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Authors:
DEHM G
THOMAS J
MAYER J
WEISSGARBER T
PUSCHE W
SAUER C
Citation: G. Dehm et al., FORMATION AND INTERFACE STRUCTURE OF TIC PARTICLES IN DISPERSION-STRENGTHENED CU ALLOYS, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(6), 1998, pp. 1531-1554
Authors:
SCHEU C
DEHM G
KAPLAN WD
WAGNER F
CLAUSSEN N
Citation: C. Scheu et al., MICROSTRUCTURE AND PHASE EVOLUTION OF NIOBIUM-ALUMINIDE-ALUMINA COMPOSITES PREPARED BY MELT-INFILTRATION, Physica status solidi. a, Applied research, 166(1), 1998, pp. 241-255
Authors:
GAUDETTE F
SURESH S
EVANS AG
DEHM G
RUHLE M
Citation: F. Gaudette et al., THE INFLUENCE OF CHROMIUM ADDITION ON THE TOUGHNESS OF GAMMA-NI ALPHA-AL2O3 INTERFACES/, Acta materialia, 45(9), 1997, pp. 3503-3513
Citation: G. Dehm et al., A MICROINDENTATION METHOD FOR ESTIMATING INTERFACIAL SHEAR-STRENGTH AND ITS USE IN STUDYING THE INFLUENCE OF TITANIUM TRANSITION LAYERS ON THE INTERFACE STRENGTH OF EPITAXIAL COPPER-FILMS ON SAPPHIRE, Acta materialia, 45(2), 1997, pp. 489-499
Authors:
SAUER C
WEISSGAERBER T
PUESCHE W
DEHM G
MAYER J
KIEBACK B
Citation: C. Sauer et al., HIGH-TEMPERATURE CREEP OF MICROCRYSTALLINE DISPERSION-STRENGTHENED COPPER-ALLOYS, International journal of powder metallurgy, 33(1), 1997, pp. 45-53
Citation: G. Dehm et al., SYNTHESIS OF ANALYTICAL AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY TO DETERMINE THE INTERFACE STRUCTURE OF CU AL2O3/, Ultramicroscopy, 67(1-4), 1997, pp. 207-217
Citation: G. Mobus et G. Dehm, RETRIEVAL OF CRYSTAL DEFECT STRUCTURES FROM HREM IMAGES BY SIMULATED EVOLUTION .2. EXPERIMENTAL IMAGE EVALUATION, Ultramicroscopy, 65(3-4), 1996, pp. 217-228
Authors:
DEHM G
ERNST F
MAYER J
MOBUS G
MULLEJANS H
PHILLIPP F
SCHEU C
RUHLE M
Citation: G. Dehm et al., TRANSMISSION ELECTRON-MICROSCOPY AT THE MAX-PLANCK-INSTITUT FUR METALLFORSCHUNG, Zeitschrift fur Metallkunde, 87(11), 1996, pp. 898-910
Authors:
SCHEU C
DEHM G
MULLEJANS H
BRYDSON R
RUHLE M
Citation: C. Scheu et al., ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF METAL-ALUMINA INTERFACES, Microscopy microanalysis microstructures, 6(1), 1995, pp. 19-31
Citation: G. Dehm et al., GROWTH AND STRUCTURE OF COPPER THIN-FILMS DEPOSITED ON (0001) SAPPHIRE BY MOLECULAR-BEAM EPITAXY, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 71(6), 1995, pp. 1111-1124
Citation: G. Mobus et al., MEASUREMENT OF COHERENCY STATES OF METAL-CERAMIC INTERFACES BY HREM IMAGE-PROCESSING, Physica status solidi. a, Applied research, 150(1), 1995, pp. 77-87