Authors:
WUNDERLICH S
SCHMIDL F
SPECHT H
DORRER L
SCHNEIDEWIND H
HUBNER U
SEIDEL P
Citation: S. Wunderlich et al., PLANAR GRADIOMETERS WITH HIGH-T-C DC SQUIDS FOR NONDESTRUCTIVE TESTING, Superconductor science and technology, 11(3), 1998, pp. 315-321
Authors:
SCHMIDL F
WUNDERLICH S
DORRER L
SPECHT H
LINZEN S
SCHNEIDEWIND H
SEIDEL P
Citation: F. Schmidl et al., HIGH-T-C DC-SQUID SYSTEM FOR NONDESTRUCTIVE EVALUATION, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 2756-2759
Authors:
SEIDEL P
SCHMIDL F
WEIDL R
BRABETZ S
KLEMM F
WUNDERLICH S
DORRER L
NOWAK H
Citation: P. Seidel et al., DEVELOPMENT OF A HEART MONITORING-SYSTEM BASED ON THIN-FILM HIGH-T-C DC-SQUIDS, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 3040-3043
Authors:
SCHMIDL F
DORRER L
WUNDERLICH S
MACHALETT F
HUBNER U
SCHMIDT H
LINZEN S
SCHNEIDEWIND H
VONFREYHOLD N
SEIDEL P
Citation: F. Schmidl et al., SUPERCONDUCTING PROPERTIES OF ION-BEAM MODIFIED YBCO MICROBRIDGES, Journal of low temperature physics, 106(3-4), 1997, pp. 405-416
Authors:
BRABETZ S
WEIDL R
KLEMM F
DORRER L
SCHMIDL F
SEIDEL P
Citation: S. Brabetz et al., DEVELOPMENT OF A HEART MONITORING-SYSTEM WITH HIGH-T-C DC-SQUID GRADIOMETERS, Journal of low temperature physics, 106(3-4), 1997, pp. 527-532
Authors:
ILICHEV E
DORRER L
SCHMIDL F
ZAKOSARENKO V
SEIDEL P
HILDEBRANDT G
Citation: E. Ilichev et al., CURRENT RESOLUTION, NOISE, AND INDUCTANCE MEASUREMENTS ON HIGH-T-C DCSQUID GALVANOMETERS, Applied physics letters, 68(5), 1996, pp. 708-710
Authors:
SEIDEL P
ZAKOSARENKO V
SCHMIDL F
DORRER L
SCHNEIDEWIND H
LINZEN S
ILICHEV EV
DARULA M
Citation: P. Seidel et al., INVESTIGATION OF THIN-FILM DE SQUID GRADIOMETER USING A SINGLE YBCO LAYER, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 2931-2934
Authors:
SCHMIDL F
PFUCH A
SCHNEIDEWIND H
HEINZ E
DORRER L
MATTHES A
SEIDEL P
HUBNER U
VEITH M
STEINBEISS E
Citation: F. Schmidl et al., PREPARATION AND FIRST MEASUREMENTS OF TBCCO THIN-FILM INTRINSIC STACKED JOSEPHSON-JUNCTIONS, Superconductor science and technology, 8(9), 1995, pp. 740-743