Authors: MAES HE GROESENEKEN G DEGRAEVE R DEBLAUWE J VANDENBOSCH G

Citation: He. Maes et al., ASSESSMENT OF OXIDE RELIABILITY AND HOT-CARRIER DEGRADATION IN CMOS TECHNOLOGY, Microelectronic engineering, 40(3-4), 1998, pp. 147-166

Authors: DEBLAUWE J VANHOUDT J WELLEKENS D GROESENEKEN G MAES HE

Citation: J. Deblauwe et al., SILC-RELATED EFFECTS IN FLASH (EPROM)-P-2S - PART I - A QUANTITATIVE MODEL FOR STEADY-STATE SILC, I.E.E.E. transactions on electron devices, 45(8), 1998, pp. 1745-1750

Authors: DEBLAUWE J VANHOUDT J WELLEKENS D GROESENEKEN G MAES HE

Citation: J. Deblauwe et al., SILC-RELATED EFFECTS IN FLASH (EPROM)-P-2S - PART II - PREDICTION OF STEADY-STATE SILC-RELATED DISTURB CHARACTERISTICS, I.E.E.E. transactions on electron devices, 45(8), 1998, pp. 1751-1760

Authors: DEBLAUWE J WELLEKENS D GROESENEKEN G HASPESLAGH L VANHOUDT J DEFERM L MAES HE

Citation: J. Deblauwe et al., READ-DISTURB AND ENDURANCE OF SSI-FLASH E(2)PROM DEVICES AT HIGH OPERATING TEMPERATURES, I.E.E.E. transactions on electron devices, 45(12), 1998, pp. 2466-2474

Authors: DEBLAUWE J HACHULLA E

Citation: J. Deblauwe et E. Hachulla, FATAL EDEMATOUS POLYARTHRITIS AND THE CAS E OF MOZART,WOLFGANG,AMADEUS, La Revue de medecine interne, 18, 1997, pp. 291-294

Authors: DEBLAUWE J WELLEKENS D VANHOUDT J DEGRAEVE R HASPESLAGH L GROESENEKEN G MAES HE

Citation: J. Deblauwe et al., IMPACT OF TUNNEL-OXIDE NITRIDATION ON ENDURANCE AND READ-DISTURB CHARACTERISTICS OF FLASH E(2)PROM DEVICES, Microelectronic engineering, 36(1-4), 1997, pp. 301-304