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Results:
1-8
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Results: 8
Anode hole injection, defect generation, and breakdown in ultrathin silicon dioxide films
Authors:
DiMaria, DJ Stathis, JH
Citation:
Dj. Dimaria et Jh. Stathis, Anode hole injection, defect generation, and breakdown in ultrathin silicon dioxide films, J APPL PHYS, 89(9), 2001, pp. 5015-5024
A detailed investigation of the quantum yield experiment
Authors:
Ielmini, D Spinelli, AS Lacaita, AL DiMaria, DJ Ghidini, G
Citation:
D. Ielmini et al., A detailed investigation of the quantum yield experiment, IEEE DEVICE, 48(8), 2001, pp. 1696-1702
Defect generation in field-effect transistors under channel-hot-electron stress
Authors:
DiMaria, DJ
Citation:
Dj. Dimaria, Defect generation in field-effect transistors under channel-hot-electron stress, J APPL PHYS, 87(12), 2000, pp. 8707-8715
Defect generation in ultrathin silicon dioxide films produced by anode hole injection
Authors:
DiMaria, DJ
Citation:
Dj. Dimaria, Defect generation in ultrathin silicon dioxide films produced by anode hole injection, APPL PHYS L, 77(17), 2000, pp. 2716-2718
Oxide scaling limit for future logic and memory technology
Authors:
Stathis, JH DiMaria, DJ
Citation:
Jh. Stathis et Dj. Dimaria, Oxide scaling limit for future logic and memory technology, MICROEL ENG, 48(1-4), 1999, pp. 395-401
Defect generation under substrate-hot-electron injection into ultrathin silicon dioxide layers
Authors:
DiMaria, DJ
Citation:
Dj. Dimaria, Defect generation under substrate-hot-electron injection into ultrathin silicon dioxide layers, J APPL PHYS, 86(4), 1999, pp. 2100-2109
Electron energy dependence of metal-oxide-semiconductor degradation
Authors:
DiMaria, DJ
Citation:
Dj. Dimaria, Electron energy dependence of metal-oxide-semiconductor degradation, APPL PHYS L, 75(16), 1999, pp. 2427-2428
Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films
Authors:
DiMaria, DJ Stathis, JH
Citation:
Dj. Dimaria et Jh. Stathis, Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films, APPL PHYS L, 74(12), 1999, pp. 1752-1754
Risultati:
1-8
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