Authors:
Capitan, MJ
Calvayrac, Y
Gratias, D
Alvarez, J
Citation: Mj. Capitan et al., X-ray diffraction study of the 5-fold plane surface of a Al70.4Pd21.4Mn8.2single-grain, PHYSICA B, 283(1-3), 2000, pp. 79-83
Authors:
Capitan, MJ
Thiaudiere, D
Goirand, L
Taffut, R
Lequien, S
Citation: Mj. Capitan et al., The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies, PHYSICA B, 283(1-3), 2000, pp. 256-261
Authors:
Ramos, S
Barnes, AC
Neilson, GW
Capitan, MJ
Citation: S. Ramos et al., Anomalous X-ray diffraction studies of hydration effects in concentrated aqueous electrolyte solutions, CHEM PHYS, 258(2-3), 2000, pp. 171-180
Authors:
Capitan, MJ
Stabel, A
Sanchez-Lopez, JC
Justo, A
Gonzalez-Elipe, AR
Lefebvre, S
Fernandez, A
Citation: Mj. Capitan et al., Characterization of mixed Ti/Al oxide thin films prepared by ion-beam-induced CVD, APPL SURF S, 161(1-2), 2000, pp. 209-218
Authors:
Camarero, J
Cros, V
Capitan, MJ
Alvarez, J
Ferrer, S
Nino, MA
Prieto, JE
Gomez, L
Ferron, J
de Parga, ALV
Gallego, JM
de Miguel, JJ
Miranda, R
Citation: J. Camarero et al., Epitaxial growth of metals with high Ehrlich-Schwoebel barriers and the effect of surfactants, APPL PHYS A, 69(5), 1999, pp. 553-557
Authors:
Swenson, J
Matic, A
Gejke, C
Borjesson, L
Howells, WS
Capitan, MJ
Citation: J. Swenson et al., Conductivity enhancement in PbI2-AgI-AgPO3 glasses by diffraction experiments and reverse Monte Carlo modeling, PHYS REV B, 60(17), 1999, pp. 12023-12032
Authors:
Joulaud, JL
Capitan, MJ
Hausermann, D
Lefebvre, S
Calvayrac, Y
Citation: Jl. Joulaud et al., Structural study of approximant phases of Al-Cu-Fe quasicrystals under high pressure, PHYS REV B, 59(5), 1999, pp. 3521-3526
Authors:
de Bernabe, A
Capitan, MJ
Fischer, HE
Quiros, C
Prieto, C
Colino, J
Mompean, F
Sanz, JM
Citation: A. De Bernabe et al., Combination of specular and off-specular low-angle X-ray diffraction in the study of Co/Cu multilayers: Mesoscopic structure and layer oxidation, SURF INT AN, 27(1), 1999, pp. 1-7
Authors:
Alvarez, J
Calvayrac, Y
Joulaud, JL
Capitan, MJ
Citation: J. Alvarez et al., Characterization of the five-fold plane surface of an Al70.4Pd21.4Mn8.2 quasi-crystal by means of surface X-ray diffraction, SURF SCI, 423(2-3), 1999, pp. L251-L257
Citation: Mj. Capitan et al., A high temperature furnace for in situ and time-resolved x-ray diffractionstudies, REV SCI INS, 70(5), 1999, pp. 2248-2252
Authors:
Capitan, MJ
Paul, A
Pastol, JL
Odriozola, JA
Citation: Mj. Capitan et al., X-ray diffraction study of oxide scales formed at high temperatures on AISI 304 stainless steel after cerium deposition, OXID METAL, 52(5-6), 1999, pp. 447-462