Authors:
Wei, AC
Liu, PH
Chao, KJ
Yang, E
Cheng, HY
Citation: Ac. Wei et al., X-ray absorption measurement and density functional theory analysis of gallium in gallium-containing beta zeolites, MICROP M M, 47(2-3), 2001, pp. 147-156
Citation: R. Bashir et al., Atomic force microscopy studies of self-assembled Si1-xGex islands produced by controlled relaxation of strained films, J VAC SCI B, 19(2), 2001, pp. 517-522
Authors:
Nguyen, CV
Chao, KJ
Stevens, RMD
Delzeit, L
Cassell, A
Han, J
Meyyappan, M
Citation: Cv. Nguyen et al., Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors, NANOTECHNOL, 12(3), 2001, pp. 363-367
Authors:
Yang, CM
Cho, AT
Pan, FM
Tsai, TG
Chao, KJ
Citation: Cm. Yang et al., Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces, ADVAN MATER, 13(14), 2001, pp. 1099
Authors:
Cheng, HY
Yang, E
Chao, KJ
Wei, AC
Liu, PH
Citation: Hy. Cheng et al., Studies of the structure of vanadium species in VAPO-5 molecular sieves via density functional theory computation and Raman spectroscopy, J PHYS CH B, 104(44), 2000, pp. 10293-10297
Authors:
Cheng, HY
Yang, E
Lai, CJ
Chao, KJ
Wei, AC
Lee, JF
Citation: Hy. Cheng et al., Density functional theory calculation and X-ray absorption spectroscopy studies of structure of vanadium-containing aluminophosphate VAPO-5, J PHYS CH B, 104(17), 2000, pp. 4195-4203
Citation: Kj. Chao et al., X-ray absorption spectroscopic study on the states of gallium and platinumin Pt/Ga/H-beta zeolites, MICROP M M, 35-6, 2000, pp. 413-424
Authors:
Chao, KJ
Lin, CC
Lin, CH
Wu, HC
Tseng, CW
Chen, SH
Citation: Kj. Chao et al., n-Heptane hydroconversion on platinum-loaded mordenite and beta zeolites: the effect of reaction pressure, APP CATAL A, 203(2), 2000, pp. 211-220
Citation: Ac. Wei et Kj. Chao, Structural characterization of metal ions incorporated in molecular sieve frameworks, J CHIN CHEM, 47(1), 2000, pp. 33-40
Citation: R. Bashir et al., Formation of self-assembled Si1-xGex islands using reduced pressure chemical vapor deposition and subsequent thermal annealing of thin germanium-richfilms, APPL SURF S, 152(1-2), 1999, pp. 99-106
Citation: Kj. Chao et al., Substrate effects on the formation of flat Ag films on (110) surfaces of III-V compound semiconductors, PHYS REV B, 60(7), 1999, pp. 4988-4991
Citation: P. Ebert et al., Dislocations, phason defects, and domain walls in a one-dimensional quasiperiodic superstructure of a metallic thin film, PHYS REV L, 83(16), 1999, pp. 3222-3225
Citation: Ar. Pradhan et al., EPR and NMR studies of coke induced selectivation over H-ZSM-5 zeolite during ethylbenzene disproportionation reaction, J CATALYSIS, 184(1), 1999, pp. 29-38
Authors:
Chao, KJ
Liu, N
Shih, CK
Gotthold, DW
Streetman, BG
Citation: Kj. Chao et al., Factors influencing the interfacial roughness of InGaAs/GaAs heterostructures: A scanning tunneling microscopy study, APPL PHYS L, 75(12), 1999, pp. 1703-1705