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Results: 1-17 |
Results: 17
SUBMICROMETER RESOLUTION PHASE-CONTRAST RADIOGRAPHY WITH THE BEAM FROM AN X-RAY WAVE-GUIDE
Authors: DIFONZO S JARK W SOULLIE G CEDOLA A LAGOMARSINO S CLOETENS P RIEKEL C
Citation: S. Difonzo et al., SUBMICROMETER RESOLUTION PHASE-CONTRAST RADIOGRAPHY WITH THE BEAM FROM AN X-RAY WAVE-GUIDE, Journal of synchrotron radiation, 5, 1998, pp. 376-378
SUBMICROMETER BEAMS FROM A HARD X-RAY WAVE-GUIDE AT A 3RD-GENERATION SYNCHROTRON-RADIATION SOURCE
Authors: CEDOLA A LAGOMARSINO S DIFONZO S JARK W RIEKEL C DESCHAMPS P
Citation: A. Cedola et al., SUBMICROMETER BEAMS FROM A HARD X-RAY WAVE-GUIDE AT A 3RD-GENERATION SYNCHROTRON-RADIATION SOURCE, Journal of synchrotron radiation, 5, 1998, pp. 17-22
STUDY OF PHOTOELECTRON EMISSION YIELD FROM LAYERED STRUCTURES IN PRESENCE OF RESONANCE-ENHANCED X-RAY PROPAGATION EFFECT
Authors: PELKA JB LAGOMARSINO S CEDOLA A DIFONZO S JARK W
Citation: Jb. Pelka et al., STUDY OF PHOTOELECTRON EMISSION YIELD FROM LAYERED STRUCTURES IN PRESENCE OF RESONANCE-ENHANCED X-RAY PROPAGATION EFFECT, Acta Physica Polonica. A, 91(5), 1997, pp. 851-857
PHASE-CONTRAST HARD X-RAY MICROSCOPY WITH SUBMICRON RESOLUTION
Authors: LAGOMARSINO S CEDOLA A CLOETENS P DIFONZO S JARK W SOULLIE G RIEKEL C
Citation: S. Lagomarsino et al., PHASE-CONTRAST HARD X-RAY MICROSCOPY WITH SUBMICRON RESOLUTION, Applied physics letters, 71(18), 1997, pp. 2557-2559
CHARACTERIZATION OF SPUTTERED NICKEL CARBON MULTILAYERS WITH SOFT-X-RAY REFLECTIVITY MEASUREMENTS/
Authors: FRIEDRICH J DIEL I KUNZ C DIFONZO S MULLER BR JARK W
Citation: J. Friedrich et al., CHARACTERIZATION OF SPUTTERED NICKEL CARBON MULTILAYERS WITH SOFT-X-RAY REFLECTIVITY MEASUREMENTS/, Applied optics, 36(25), 1997, pp. 6329-6334
OPTICAL-CONSTANTS OF FLOAT GLASS, NICKEL, AND CARBON FROM SOFT-X-RAY REFLECTIVITY MEASUREMENTS
Authors: DIEL I FRIEDRICH J KUNZ C DIFONZO S MULLER BR JARK W
Citation: I. Diel et al., OPTICAL-CONSTANTS OF FLOAT GLASS, NICKEL, AND CARBON FROM SOFT-X-RAY REFLECTIVITY MEASUREMENTS, Applied optics, 36(25), 1997, pp. 6376-6382
OSCILLATIONS IN REFLECTIVITY OF SAMPLES WITH X-RAY WAVE-GUIDE LAYERS
Authors: PELKA JB LAGOMARSINO S DIFONZO S JARK W DOMAGALA J
Citation: Jb. Pelka et al., OSCILLATIONS IN REFLECTIVITY OF SAMPLES WITH X-RAY WAVE-GUIDE LAYERS, Acta Physica Polonica. A, 89(3), 1996, pp. 323-328
ELECTROMAGNETIC-FIELD RESONANCE IN THIN AMORPHOUS FILMS - A TOOL FOR NONDESTRUCTIVE LOCALIZATION OF THIN MARKER LAYERS BY USE OF A STANDARDX-RAY TUBE
Authors: DIFONZO S JARK W LAGOMARSINO S CEDOLA A MULLER BR PELKA JB
Citation: S. Difonzo et al., ELECTROMAGNETIC-FIELD RESONANCE IN THIN AMORPHOUS FILMS - A TOOL FOR NONDESTRUCTIVE LOCALIZATION OF THIN MARKER LAYERS BY USE OF A STANDARDX-RAY TUBE, Thin solid films, 287(1-2), 1996, pp. 288-292
PROPERTIES OF A SUBMICROMETER X-RAY-BEAM AT THE EXIT OF A WAVE-GUIDE
Authors: JARK W DIFONZO S LAGOMARSINO S CEDOLA A DIFABRIZIO E BRAM A RIEKEL C
Citation: W. Jark et al., PROPERTIES OF A SUBMICROMETER X-RAY-BEAM AT THE EXIT OF A WAVE-GUIDE, Journal of applied physics, 80(9), 1996, pp. 4831-4836
SUBMICROMETER X-RAY-BEAM PRODUCTION BY A THIN-FILM WAVE-GUIDE
Authors: LAGOMARSINO S JARK W DIFONZO S CEDOLA A MUELLER B ENGSTROM P RIEKEL C
Citation: S. Lagomarsino et al., SUBMICROMETER X-RAY-BEAM PRODUCTION BY A THIN-FILM WAVE-GUIDE, Journal of applied physics, 79(8), 1996, pp. 4471-4473
MULTILAYER TRANSMISSION PHASE SHIFTERS FOR THE CARBON K EDGE AND THE WATER WINDOW
Authors: DIFONZO S MULLER BR JARK W GAUPP A SCHAFERS F UNDERWOOD JH
Citation: S. Difonzo et al., MULTILAYER TRANSMISSION PHASE SHIFTERS FOR THE CARBON K EDGE AND THE WATER WINDOW, Review of scientific instruments, 66(2), 1995, pp. 1513-1516
SUPER ESCA - FIRST BEAMLINE OPERATING AT ELETTRA
Authors: ABRAMI A BARNABA M BATTISTELLO L BIANCO A BRENA B CAUTERO G CHEN QH COCCO D COMELLI G CONTRINO S DEBONA F DIFONZO S FAVA C FINETTI P FURLAN P GALIMBERTI A GAMBITTA A GIURESSI D GODNIG R JARK W LIZZIT S MAZZOLINI F MELPIGNANO P OLIVI L PAOLUCCI G PUGLIESE R QIAN SN ROSEI R SANDRIN G SAVOIA A SERGO R SOSTERO G TOMMASINI R TUDOR M VIVODA D WEI FQ ZANINI F
Citation: A. Abrami et al., SUPER ESCA - FIRST BEAMLINE OPERATING AT ELETTRA, Review of scientific instruments, 66(2), 1995, pp. 1618-1620
OPTIMIZATION OF SPHERICAL GRATING MONOCHROMATORS OPERATING WITH VARIABLE INCLUDED ANGLE FOR DIFFERENT APPLICATIONS
Authors: MELPIGNANO P DIFONZO S BIANCO A JARK W
Citation: P. Melpignano et al., OPTIMIZATION OF SPHERICAL GRATING MONOCHROMATORS OPERATING WITH VARIABLE INCLUDED ANGLE FOR DIFFERENT APPLICATIONS, Review of scientific instruments, 66(2), 1995, pp. 2125-2128
SUPERMAXIMUM - A SCHWARZSCHILD-BASED, SPECTROMICROSCOPE FOR ELETTRA
Authors: WELNAK J DONG Z SOLAK H WALLACE J CERRINA F BERTOLO M BIANCO A DIFONZO S FONTANA S JARK W MAZZOLINI F ROSEI R SAVOIA A UNDERWOOD JH MARGARITONDO G
Citation: J. Welnak et al., SUPERMAXIMUM - A SCHWARZSCHILD-BASED, SPECTROMICROSCOPE FOR ELETTRA, Review of scientific instruments, 66(2), 1995, pp. 2273-2276
1ST EXPERIMENTAL TESTS AT THE NEW SYNCHROTRON-RADIATION FACILITY ELETTRA IN TRIESTE
Authors: ABRAMI A ALFE D ANTONINI S BERNARDINI M BERTOLO M BOCCHETTA CJ BULFONE D CARGNELLO F DARCLON F DIFONZO S FONTANA S GALIMBERTI A GIANNINI M JARK W MASSAROTTI A MAZZOLINI F PUGLISI M RICHTER R RINDI A ROSEI R RUBBIA C TOMMASINI D SAVOIA A VIANI G WALKER RP WRULICH A COLUZZA C DELLORTO T GOZZO F MARGARITONDO G DESTASIO G PERFETTI P GENTILI M CIOTTI MT MERCANTI D FONDA L
Citation: A. Abrami et al., 1ST EXPERIMENTAL TESTS AT THE NEW SYNCHROTRON-RADIATION FACILITY ELETTRA IN TRIESTE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 349(2-3), 1994, pp. 609-613
RANDOM-PHASE-APPROXIMATION CALCULATIONS OF K-EDGE ROTATIONAL STRENGTHS OF CHIRAL MOLECULES - PROPYLENE-OXIDE
Authors: ALAGNA L DIFONZO S PROSPERI T TURCHINI S LAZERETTI P MALAGOLI M ZANASI R NATOLI CR STEPHENS PJ
Citation: L. Alagna et al., RANDOM-PHASE-APPROXIMATION CALCULATIONS OF K-EDGE ROTATIONAL STRENGTHS OF CHIRAL MOLECULES - PROPYLENE-OXIDE, Chemical physics letters, 223(5-6), 1994, pp. 402-410
PHASE-RETARDATION AND FULL-POLARIZATION ANALYSIS OF SOFT-X-RAY SYNCHROTRON-RADIATION CLOSE TO THE CARBON-K EDGE BY USE OF A MULTILAYER TRANSMISSION FILTER
Authors: DIFONZO S JARK W SCHAFERS F PETERSEN H GAUPP A UNDERWOOD JH
Citation: S. Difonzo et al., PHASE-RETARDATION AND FULL-POLARIZATION ANALYSIS OF SOFT-X-RAY SYNCHROTRON-RADIATION CLOSE TO THE CARBON-K EDGE BY USE OF A MULTILAYER TRANSMISSION FILTER, Applied optics, 33(13), 1994, pp. 2624-2632
Risultati: 1-17 |