Authors:
MAES HE
GROESENEKEN G
DEGRAEVE R
DEBLAUWE J
VANDENBOSCH G
Citation: He. Maes et al., ASSESSMENT OF OXIDE RELIABILITY AND HOT-CARRIER DEGRADATION IN CMOS TECHNOLOGY, Microelectronic engineering, 40(3-4), 1998, pp. 147-166
Authors:
DEBLAUWE J
VANHOUDT J
WELLEKENS D
GROESENEKEN G
MAES HE
Citation: J. Deblauwe et al., SILC-RELATED EFFECTS IN FLASH (EPROM)-P-2S - PART I - A QUANTITATIVE MODEL FOR STEADY-STATE SILC, I.E.E.E. transactions on electron devices, 45(8), 1998, pp. 1745-1750
Authors:
DEBLAUWE J
VANHOUDT J
WELLEKENS D
GROESENEKEN G
MAES HE
Citation: J. Deblauwe et al., SILC-RELATED EFFECTS IN FLASH (EPROM)-P-2S - PART II - PREDICTION OF STEADY-STATE SILC-RELATED DISTURB CHARACTERISTICS, I.E.E.E. transactions on electron devices, 45(8), 1998, pp. 1751-1760
Authors:
DEBLAUWE J
WELLEKENS D
GROESENEKEN G
HASPESLAGH L
VANHOUDT J
DEFERM L
MAES HE
Citation: J. Deblauwe et al., READ-DISTURB AND ENDURANCE OF SSI-FLASH E(2)PROM DEVICES AT HIGH OPERATING TEMPERATURES, I.E.E.E. transactions on electron devices, 45(12), 1998, pp. 2466-2474
Citation: J. Deblauwe et E. Hachulla, FATAL EDEMATOUS POLYARTHRITIS AND THE CAS E OF MOZART,WOLFGANG,AMADEUS, La Revue de medecine interne, 18, 1997, pp. 291-294
Authors:
DEBLAUWE J
WELLEKENS D
VANHOUDT J
DEGRAEVE R
HASPESLAGH L
GROESENEKEN G
MAES HE
Citation: J. Deblauwe et al., IMPACT OF TUNNEL-OXIDE NITRIDATION ON ENDURANCE AND READ-DISTURB CHARACTERISTICS OF FLASH E(2)PROM DEVICES, Microelectronic engineering, 36(1-4), 1997, pp. 301-304