Authors: DINGES HW HILLMER H BURKHARD H LOSCH R NICKEL H SCHLAPP W

Citation: Hw. Dinges et al., STUDY OF IN0.53GA0.47AS IN0.52AL0.48AS QUANTUM-WELLS ON INP BY SPECTROSCOPIC ELLIPSOMETRY AND PHOTOLUMINESCENCE/, Surface science, 309, 1994, pp. 1057-1060

Authors: DINGES HW BURKHARD H LOSCH R NICKEL H SCHLAPP W

Citation: Hw. Dinges et al., SPECTROSCOPIC ELLIPSOMETRY - A USEFUL TOOL TO DETERMINE THE REFRACTIVE-INDEXES AND INTERFACES OF IN0.52AL0.48AS AND IN0.53ALXGA0.47-XAS LAYERS ON INP IN THE WAVELENGTH RANGE 280-1900 NM, Materials science & engineering. B, Solid-state materials for advanced technology, 21(2-3), 1993, pp. 174-176

Authors: DINGES HW BURKHARD H LOSCH R NICKEL H SCHLAPP W

Citation: Hw. Dinges et al., DETERMINATION OF REFRACTIVE-INDEXES OF IN0.52AL0.48AS ON INP IN THE WAVELENGTH RANGE FROM 250 TO 1900 NM BY SPECTROSCOPIC ELLIPSOMETRY, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 180-182

Authors: DINGES HW BURKHARD H LOSCH R NICKEL H SCHLAPP W

Citation: Hw. Dinges et al., DETERMINATION OF THE REFRACTIVE-INDEX OF IN0.53AL0.11GA0.36 AS ON INPIN THE WAVELENGTH RANGE FROM 280 TO 1900 NM BY SPECTROSCOPIC ELLIPSOMETRY, Applied surface science, 69(1-4), 1993, pp. 355-358

Authors: DINGES HW BURKHARD H LOSCH R NICKEL H SCHLAPP W

Citation: Hw. Dinges et al., SPECTROSCOPIC ELLIPSOMETRY - A USEFUL TOOL TO DETERMINE THE REFRACTIVE-INDEXES AND INTERFACES OF IN0.52AL0.48AS AND IN0.53ALXGA0.47-XAS ON INP IN THE WAVELENGTH RANGE FROM 280 TO 1900 NM, Thin solid films, 233(1-2), 1993, pp. 145-147