Authors:
Milhet, X
Girard, JC
Demenet, JL
Rabier, J
Citation: X. Milhet et al., Characterization of room-temperature plastic deformation Of beta-Si3N4 by atomic force microscopy and transmission electron microscopy, PHIL MAG L, 81(9), 2001, pp. 623-629
Citation: J. Rabier et Jl. Demenet, Low temperature, high stress plastic deformation of semiconductors: The silicon case, PHYS ST S-B, 222(1), 2000, pp. 63-74
Citation: Jf. Barbot et al., Influence of dislocations on I-V characteristics of Schottky diodes prepared on n-type 6H-SiC, PHYS ST S-B, 222(1), 2000, pp. 159-167