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Results: 1-14 |
Results: 14
Patterning of GaN by ion implantation-dependent etching
Authors: Schiestel, S Molnar, B Carosella, CA Knies, D Stroud, RM Edinger, K
Citation: S. Schiestel et al., Patterning of GaN by ion implantation-dependent etching, MAT SCI E B, 82(1-3), 2001, pp. 111-113
Modeling of focused ion beam induced chemistry and comparison with experimental data
Authors: Edinger, K Kraus, T
Citation: K. Edinger et T. Kraus, Modeling of focused ion beam induced chemistry and comparison with experimental data, MICROEL ENG, 57-8, 2001, pp. 263-268
Thermal nano-probe
Authors: Rangelow, IW Gotszalk, T Abedinov, N Grabiec, P Edinger, K
Citation: Iw. Rangelow et al., Thermal nano-probe, MICROEL ENG, 57-8, 2001, pp. 737-748
Nanofabrication with scanning nanonozzle 'Nanojet'
Authors: Voigt, J Shi, F Edinger, K Guthner, P Rangelow, IW
Citation: J. Voigt et al., Nanofabrication with scanning nanonozzle 'Nanojet', MICROEL ENG, 57-8, 2001, pp. 1035-1042
Modeling of focused ion beam induced surface chemistry
Authors: Edinger, K Kraus, T
Citation: K. Edinger et T. Kraus, Modeling of focused ion beam induced surface chemistry, J VAC SCI B, 18(6), 2000, pp. 3190-3193
Nanoscale patterning of self-assembled monolayers with electrons
Authors: Golzhauser, A Geyer, W Stadler, V Eck, W Grunze, M Edinger, K Weimann, T Hinze, P
Citation: A. Golzhauser et al., Nanoscale patterning of self-assembled monolayers with electrons, J VAC SCI B, 18(6), 2000, pp. 3414-3418
Progress on nanostructuring with Nanojet
Authors: Voigt, J Shi, F Hudek, P Rangelow, IW Edinger, K
Citation: J. Voigt et al., Progress on nanostructuring with Nanojet, J VAC SCI B, 18(6), 2000, pp. 3525-3529
Direct patterning of gold oxide thin films by focused ion-beam irradiation
Authors: Machalett, F Edinger, K Melngailis, J Diegel, M Steenbeck, K Steinbeiss, E
Citation: F. Machalett et al., Direct patterning of gold oxide thin films by focused ion-beam irradiation, APPL PHYS A, 71(3), 2000, pp. 331-335
Accurate location and marking of grain boundaries using focused ion and electron beams
Authors: Machalett, F Edinger, K Melngailis, J Seidel, P Venkatesan, T
Citation: F. Machalett et al., Accurate location and marking of grain boundaries using focused ion and electron beams, NUCL INST B, 170(3-4), 2000, pp. 474-482
Focused-ion-beam writing of electrical connections into platinum oxide films
Authors: Machalett, F Edinger, K Ye, L Melngailis, J Venkatesan, T Diegel, M Steenbeck, K
Citation: F. Machalett et al., Focused-ion-beam writing of electrical connections into platinum oxide films, APPL PHYS L, 76(23), 2000, pp. 3445-3447
Gas assisted etching of copper with focused ion beams
Authors: Edinger, K
Citation: K. Edinger, Gas assisted etching of copper with focused ion beams, J VAC SCI B, 17(6), 1999, pp. 3058-3062
Experimental observation of mode evolution in single-mode tapered optical fibers
Authors: Fielding, AJ Edinger, K Davis, CC
Citation: Aj. Fielding et al., Experimental observation of mode evolution in single-mode tapered optical fibers, J LIGHTW T, 17(9), 1999, pp. 1649-1656
Study of precursor gases for focused ion beam insulator deposition
Authors: Edinger, K Melngailis, J Orloff, J
Citation: K. Edinger et al., Study of precursor gases for focused ion beam insulator deposition, J VAC SCI B, 16(6), 1998, pp. 3311-3314
Ohmic contacts to p-6H-SiC using focused ion-beam surface-modification andpulsed laser epitaxial TiN deposition
Authors: Iliadis, AA Andronescu, SN Edinger, K Orloff, JH Vispute, RD Talyansky, V Sharma, RP Venkatesan, T Wood, MC Jones, KA
Citation: Aa. Iliadis et al., Ohmic contacts to p-6H-SiC using focused ion-beam surface-modification andpulsed laser epitaxial TiN deposition, APPL PHYS L, 73(24), 1998, pp. 3545-3547
Risultati: 1-14 |