUDY OF INTERFACE ROUGHNESS REPLICATION IN MULTILAYERS USING X-RAY REFLECTIVITY AND TRANSMISSION ELECTRON-MICROSCOPY, Applied physics letters, 69(9), 1996, pp. 1318-1320
XRD MICROSTRUCTURAL STUDY OF ZN FILMS DEPOSITED BY UNBALANCED MAGNETRON SPUTTERING
Authors: KUZEL R VALVODA V CHLADEK M MUSIL J MATOUS J
Citation: R. Kuzel et al., XRD MICROSTRUCTURAL STUDY OF ZN FILMS DEPOSITED BY UNBALANCED MAGNETRON SPUTTERING, Thin solid films, 263(2), 1995, pp. 150-158
EMPIRICAL TEXTURE CORRECTIONS FOR ASYMMETRIC DIFFRACTION AND INCLINEDTEXTURES
Authors: CERNY R VALVODA V CHLADEK M
Citation: R. Cerny et al., EMPIRICAL TEXTURE CORRECTIONS FOR ASYMMETRIC DIFFRACTION AND INCLINEDTEXTURES, Journal of applied crystallography, 28, 1995, pp. 247-253
Risultati: 1-9 |