Authors:
Michelutti, L
Mathieu, N
Chovet, A
Galerie, A
Citation: L. Michelutti et al., Influence of chemical corrosion on resistivity and 1/f noise of polysilicon gauges, MICROEL REL, 40(1), 2000, pp. 179-183
Citation: Am. Ionescu et A. Chovet, Sub-band-gap impact ionization events in transient regimes of floating body SOI devices, MICROEL ENG, 48(1-4), 1999, pp. 371-374
Authors:
Lee, JI
Brini, J
Chovet, A
Dimitriadis, CA
Citation: Ji. Lee et al., Flicker noise hy random walk of electrons at the interface in nonideal Schottky diodes, SOL ST ELEC, 43(12), 1999, pp. 2185-2189