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JIA JJ
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HUDSON EA
TERMINELLO LJ
SHUH DK
PERERA RCC
Citation: Jj. Jia et al., FIRST EXPERIMENTAL RESULTS FROM IBM TENN/TULANE/LLNL/LBL UNDULATOR BEAMLINE AT THE ADVANCED LIGHT-SOURCE/, Review of scientific instruments, 66(2), 1995, pp. 1394-1397
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Citation: Ja. Carlisle et al., PROBING THE GRAPHITE BAND-STRUCTURE WITH RESONANT SOFT-X-RAY FLUORESCENCE, Physical review letters, 74(7), 1995, pp. 1234-1237
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Citation: Dgj. Sutherland et al., STOICHIOMETRY REVERSAL IN THE GROWTH OF THIN OXYNITRIDE FILMS ON SI(100) SURFACES, Journal of applied physics, 78(11), 1995, pp. 6761-6769
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TERMINELLO LJ
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Citation: Ja. Carlisle et al., CHARACTERIZATION OF BURIED THIN-FILMS WITH RESONANT SOFT-X-RAY FLUORESCENCE, Applied physics letters, 67(1), 1995, pp. 34-36
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JIA JJ
CALLCOTT TA
PERERA RCC
SHUH DK
LOUIE SG
STOHR J
SAMANT MG
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Citation: Ja. Carlisle et al., OCCUPIED AND UNOCCUPIED ORBITALS OF C-60 AND C-70, Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 256, 1994, pp. 819-824
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MIYANO KE
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Citation: M. Haass et al., VARIABLE GROOVE SPACED GRATING MONOCHROMATORS FOR SYNCHROTRON LIGHT-SOURCES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 258-263
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EDERER DL
CALLCOTT TA
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MUELLER DR
Citation: Ke. Miyano et al., PHOTON-EXCITED SOFT-X-RAY EMISSION FROM LIBR AND LICL - PHONON RELAXATION FOR LI K EXCITATIONS, Physical review. B, Condensed matter, 49(9), 1994, pp. 5929-5941
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CARR GL
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DIMARZIO D
LEE MB
EDERER DL
MIYANO KE
MUELLER DR
VASILAKIS A
OBRIEN WL
Citation: Gl. Carr et al., NOVEL TECHNIQUES FOR CHARACTERIZING DETECTOR MATERIALS USING PULSED INFRARED SYNCHROTRON-RADIATION, Semiconductor science and technology, 8(6), 1993, pp. 922-927
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JIA J
DONG QY
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EDERER DL
KAO CC
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MAZUROWSKI J
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MIYANO KE
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MUELLER DR
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Citation: Sw. Lee et al., THE STRUCTURAL HOMOGENEITY OF BORON-CARBIDE THIN-FILMS FABRICATED USING PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION FROM B5H9+CH4, Journal of applied physics, 74(11), 1993, pp. 6919-6924