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Results:
1-16
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Results: 16
Authors:
CHAMARD V
DOLINO G
LERONDEL G
SETZU S
Citation: V. Chamard et al., X-RAY-DIFFRACTION AND REFLECTOMETRY STUDIES OF POROUS SILICON - N-TYPE LAYERS AND HOLOGRAPHIC GRATINGS, Physica. B, Condensed matter, 248, 1998, pp. 101-103
Authors:
BUTTARD D
DOLINO G
CAMPIDELLI Y
HALIMAOUI A
Citation: D. Buttard et al., X-RAY STUDY OF UHV-CVD FILLING OF POROUS SILICON BY GE, Journal of crystal growth, 183(3), 1998, pp. 294-304
Authors:
BUTTARD D
BELLET D
DOLINO G
BAUMBACH T
Citation: D. Buttard et al., THIN-LAYERS AND MULTILAYERS OF POROUS SILICON - X-RAY-DIFFRACTION INVESTIGATION, Journal of applied physics, 83(11), 1998, pp. 5814-5822
Authors:
FAIVRE C
BELLET D
DOLINO G
Citation: C. Faivre et al., INVESTIGATION OF PHASE-TRANSITIONS OF ORGANIC FLUIDS CONFINED IN POROUS SILICON, Thin solid films, 297(1-2), 1997, pp. 68-72
Authors:
DOLINO G
BELLET D
FAIVRE C
Citation: G. Dolino et al., ADSORPTION STRAINS IN POROUS SILICON, Physical review. B, Condensed matter, 54(24), 1996, pp. 17919-17929
Authors:
BELLET D
DOLINO G
Citation: D. Bellet et G. Dolino, X-RAY-DIFFRACTION STUDIES OF POROUS SILICON, Thin solid films, 276(1-2), 1996, pp. 1-6
Authors:
BUTTARD D
BELLET D
DOLINO G
Citation: D. Buttard et al., X-RAY-DIFFRACTION INVESTIGATION OF THE ANODIC-OXIDATION OF POROUS SILICON, Journal of applied physics, 79(10), 1996, pp. 8060-8070
Authors:
LOMOV AA
BELLET D
DOLINO G
Citation: Aa. Lomov et al., X-RAY-DIFFRACTION STUDY OF THIN POROUS SILICON LAYERS, Physica status solidi. b, Basic research, 190(1), 1995, pp. 219-226
Authors:
BLEY F
LIVET F
LEROUX JC
SIMON JP
ABERNATHY D
ALSNIELSEN J
GRUEBEL G
VIGNAUD G
DOLINO G
LEGRAND JF
CAMEL D
MENGUY N
PAPOULAR M
Citation: F. Bley et al., HIGH-Q-RESOLUTION X-RAY-DIFFRACTION OF ORDERED FE-AL SINGLE-CRYSTALS, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 746-753
Authors:
DOLINO G
BELLET D
Citation: G. Dolino et D. Bellet, VARIATIONS IN THE LATTICE-PARAMETER OF POROUS SILICON PRODUCED BY WETTING AND VAPOR ADSORPTION, Thin solid films, 255(1-2), 1995, pp. 132-134
Authors:
BELLET D
DOLINO G
Citation: D. Bellet et G. Dolino, X-RAY-OBSERVATION OF POROUS-SILICON WETTING, Physical review. B, Condensed matter, 50(23), 1994, pp. 17162-17165
Authors:
BELET D
DOLINO G
BILLAT S
LIGEON M
LEFEBVRE S
BESSIERE M
Citation: D. Belet et al., SYNCHROTRON-RADIATION STUDY OF STRUCTURAL-PROPERTIES OF POROUS SILICON, Journal of luminescence, 62(2), 1994, pp. 49-54
Authors:
KOPPENSTEINER E
SCHUH A
BAUER G
HOLY V
BELLET D
DOLINO G
Citation: E. Koppensteiner et al., DIFFUSE-X-RAY SCATTERING FROM P(+) POROUS SILICON BY TRIPLE AXIS DIFFRACTOMETRY, Applied physics letters, 65(12), 1994, pp. 1504-1506
Authors:
REGOLINI JL
GISBERT F
DOLINO G
BOUCAUD P
Citation: Jl. Regolini et al., GROWTH AND CHARACTERIZATION OF STRAIN COMPENSATED SI1-X-YGEXCY EPITAXIAL LAYERS, Materials letters, 18(1-2), 1993, pp. 57-60
Authors:
SOULA V
ABE K
BASTIE P
DOLINO G
CAPELLE B
ZHENG YL
Citation: V. Soula et al., SYNCHROTRON AND LIGHT-SCATTERING OBSERVATION OF THE 1Q INCOMMENSURATEPHASE OF QUARTZ UNDER ZERO-STRESS, Physical review. B, Condensed matter, 48(10), 1993, pp. 6871-6879
Authors:
ABE K
DOLINO G
Citation: K. Abe et G. Dolino, OPTICAL STUDY OF TIME-VARIATION OF MEMORY EFFECT IN INCOMMENSURATE PHASE OF QUARTZ, Journal of the Physical Society of Japan, 62(4), 1993, pp. 1101-1104
Risultati:
1-16
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