Authors: DUFAZA C

Citation: C. Dufaza, THEORETICAL PROPERTIES OF LFSRS FOR BUILT-IN SELF-TEST, Integration, 25(1), 1998, pp. 17-35

Authors: ARABI K IHS H DUFAZA C KAMINSKA B

Citation: K. Arabi et al., DYNAMIC DIGITAL INTEGRATED-CIRCUIT TESTING USING OSCILLATION-TEST METHOD, Electronics Letters, 34(8), 1998, pp. 762-764

Authors: DUFAZA C IHS H KAMINSKA B

Citation: C. Dufaza et al., BOOLEAN EQUATIONS FOR MULTIPLE PATHS SENSITIZATION OF DIGITAL OSCILLATION BUILT-IN SELF-TEST, Electronics Letters, 34(23), 1998, pp. 2213-2215

Authors: DUFAZA C IHS H

Citation: C. Dufaza et H. Ihs, A BIST-DFT TECHNIQUE FOR DC TEST OF ANALOG MODULES, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 117-133

Authors: IHS H DUFAZA C

Citation: H. Ihs et C. Dufaza, DESIGN FOR TESTABILITY AND DC TEST OF SWITCHED-CAPACITOR CIRCUITS, Electronics Letters, 32(8), 1996, pp. 701-702