AAAAAA
Results: 1-25/36
Authors:
Dobrzanski, MJ
Reome, JB
Dutton, RW
Citation: Mj. Dobrzanski et al., Immunopotentiating role of IFN-gamma in early and late stages of type 1 CD8 effector cell-mediated tumor rejection, CLIN IMMUNO, 98(1), 2001, pp. 70-84
Authors:
Goo, JS
Choi, CH
Abramo, A
Ahn, JG
Yu, ZP
Lee, TH
Dutton, RW
Citation: Js. Goo et al., Physical origin of the excess thermal noise in short channel MOSFETs, IEEE ELEC D, 22(2), 2001, pp. 101-103
Authors:
Dobrzanski, MJ
Reome, JB
Dutton, RW
Citation: Mj. Dobrzanski et al., Role of effector cell-derived IL-4, IL-5, and perforin in early and late stages of type 2 CD8 effector cell-mediated tumor rejection, J IMMUNOL, 167(1), 2001, pp. 424-434
Authors:
Hogan, RJ
Usherwood, EJ
Zhong, WM
Roberts, AD
Dutton, RW
Harmsen, AG
Woodland, DL
Citation: Rj. Hogan et al., Activated antigen-specific CD8(+) T cells persist in the lungs following recovery from respiratory virus infections, J IMMUNOL, 166(3), 2001, pp. 1813-1822
Authors:
Helmich, BK
Dutton, RW
Citation: Bk. Helmich et Rw. Dutton, The role of adoptively transferred CD8 T cells and host cells in the control of the growth of the EG7 thymoma: Factors that determine the relative effectiveness and homing properties of Tc1 and Tc2 effectors, J IMMUNOL, 166(11), 2001, pp. 6500-6508
Authors:
Wang, GF
Qi, XN
Yu, ZP
Dutton, RW
Citation: Gf. Wang et al., Device level modeling of metal-insulator-semiconductor interconnects, IEEE DEVICE, 48(8), 2001, pp. 1672-1682
Authors:
Ancona, MG
Yu, Z
Dutton, RW
Voorde, PJV
Vook, K
Cao, M
Citation: Mg. Ancona et al., Density-gradient analysis of MOS tunneling (vol 47, pg 2310, 2000), IEEE DEVICE, 48(8), 2001, pp. 1750-1750
Authors:
Wiley, JA
Cerwenka, A
Harkema, JR
Dutton, RW
Harmsen, AG
Citation: Ja. Wiley et al., Production of interferon-gamma by influenza hemagglutinin-specific CD8 effector T cells influences the development of pulmonary immunopathology, AM J PATH, 158(1), 2001, pp. 119-130
Modelling and validation of contributions to stress in the Shallow Trench Isolation process sequence
Authors:
Garikipati, K
Rao, VS
Hao, MY
Ibok, E
de Wolf, I
Dutton, RW
Citation: K. Garikipati et al., Modelling and validation of contributions to stress in the Shallow Trench Isolation process sequence, CMES-COMP M, 1(1), 2000, pp. 65-83
Authors:
Qi, XN
Yue, CP
Arnborg, T
Soh, HT
Sakai, H
Yu, ZP
Dutton, RW
Citation: Xn. Qi et al., A fast 3-D modeling approach to electrical parameters extraction of bonding wires for RF circuits, IEEE T AD P, 23(3), 2000, pp. 480-488
Authors:
Chan, EK
Dutton, RW
Citation: Ek. Chan et Rw. Dutton, Electrostatic micromechanical actuator with extended range of travel, J MICROEL S, 9(3), 2000, pp. 321-328
Authors:
Wang, JF
Dutton, RW
Hou, JC
Citation: Jf. Wang et al., A fast wavelet multigrid algorithm for solution of electromagnetic integral equations, MICROW OPT, 24(2), 2000, pp. 86-91
Authors:
Choi, CH
Yu, ZP
Dutton, RW
Citation: Ch. Choi et al., Modeling of MOS scaling with emphasis on gate tunneling and source/drain resistance, SUPERLATT M, 27(2-3), 2000, pp. 191-206
Authors:
Dutton, RW
Strojwas, AJ
Citation: Rw. Dutton et Aj. Strojwas, Perspectives on technology and technology-driven CAD, IEEE COMP A, 19(12), 2000, pp. 1544-1560
Authors:
Troyanovsky, B
Yu, ZP
Dutton, RW
Citation: B. Troyanovsky et al., Physics-based simulation of nonlinear distortion in semiconductor devices using the harmonic balance method, COMPUT METH, 181(4), 2000, pp. 467-482
Authors:
Reome, JB
Johnston, DS
Helmich, BK
Morgan, TM
Dutton-Swain, N
Dutton, RW
Citation: Jb. Reome et al., The effects of prolonged administration of 5-bromodeoxyuridine on cells ofthe immune system, J IMMUNOL, 165(8), 2000, pp. 4226-4230
Authors:
Dobrzanski, MJ
Reome, JB
Dutton, RW
Citation: Mj. Dobrzanski et al., Type 1 and type 2 CD8(+) effector T cell subpopulations promote long-term tumor immunity and protection to progressively growing tumor, J IMMUNOL, 164(2), 2000, pp. 916-925
Authors:
Rotella, FM
Ma, G
Yu, Z
Dutton, RW
Citation: Fm. Rotella et al., Modeling, analysis, and design of RF LDMOS devices using harmonic-balance device simulation, IEEE MICR T, 48(6), 2000, pp. 991-999
Authors:
Choi, CH
Goo, JS
Yu, ZP
Dutton, RW
Citation: Ch. Choi et al., Shallow source/drain extension effects on external resistance in sub-0.1 mu m MOSFET's, IEEE DEVICE, 47(3), 2000, pp. 655-658
Authors:
Ancona, MG
Yu, Z
Dutton, RW
Vande Voorde, PJ
Cao, M
Vook, D
Citation: Mg. Ancona et al., Density-gradient analysis of MOS tunneling, IEEE DEVICE, 47(12), 2000, pp. 2310-2319
Authors:
Goo, JS
Choi, CH
Danneville, F
Morifuji, E
Momose, HS
Yu, ZP
Iwai, H
Lee, TH
Dutton, RW
Citation: Js. Goo et al., An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs, IEEE DEVICE, 47(12), 2000, pp. 2410-2419
Authors:
Lundstrom, M
Dutton, RW
Ferry, DK
Hess, K
Citation: M. Lundstrom et al., Special issue on computational electronics: New challenges and directions - Foreword, IEEE DEVICE, 47(10), 2000, pp. 1778-1778
Authors:
Kawamoto, A
Jameson, J
Cho, K
Dutton, RW
Citation: A. Kawamoto et al., Challenges for atomic scale modeling in alternative gate stack engineering, IEEE DEVICE, 47(10), 2000, pp. 1787-1794
Authors:
Yu, ZP
Dutton, RW
Kiehl, RA
Citation: Zp. Yu et al., Circuit/device modeling at the quantum level, IEEE DEVICE, 47(10), 2000, pp. 1819-1825
Authors:
Choi, CH
Wu, Y
Goo, JS
Yu, ZP
Dutton, RW
Citation: Ch. Choi et al., Capacitance reconstruction from measured C-V in high leakage, nitride/oxide MOS, IEEE DEVICE, 47(10), 2000, pp. 1843-1850