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Results:
1-11
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Results: 11
Authors:
CHAZALVIEL JN
DAFONSECA C
OZANAM F
Citation: Jn. Chazalviel et al., IN-SITU INFRARED STUDY OF THE OSCILLATING ANODIC-DISSOLUTION OF SILICON IN FLUORIDE ELECTROLYTES (VOL 145, PG 964, 1998), Journal of the Electrochemical Society, 145(9), 1998, pp. 3312-3312
Authors:
CHAZALVIEL JN
DAFONSECA C
OZANAM F
Citation: Jn. Chazalviel et al., IN-SITU INFRARED STUDY OF THE OSCILLATING ANODIC-DISSOLUTION OF SILICON IN FLUORIDE ELECTROLYTES, Journal of the Electrochemical Society, 145(3), 1998, pp. 964-973
Authors:
CATTARIN S
CHAZALVIEL JN
DAFONSECA C
OZANAM F
PETER LM
SCHLICHTHORL G
STUMPER J
Citation: S. Cattarin et al., IN-SITU CHARACTERIZATION OF THE P-SI NH4F INTERFACE DURING DISSOLUTION IN THE CURRENT OSCILLATIONS REGIME/, Journal of the Electrochemical Society, 145(2), 1998, pp. 498-502
Authors:
DAFONSECA C
OZANAM F
CHAZALVIEL JN
Citation: C. Dafonseca et al., IN-SITU FT-IR STUDY OF THE INTERFACIAL OXIDE IN THE ANODIC-DISSOLUTION OF SILICON, Mikrochimica acta, 1997, pp. 811-813
Authors:
OZANAM F
DAFONSECA C
RAO AV
CHAZALVIEL JN
Citation: F. Ozanam et al., IN-SITU SPECTROELECTROCHEMICAL STUDY OF THE ANODIC-DISSOLUTION OF SILICON BY POTENTIAL-DIFFERENCE AND ELECTROMODULATED FT-IR SPECTROSCOPY, Applied spectroscopy, 51(4), 1997, pp. 519-525
Authors:
DAFONSECA C
OZANAM F
CHAZALVIEL JN
Citation: C. Dafonseca et al., IN-SITU INFRARED CHARACTERIZATION OF THE INTERFACIAL OXIDE DURING THEANODIC-DISSOLUTION OF A SILICON ELECTRODE IN FLUORIDE ELECTROLYTES, Surface science, 365(1), 1996, pp. 1-14
Authors:
DAFONSECA C
TRAVERSE A
TADJEDDINE A
BELO MD
Citation: C. Dafonseca et al., A CHARACTERIZATION OF TITANIUM ANODIC OXIDES BY X-RAY-ABSORPTION SPECTROSCOPY AND GRAZING X-RAY-DIFFRACTION, Journal of electroanalytical chemistry [1992], 388(1-2), 1995, pp. 115-122
Authors:
OZANAM F
DAFONSECA C
CHAZALVIEL JN
Citation: F. Ozanam et al., IN-SITU INFRARED STUDY OF THE INTERFACIAL LAYER DURING THE ANODIC-DISSOLUTION OF A SILICON ELECTRODE IN A FLUORIDE ELECTROLYTE, Proceedings of the Indian Academy of Sciences. Chemical sciences, 107(6), 1995, pp. 709-719
CHARACTERIZATION OF TITANIUM PASSIVATION FILMS BY IN-SITU AC-IMPEDANCE MEASUREMENTS AND XPS ANALYSIS
Authors:
DAFONSECA C
BOUDIN S
BELO MD
Citation: C. Dafonseca et al., CHARACTERIZATION OF TITANIUM PASSIVATION FILMS BY IN-SITU AC-IMPEDANCE MEASUREMENTS AND XPS ANALYSIS, Journal of electroanalytical chemistry [1992], 379(1-2), 1994, pp. 173-180
Authors:
DAFONSECA C
BELO MDC
Citation: C. Dafonseca et Mdc. Belo, IN-SITU CHARACTERIZATION OF THE ELECTRONI C-STRUCTURE OF AN ANODIC TITANIUM-OXIDE FROM CAPACITANCE MEASUREMENTS, Comptes rendus de l'Academie des sciences. Serie 2, Mecanique, physique, chimie, sciences de l'univers, sciences de la terre, 318(6), 1994, pp. 753-759
Authors:
DAFONSECA C
FERREIRA MG
BELO MD
Citation: C. Dafonseca et al., MODELING OF THE IMPEDANCE BEHAVIOR OF AN AMORPHOUS-SEMICONDUCTOR SCHOTTKY-BARRIER IN HIGH DEPLETION CONDITIONS - APPLICATION TO THE STUDY OF THE TITANIUM ANODIC OXIDE ELECTROLYTE JUNCTION, Electrochimica acta, 39(14), 1994, pp. 2197-2205
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