Authors:
Chahboun, A
Coratger, R
Pascale, A
Baules, P
Ajustron, F
Zorkani, I
Beauvillain, J
Citation: A. Chahboun et al., Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy, J APPL PHYS, 89(11), 2001, pp. 6302-6307
Authors:
Seine, G
Coratger, R
Carladous, A
Ajustron, F
Pechou, R
Beauvillain, J
Citation: G. Seine et al., Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopy, SURF SCI, 465(3), 2000, pp. 219-226
Authors:
Chahboun, A
Coratger, R
Pechou, R
Ajustron, F
Beauvillain, J
Citation: A. Chahboun et al., Hot hole transport through Au/n-Si(100) studied by reverse ballistic electron emission microscopy and spectroscopy, SURF SCI, 462(1-3), 2000, pp. 61-67
Authors:
Chahboun, A
Coratger, R
Ajustron, F
Beauvillain, J
Dharmadasa, IM
Samantilleke, AP
Citation: A. Chahboun et al., Ballistic electron emission microscopy of Au/n-ZnSe contacts and local density of states spectroscopy, J APPL PHYS, 87(5), 2000, pp. 2422-2426
Authors:
Coratger, R
Girardin, C
Pechou, R
Ajustron, F
Beauvillain, J
Citation: R. Coratger et al., Determination of the electron mean free path in the 1-1.8 eV energy range in thin gold layers using ballistic electron emission microscopy, EPJ-APPL PH, 5(3), 1999, pp. 237-242